Effect of High Temperature Deformation on Grain Boundary Defects in Yba2Cu3O7-X

1989 ◽  
Vol 169 ◽  
Author(s):  
R. Garcia ◽  
W.Z. Misiolek ◽  
R.N. Wright ◽  
K. Rajan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Grain Boundary ◽  
High Temperature Deformation ◽  
Temperature Deformation ◽  
Ceramic Superconductors ◽  
Bulk Ceramic ◽  
Transmission Electron ◽  
Lattice Distortions

AbstractThe results of transmission electron microscopy studies on YBa2Cu3O7‐x subjected to high temperature extrusion are presented. Particular emphasis is put on high temperature accommodation processes of lattice dislocations into sub‐grain boundaries. It is suggested from the electron microscopy observations that stress induced climb mechanisms for dislocations are operative. Also presented is evidence of localized lattice distortions near twin boundaries due to isothermal high temperature deformation. Preliminary results on the structure of grain boundary facets and steps is described. The implications of these results for texture development in bulk ceramic superconductors is also discussed.

High Temperature Deformation of AlN/CrN Multilayers using Nanoindentation

2004 ◽  
Vol 841 ◽  
Author(s):  
F. Giuliani ◽  
A. Goruppa ◽  
S. J. Lloyd ◽  
D. Teer ◽  
W. J. Clegg
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Tool Steel ◽  
Deformation Behaviour ◽  
High Temperature Deformation ◽  
Temperature Deformation ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Deformation Patterns

ABSTRACTThe aim of this paper is to investigate the deformation behaviour of an AlN/CrN multilayer with wavelengths varying from 6–400 nm, deposited on M42 tool steel and how this varies as the temperature is increased to 500 °C. These measurements have been correlated with changes in deformation patterns using cross-sectional transmission electron microscopy, where sections have been prepared directly through the indents.

Motion of Crystal/Crystal and Crystal/Amorphous Interfaces

1990 ◽  
Vol 183 ◽  
Author(s):  
J. L. Batstone
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Grain Boundary ◽  
Boundary Motion ◽  
High Temperature Annealing ◽  
Thermally Activated ◽  
Transmission Electron ◽  
Grain Boundary Motion

AbstractMotion of ordered twin/matrix interfaces in films of silicon on sapphire occurs during high temperature annealing. This process is shown to be thermally activated and is analogous to grain boundary motion. Motion of amorphous/crystalline interfaces occurs during recrystallization of CoSi2 and NiSi2 from the amorphous phase. In-situ transmission electron microscopy has revealed details of the growth kinetics and interfacial roughness.

Effect of Coupled Conditions of Thermal Cycle and Dump Environment on Conductivity of 5mol% Yttria Stabilized Zirconia

2013 ◽  
Vol 591 ◽  
pp. 245-248 ◽  
Author(s):  
Jin Feng Xia ◽  
Hong Qiang Nian ◽  
Tao Feng ◽  
Hai Fang Xu ◽  
Dan Yu Jiang
Keyword(s):  
Electron Microscopy ◽  
Mechanical Properties ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Thermal Cycle ◽  
Oxygen Sensor ◽  
Yttria Stabilized Zirconia ◽  
Cyclic Change ◽  
Stabilized Zirconia ◽  
Transmission Electron

In some applications such as automotive oxygen sensor, 5mol% Y2O3stabilized zirconia (5YSZ) is generally used because it has both excellent ionic conductivity and mechanical properties. The automotive oxygen sensor would experience a cyclic change from high temperature (engine running) environment to the low temperature damp environment (in the tail pipe when vehicle stops). The conductivity change with coupled conditions of thermal cycle and dump environment in the 5mol%Y2O3ZrO2(5YSZ) system was examined by XRD,Impedance spectroscopy and transmission electron microscopy (SEM) in this paper.

High-Resolution Transmission Electron Microscopy Studies of a Near Sigma11 Grain Boundary in alpha-Alumina

1994 ◽  
Vol 77 (2) ◽  
pp. 339-348 ◽  
Author(s):  
Thomas Hoche ◽  
Philip R. Kenway ◽  
Hans-Joachim Kleebe ◽  
Manfred Ruhle ◽  
Patricia A. Morris
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Grain Boundary ◽  
Transmission Electron ◽  
Alpha Alumina

In Situ High-Temperature Transmission Electron Microscopy Observations of the Formation of Nanocrystalline TiC from Nanocrystalline Anatase (TiO2)

1998 ◽  
Vol 4 (3) ◽  
pp. 269-277 ◽  
Author(s):  
A. Agrawal ◽  
J. Cizeron ◽  
V.L. Colvin
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Solid Phase ◽  
Anatase Phase ◽  
High Resolution Electron Microscopy ◽  
Rutile Phase ◽  
Transmission Electron ◽  
New Phase

In this work, the high-temperature behavior of nanocrystalline TiO2 is studied using in situ transmission electron microscopy (TEM). These nanoparticles are made using wet chemical techniques that generate the anatase phase of TiO2 with average grain sizes of 6 nm. X-ray diffraction studies of nanophase TiO2 indicate the material undergoes a solid-solid phase transformation to the stable rutile phase between 600° and 900°C. This phase transition is not observed in the TEM samples, which remain anatase up to temperatures as high as 1000°C. Above 1000°C, nanoparticles become mobile on the amorphous carbon grid and by 1300°C, all anatase diffraction is lost and larger (50 nm) single crystals of a new phase are present. This new phase is identified as TiC both from high-resolution electron microscopy after heat treatment and electron diffraction collected during in situ heating experiments. Video images of the particle motion in situ show the nanoparticles diffusing and interacting with the underlying grid material as the reaction from TiO2 to TiC proceeds.

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