A Comparison Between Dry Etching with an Electron Cyclotron Resonance Source and Reactive Ion Etching for GaAs and InP
Keyword(s):
Rf Power
◽
ABSTRACTEtching with an electron cyclotron resonance (ECR) source provides several advantages over conventional reactive ion etching (RIE). In this work, the results of GaAs and InP etching using a multipolar ECR source are presented and compared to RIE. The effects of microwave and rf power, gas composition, pressure, and source to sample distance on the etch characteristics of GaAs and InP were evaluated. Three different etch gases were used including CCl2F2, BCl3, and Cl2. The influence of microwave power on etch characteristics is compared to conventional parallel plate system using rf power alone.
1993 ◽
Vol 11
(4)
◽
pp. 1763-1767
◽
Keyword(s):
2003 ◽
Vol 42
(Part 1, No. 6B)
◽
pp. 3958-3961
◽
1995 ◽
Vol 34
(Part 1, No. 4B)
◽
pp. 2147-2151
◽
1994 ◽
Vol 12
(3)
◽
pp. 665-670
◽
1997 ◽
Vol 15
(3)
◽
pp. 664-667
◽
1994 ◽
Vol 12
(4)
◽
pp. 1957-1961
◽