Preparation of BaTiO3 and PbTiO3 thin Films on BaPb3 Substrates by the SOL-GEL Method and Their Properties

1992 ◽  
Vol 271 ◽  
Author(s):  
M. KuWabAra ◽  
T. Kuroda ◽  
S. Takahashi ◽  
T. Azuma

ABSTRACTBarium titanate, lead titanate and barium-lead titanate thin films were prepared by the sol-gel method using metal alkoxides on metallic conducting BaPbO3 ceramic substrates. Thin films were deposited on the polished surfaces of the substrates by spin coating solutions containing Ba(OC2H4OCH3)2, Pb(OCOCH3)2 and Ti(O-iC3H7)4 and methoxyethanol. The gel films were then fired at appropriate temperatures to yield ceramic thin films. A 0.50 µm-thick BaTio3 film showed a dielectric constant of 280 and tan ° of 3% at 1kHz with no distinguishable peak of dielectric constant at any temperature between 20°C and 200°C. Both PbTiO3 (0.75 µm thick) and Ba0.7Pb0.3 (0.2 µm thick) films, on the other hand, showed a distinguishable peak of dielectric constant at their Curie point with a rather deformed P-E hysteresis loop at room temperature.

1996 ◽  
Vol 433 ◽  
Author(s):  
Seong Jun Kang ◽  
Yung Sup Yoon ◽  
Dong Il Kim

AbstractWe have studied the pyroelectric properties of the PLT(10) thin film deposited on a p-doped poly-Si electrode by using the sol-gel method. Measurement of the dielectric constant as a function of temperature shows the typical characteristics of a ferroelectric. The dielectric constant reaches a maximum at 295°C, which can be thought of as the Curie temperature. The PLT(10) thin film on p-doped poly-Si fabricated in this research shows excellent pyroelectric properties. The pyroelectric coefficient and the fiqures of merit, Fv and FD at room temperature are measured as 5.76 × 10−8 C/cm2 °C, 1.17 × 10−10C-cm/J and 0.93 × 10−8C-cm/J, respectively.


2008 ◽  
Vol 254 (22) ◽  
pp. 7459-7463 ◽  
Author(s):  
Yuhua Xiao ◽  
Shihui Ge ◽  
Li Xi ◽  
Yalu Zuo ◽  
Xueyun Zhou ◽  
...  

Author(s):  
Rajagopalan Krishnan ◽  
Jagannathan Thirumalai ◽  
Rathinam Chandramohan

2000 ◽  
Vol 271 (1-2) ◽  
pp. 162-166 ◽  
Author(s):  
Hirofumi Matsuda ◽  
Nobuyuki Kobayashi ◽  
Takeshi Kobayashi ◽  
Kun’ichi Miyazawa ◽  
Makoto Kuwabara

1999 ◽  
Vol 68 (5) ◽  
pp. 583-592 ◽  
Author(s):  
M. Algueró ◽  
M.L. Calzada ◽  
C. Quintana ◽  
L. Pardo

2012 ◽  
Vol 512-515 ◽  
pp. 1249-1252 ◽  
Author(s):  
Xu Xue ◽  
Guo Qiang Tan ◽  
Hui Jun Ren ◽  
Meng Cheng

BiFeO3 thin films co-doping Nd and Co were prepared on FTO/glass substrate by sol-gel method with Bi(NO3)3•5H2O, Fe•(NO3)3•9H2O, Nd(NO3)3•6H2O and Co(NO3)2•6H2O as raw materials, 2-methoxyethanol together with acetic anhydride as a solvent. XRD, FE-SEM, Agilent E4980A Precision LCR Meter and TF 2000 Ferroelectric Analyzer were used to characterize the structure, morphology, dielectric property and ferroelectric property of the BiFeO3 thin films. The results show that after Nd and Co co-doping, the BiFeO3 thin films still keep the perovskite structure. The crystal structure turns square or orthogonal from rhombus. The thickness of the BiFeO3 thin films is about 500nm and the grain size is 80nm to 30nm. BiFeO3 thin films co-doping Nd and Co have the larger dielectric constant and the lower dielectric loss compared with Nd doping. BiFeO3 thin films co-doping Nd10% and Co1% have the dielectric constant of over 170 and the dielectric loss of below 0.03. Both have the better frequency stability. Co-doping Nd and Co could decrease the coercive electric field of BiFeO3 thin films.


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