In-situ X-ray Measurements of the Initial Epitaxy of Fe(001) Films on MgO(001)

1992 ◽  
Vol 280 ◽  
Author(s):  
Bruce M. Lairson ◽  
A. P. Payne ◽  
S. Brennan ◽  
N. M. Rensing ◽  
B. J. Daniels ◽  
...  
Keyword(s):  
Elasticity Theory ◽  
Grazing Incidence ◽  
Lattice Parameter ◽  
X Ray ◽  
X Ray Scattering ◽  
Monolayer Coverage ◽  
Continuum Elasticity ◽  
Ray Scattering

ABSTRACTWe have studied die evolution of the lattice parameter of epitaxial Fe(001) on MgO(001) vs. thickness between 1 and 200 monolayers using Grazing Incidence X-ray Scattering. We show that an interaction exists between the islanded film and the substrate, which allows the film to be incommensurate, even when the islands are too small to allow full dislocations to exist. For the conditions studied, the Fe lattice parameter increases toward the MgO lattice parameter with increasing thickness in the 1–10 monolayer coverage regime, and then relaxes back toward the bulk Fe lattice parameter at greater thicknesses. We employ a model for the interaction between film islands and the substrate which explains large changes in the lattice parameter of the Fe in the 1–10 monolayer thickness range. Relaxation at larger thicknesses is described by continuum elasticity theory.

Atomic scale characterization of organometallic vapor phase epitaxial growth using in-situ grazing incidence X-ray scattering

1992 ◽  
Vol 124 (1-4) ◽  
pp. 1-9 ◽  
Author(s):  
D.W. Kisker ◽  
G.B. Stephenson ◽  
P.H. Fuoss ◽  
F.J. Lamelas ◽  
S. Brennan ◽  
...  
Keyword(s):  
Epitaxial Growth ◽  
Vapor Phase ◽  
Grazing Incidence ◽  
Atomic Scale ◽  
X Ray ◽  
X Ray Scattering ◽  
Scale Characterization ◽  
Ray Scattering

In-Situ Grazing Incidence Small-Angle X-ray Scattering Studies on Nanopore Evolution in Low-kOrganosilicate Dielectric Thin Films

2005 ◽  
Vol 38 (8) ◽  
pp. 3395-3405 ◽  
Author(s):  
Byeongdu Lee ◽  
Jinhwan Yoon ◽  
Weontae Oh ◽  
Yongtaek Hwang ◽  
Kyuyoung Heo ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Dielectric Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Grazing Incidence X-Ray Scattering Studies of the Structure and Morphology of the Ni/Mgo(001), Co/Nio(111) and Nife/Nio(111) Interfaces During their in Situ Growth

1999 ◽  
Vol 562 ◽  
Author(s):  
G. Renaud ◽  
A. Barbier ◽  
C. Mocuta
Keyword(s):  
High Temperature ◽  
Magnetic Measurements ◽  
Grazing Incidence ◽  
Ex Situ ◽  
Crystallographic Structure ◽  
Temperature Oxidation ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

ABSTRACTCombined in situ structural and ex situ magnetic studies of the Co/NiO(111) and Ni81Fe19/NiO(111) interfaces are presented. The Co and Permalloy films were grown on NiO(111) single crystals. Structural studies were performed by Grazing Incidence X-ray Scattering during growth. The effect of the temperature of the substrate during deposition was investigated. Under specific growth conditions, almost pure FCC Co and NiFe films can be obtained, with small quantities of twins. Magnetic measurements were performed ex situ by Magneto-Optical Kerr Effect (MOKE). A strong correlation between the magnetic properties and the crystallographic structure of the Co film is evidenced. High coercive fields are measured for all samples. High temperature annealing of the NiFe film leads to an improved crystalline quality, but the interface becomes reactive and diffuse: part of the Fe diffuses into the NiO substrate and forms an interface compound, likely to be the spinel NiFe2O4. We also report an in situ grazing incidence X-ray scattering study of the Ni/MgO(001) interface during its formation at room temperature. In-plane measurements reveal that the interface is sharp and that the epitaxial relationship is complex. Two distinct lattices are found to exist: expanded Ni(001) and Ni(110). The latter exhibits several orientations with respect to the substrate depending on the thickness. The Ni(110) orientations disappear by annealing at high temperature, leaving only the Ni cube/cube orientation. The layer was also almost fully transformed into NiO(001) by high temperature oxidation.

Probing Self-Assembly of Cylindrical Morphology Block Copolymer Using in Situ and ex Situ Grazing Incidence Small-Angle X-ray Scattering: The Attractive Case of Graphoepitaxy

2014 ◽  
Vol 47 (20) ◽  
pp. 7221-7229 ◽  
Author(s):  
Mireille Maret ◽  
Raluca Tiron ◽  
Xavier Chevalier ◽  
Patrice Gergaud ◽  
Ahmed Gharbi ◽  
...  
Keyword(s):  
Block Copolymer ◽  
Small Angle ◽  
Self Assembly ◽  
Grazing Incidence ◽  
Ex Situ ◽  
X Ray ◽  
X Ray Scattering ◽  
Attractive Case ◽  
Ray Scattering

In situ characterization of organometallic growth of ZnSe using grazing incidence X-ray scattering

1990 ◽  
Vol 101 (1-4) ◽  
pp. 42-47 ◽  
Author(s):  
D.W. Kisker ◽  
P.H. Fuoss ◽  
S. Brennan ◽  
G. Renaud ◽  
K.L. Tokuda ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
In Situ Characterization ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Electrochemistry of Thin Films with In Situ/Operando Grazing Incidence X‐Ray Scattering: Bypassing Electrolyte Scattering for High Fidelity Time Resolved Studies

Small ◽  
2021 ◽  
pp. 2103213
Author(s):  
Bryan D. Paulsen ◽  
Alexander Giovannitti ◽  
Ruiheng Wu ◽  
Joseph Strzalka ◽  
Qingteng Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Grazing Incidence ◽  
High Fidelity ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Note: Setup for chemical atmospheric control during in situ grazing incidence X-ray scattering of printed thin films

2017 ◽  
Vol 88 (6) ◽  
pp. 066101 ◽  
Author(s):  
Stephan Pröller ◽  
Daniel Moseguí González ◽  
Chenhuii Zhu ◽  
Eric Schaible ◽  
Cheng Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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