MCD Observed by Photoemission on the 2p Lines of Iron Films Under an External Applied Field.

1993 ◽  
Vol 313 ◽  
Author(s):  
C. Boeglin ◽  
E. Beaurepaire ◽  
B. Carrière ◽  
K. Hricovini ◽  
G. Krill

ABSTRACTCircular Dichroic X-ray Photoemission Spectroscopy (CDXPS) experiments have been performed on the 2p core level spectra of polycrystalline Fe film which was magnetized by a low excitation field. The ability to perform the CDXPS experiments in a non remanent mode at a photon energy of 2100 eV opens new and interesting possibilities for the MCD technique in the study of surface and interface Magnetism. Our work on this polycrystalline iron gives some new insights into the understanding of the MCD Mechanism. First results show a similar angular variation for the measured asymmetry, as those observed on a Fe bcc (100) single crystal remanently magnetized in the [100] direction. Our results make clear that the parameters governing the behaviour of the asymmetry factor (A) are not completely described by the relative direction of the Magnetization (M) with the polarization vector of the incident beam (q) and the direction of detection of the photoelectrons (z). The specific outcoming of this work is to clearly show that this behaviour of A is not connected to the crystalline structure of the film for our geometries.

1993 ◽  
Vol 5 (33A) ◽  
pp. A193-A194 ◽  
Author(s):  
H Dreysse ◽  
H Haroun ◽  
A Chouairi ◽  
S Ouannasser

1998 ◽  
Vol 5 (3) ◽  
pp. 488-490 ◽  
Author(s):  
Yasuo Takagi ◽  
Masao Kimura

A new and more `generalized' grazing-incidence-angle X-ray diffraction (G-GIXD) method which enables simultaneous measurements both of in- and out-of-plane diffraction images from surface and interface structures has been developed. While the method uses grazing-incidence-angle X-rays like synchrotron radiation as an incident beam in the same manner as in `traditional' GIXD, two-dimensional (area) detectors like image plates and a spherical-type goniometer are used as the data-collection system. In this way, diffraction images both in the Seemann–Bohlin (out-of-plane) and GIXD geometry (in-plane) can be measured simultaneously without scanning the detectors. The method can be applied not only to the analysis of the in-plane crystal structure of epitaxically grown thin films, but also to more general research topics like the structural analysis of polycrystalline mixed phases of thin surface and interface layers.


1993 ◽  
Vol 47 (2) ◽  
pp. 810-817 ◽  
Author(s):  
J. I. Lee ◽  
Soon C. Hong ◽  
A. J. Freeman ◽  
C. L. Fu

2005 ◽  
Vol 10 (1) ◽  
pp. 1-4 ◽  
Author(s):  
G.H. Lee ◽  
Y.J. Jin ◽  
J.I. Lee ◽  
S.C. Hong

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