Magnetic Properties and Crystallography of Selected Co/Pt Multilayers with Rare-Earth Additions

1993 ◽  
Vol 313 ◽  
Author(s):  
G.A. Bertero ◽  
R.L. White ◽  
R. Sinclair

ABSTRACTWe have sputter-deposited a series of Pt/CO Multilayers with differing amounts of rare-earth (RE) in an effort to improve the uniaxial perpendicular anisotropy in these structures. The present work investigates the influence on the magnetic properties of Tb and Ho incorporated both at the interfaces of Pt/CO Multilayers and into the Co layers. The uniaxial anisotropy improved significantly only for those multilayers that showed poor perpendicular anisotropy in the undoped state, in particular, those with large (∼30 Å) bilayer periods. High resolution transmission electron microscopy was used to study these multilayers in cross-section. The Multilayer structures present strong [111] texture with grain sizes ranging from 200 to 600 Å. It is found that the RE does not produce a significant change in the growth texture of the multilayers until a critical amount is introduced beyond which the multilayer structure amorphizes resulting in a compositionally modulated amorphous film.

1984 ◽  
Vol 37 ◽  
Author(s):  
L. H. Greene ◽  
W. L. Feldmann ◽  
J. M. Rowell ◽  
B. Batlogg ◽  
R. Hull ◽  
...  

AbstractWe report the observation of a higher degree of preferred crystalline orientation in Nb/rare earth superlattices for modulation wavelengths in the range of 200 Å to 500 Å than that exhibited by single component films. All films and multilayers are sputter deposited onto room temperature sapphire substrates. Electronic transport measurements also show that the residual resistance ratio is higher and the room temperature resistivity is lower than for multilayers of either greater or lower periodicities. Transmission electron micrographs (TEM) showing excellent layering, grain size comparable to the layer thickness, and evidence of some degree of epitaxy are presented.


1993 ◽  
Vol 313 ◽  
Author(s):  
S. Sumi ◽  
Y. Kusumoto ◽  
Y. Teragaki ◽  
K. Torazawa ◽  
S. Tsunashima ◽  
...  

ABSTRACTMagnetic properties and roughness of sputter-deposited Pt/CO films strongly depend on preparation conditions such as rf input power, underlayers and their etching. Large coercivity was obtained by using suitable underlayers such as ZnO and adjusting input power higher for Co and lower for Pt. The coercivity in Pt/CO films seems to depend on the roughness of the surface and/or the layer interface as well as the perpendicular anisotropy.


Vacuum ◽  
1988 ◽  
Vol 38 (8-10) ◽  
pp. 797-800 ◽  
Author(s):  
C.E. Davies ◽  
R.E. Somekh ◽  
J.E. Evetts

1994 ◽  
Vol 343 ◽  
Author(s):  
Sung-Eon Park ◽  
Pu-Young Jung ◽  
Ki-Bum Kim ◽  
Seh-Kwang Lee ◽  
Soon-Gwang Kim

ABSTRACTWe have produced Co1-xPtX (X = 0.53 and 0.75) alloy films using DC magnetron sputtering and investigated their magnetic properties using vibrating sample magnetometry(VSM) and Kerr hysteresis loop tracer. The as-deposited Co-Pt alloy films show a strong in-plane magnetization. By annealing the alloy samples, we have identified that the magnetic properties are drastically changed. While the magnetic properties of the Co0 25Pt0 75 alloy films show no noticeable changes, the coercivity and the squareness of the Co0.47Pt0.53 alloy films are drastically increased after annealing. Transmission electron microscopy(TEM) and x-ray diffractometry(XRD) analysis showed that CoPt(L10) and Co-Pt3 (L12) ordered phases, respectively, are formed in each case with a strong (11) texture. We suggest that the perpendicular magnetic anisotropy in the Co-Pt system does not depend on the mere textureness of the layer but strongly depends on the arrangement of Co and Pt at an atomic scale.


1990 ◽  
Vol 202 ◽  
Author(s):  
Yunji L. Corcoran ◽  
Alexander H. King ◽  
Nimal deLanerolle ◽  
Bonggi Kim ◽  
John Berg

ABSTRACTTitanium films of 0.5 µm thickness were sputter deposited on silicon substrates. After rapid thermal annealing at temperatures ranging from 600°C to 850°C for times up to 45 seconds in nitrogen, transmission electron microscope (TEM) cross section specimens were made from the wafers. Grain sizes of the resulting titanium disilicide were measured from TEM cross section micrographs. The results show that C49-TiSi2 has a different grain growth rate than C54-TiSi2- Under our experimental conditions, C54-TiSi2 has a much higher growth rate. Titanium silicide on arsenic implanted silicon substrates shows a lower grain growth rate than that on unimplanted substrates under the same conditions. The thickness of the silicide layer was also measured for each specimen. The relationship of thickness and grain size will be discussed.


1989 ◽  
Vol 151 ◽  
Author(s):  
Teruya Shinjo ◽  
Ko Mibu ◽  
Shinichi Ogawa ◽  
Nobuyoshi Hosoito

ABSTRACTBy using UHV deposition technique, multilayered films consisting of Fe and rare-earth (Dy, Nd or Y) layers were prepared. Magnetic properties of Fe layers were investigated from 57Fe Mössbauer spectroscopy. From SQUID magnetic measurements, the behavior of rare-earth layers was studied. In Fe/Dy and Fe/Nd multilayers, there often exists a large perpendicular anisotropy. Mössbauer spectra evidenced that, in certain samples, the magnetization changes the direction, from in-plane at high temperature to perpendicular at low temperature. The origin of the perpendicular anisotropy is attributed to interface rare-earth atoms which are magnetically coupled with ferromagnetic Fe layers even at higher than their bulk Curie temperatures.


1973 ◽  
Author(s):  
H. J. Garrett ◽  
W. G. D. Frederick ◽  
Richard P. Allen ◽  
Hugh C. Wolfe ◽  
C. D. Graham ◽  
...  

2011 ◽  
Vol 130 (1-2) ◽  
pp. 603-608 ◽  
Author(s):  
A. Chrobak ◽  
V. Nosenko ◽  
G. Haneczok ◽  
L. Boichyshyn ◽  
B. Kotur ◽  
...  

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