Structural Characterisation of Iron-Copper Multilayers Using Transmission Electron Microscopy

1994 ◽  
Vol 367 ◽  
Author(s):  
S. J. Lloyd ◽  
R. E. Somekh ◽  
R.E. Dunin-Borkowski ◽  
W. M. Stobbs
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Tetragonal Distortion ◽  
Elastic Behaviour ◽  
Structural Characterisation ◽  
Iron Copper ◽  
Transmission Electron

AbstractCoherent iron-copper multilayers of a wavelength of 2.5nm that were measured to be nonmagnetic were structurally characterised using high resolution and Fresnel techniques. A measurement of the tetragonal distortion from layer to layer and as a whole would allow an assessment of the degree to which the material exhibits any anomaly in its elastic behaviour. The modelling of the distortions requires however the measurement of the abruptness of the interfaces and this requires the quantification of the Fresnel contrast. The degree to which the measurements can be obtained to the required accuracies is considered.

Structural Characterisation of Fe-Cu Multilayers of Differing Fe Thicknesses Using Transmission Electron Microscopy

1995 ◽  
Vol 382 ◽  
Author(s):  
S. J. Lloyd ◽  
R. E. Somekh ◽  
W. M. Stobbs
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Elasticity Theory ◽  
Multilayer Structure ◽  
High Resolution Electron Microscopy ◽  
Structural Characterisation ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Out Of Plane

ABSTRACTIn-plane and out-of-plane lattice parameters were measured in a series of coherent Fe-Cu multilayers using non-axial high resolution electron microscopy (HREM). The results indicate that the multilayers are tetragonally distorted with the magnitude of the distortion varying with the thickness of the Fe component. These distortions preclude an understanding of the multilayer structure in terms of conventional elasticity theory. The breakdown of epitaxy for thicker Fe layers was also investigated and it was found that the b.c.c. Fe grew with [110] parallel to [001] of the coherent f.c.c. multilayer.

A High Resolution Study of G.P. Zones in Aluminum - 4.2 at % Silver

1982 ◽  
Vol 40 ◽  
pp. 722-723 ◽  
Author(s):  
R. Gronsky
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Computer Simulations ◽  
Structural Characteristics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Resolution Study

The phenomenon of clustering in Al-Ag alloys has been extensively studied since the early work of Guinierl, wherein the pre-precipitation state was characterized as an assembly of spherical, ordered, silver-rich G.P. zones. Subsequent x-ray and TEM investigations yielded results in general agreement with this model. However, serious discrepancies were later revealed by the detailed x-ray diffraction - based computer simulations of Gragg and Cohen, i.e., the silver-rich clusters were instead octahedral in shape and fully disordered, atleast below 170°C. The object of the present investigation is to examine directly the structural characteristics of G.P. zones in Al-Ag by high resolution transmission electron microscopy.

Improved quantification of curvature in high-resolution transmission electron microscopy lattice fringe micrographs of soots

Carbon ◽  
2017 ◽  
Vol 117 ◽  
pp. 174-181 ◽  
Author(s):  
Chang’an Wang ◽  
Thomas Huddle ◽  
Chung-Hsuan Huang ◽  
Wenbo Zhu ◽  
Randy L. Vander Wal ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Lattice Fringe ◽  
Transmission Electron

Vertical self-organization of Ge1−xMnx nanocolumn multilayers grown on Ge(001) substrates

2016 ◽  
Vol 30 (20) ◽  
pp. 1650269 ◽  
Author(s):  
Thi Giang Le ◽  
Minh Tuan Dau
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Molecular Beam Epitaxy ◽  
Elastic Constant ◽  
Structural Properties ◽  
Molecular Beam ◽  
Self Organization ◽  
Transmission Electron ◽  
2D Model

High-resolution transmission electron microscopy (HR-TEM) has been used to investigate the structural properties of GeMn/Ge nanocolumns multilayer samples grown on Ge(001) substrates by means of molecular beam epitaxy (MBE) system. Four bilayers with the spacer thickness in the range between 6 nm and 15 nm and 10 periods of bilayers of Ge[Formula: see text]Mn[Formula: see text]/Ge nanocolumn are presented. A simplified 2D model based on the theory of elastic constant interactions has been used to provide reasonable explanations to the vertical self-organization of GeMn nanocolumns in multilayers.

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