Near-Edge X-ray Absorption Fine Structure of Hard Carbon Film Formed by Gas Cluster Ion Beam Assisted Deposition

2001 ◽  
Vol 695 ◽  
Author(s):  
Kazuhiro Kanda ◽  
Yutaka Shimizugawa ◽  
Yuichi Haruyama ◽  
Isao Yamada ◽  
Shinji Matsui ◽  
...  
Keyword(s):  
Fine Structure ◽  
Synchrotron Radiation ◽  
Ion Beam ◽  
Carbon Film ◽  
X Ray ◽  
Absorption Fine ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Ar Gas ◽  
X Ray Absorption

ABSTRACTThe coordination of the carbon atoms in the diamond-like carbon (DLC) films formed by Ar gas cluster ion beam (GCIB) assisted deposition of fullerene was investigated using synchrotron radiation. Near-edge x-ray absorption fine structure (NEXAFS) spectra of the carbon K-edge of the DLC films formed by various methods were measured over the excitation energy range 275-320 eV, using synchrotron radiation. On the basis of the analysis of the peak corresponding the transition of the excitation electron from carbon 1s orbital to Φ orbital, relative sp2 contents of various DLC films were determined. The DLC films formed by Ar GCIB assisted fullerene deposition were found to consist of a high sp3 hybridized carbon.

Near Edge X-Ray Absorption Fine Structure Study for Optimization of Hard Diamond-Like Carbon Film Formation with Ar Cluster Ion Beam

2003 ◽  
Vol 42 (Part 1, No. 6B) ◽  
pp. 3971-3975 ◽  
Author(s):  
Teruyuki Kitagawa ◽  
Kazuya Miyauchi ◽  
Kazuhiro Kanda ◽  
Yutaka Shimizugawa ◽  
Noriaki Toyoda ◽  
...  
Keyword(s):  
Fine Structure ◽  
Film Formation ◽  
Ion Beam ◽  
Carbon Film ◽  
Structure Study ◽  
Diamond Like Carbon ◽  
X Ray ◽  
Absorption Fine ◽  
Cluster Ion ◽  
X Ray Absorption

Fluorescence x‐ray absorption fine structure measurements using a synchrotron radiation x‐ray microprobe

1991 ◽  
Vol 62 (11) ◽  
pp. 2545-2549 ◽  
Author(s):  
Shinjiro Hayakawa ◽  
Yohichi Gohshi ◽  
Atsuo Iida ◽  
Sadao Aoki ◽  
Kohei Sato
Keyword(s):  
Fine Structure ◽  
Synchrotron Radiation ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

X-ray Photoelectron Spectroscopy Study of Diamond-Like Carbon Thin Films Formed by Ar Gas Cluster Ion Beam-Assisted Fullerene Deposition

2008 ◽  
Vol 47 (5) ◽  
pp. 3380-3383 ◽  
Author(s):  
Yuichi Haruyama ◽  
Teruyuki Kitagawa ◽  
Kazuhiro Kanda ◽  
Shinji Matsui ◽  
Tatsuo Gejo ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Ion Beam ◽  
Diamond Like Carbon ◽  
Spectroscopy Study ◽  
X Ray ◽  
Cluster Ion ◽  
Carbon Thin Films ◽  
Gas Cluster Ion Beam ◽  
Ar Gas

3C-, 4H- and 6H-SiC Bulks Studied by Silicon K-Edge X-Ray Absorption

2013 ◽  
Vol 740-742 ◽  
pp. 573-576 ◽  
Author(s):  
Wei Zeng ◽  
Zhe Chuan Feng ◽  
Rui Sheng Zheng ◽  
Ling Yun Jang ◽  
Chee Wei Liu
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Angular Dependence ◽  
Comparative Studies ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

High-resolution synchrotron radiation X-ray absorption of Si K-edge have been employed to investigate 6H-, 4H- and 3C-SiC. Detailed analyses of the extended x-ray absorption fine structure are taken by using the IFEFFIT program, and significant results on the atomic bonding are obtained from these comparative studies. The x-ray absorption near-edge structures of the Si K-edge are investigated, and the electronic structure of 3C-, 4H- and 6H-SiC are studied. In order to investigate the angular dependence, the x-ray absorption near-edge spectra were operated at 55o and 90o of the angle between the surface and the X-ray direction.

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