The Effects of Dopant Profiles on the Device Parapmetrs of p-i-n and n-i-p a-Si Solar Cells

1986 ◽  
Vol 70 ◽  
Author(s):  
F. R. Jeffrey ◽  
G. D. Vernstrom ◽  
M. Weber ◽  
K. A. Epstein
Keyword(s):  
Solar Cells ◽  
Fill Factor ◽  
Open Circuit Voltage ◽  
Spectral Response ◽  
Surface Recombination ◽  
Open Circuit ◽  
Response Data ◽  
Si Solar Cells ◽  
Recombination Current ◽  
Dopant Profiles

ABSTRACTwe have studied the effects of intrinsic layer dopant profiles on the open circuit voltage and fill factor of p-i-n and n-i-p solar cells. Data is presented showing that boron profiling into the i-layer is responsible for the commonly observed difference in open circuit voltage between p-i-n and n-i-p devices. As only a shallow profile is required to produce this effect, it is proposed that the lower Voc samples are being limited by surface recombination at the p/i interface and that the boron profile reduces this recombination current. The fill factor for devices illuminated through the n+ layer is shown to be very sensitive to the depth of a boron profile, yet not so sensitive to the profile concentration. A maximum occurs for a profile penetrating slightly more than half way through the cell. Spectral response data clearly shows a shifting of high collection from the back to the front of the cell.

Simulation of InAIN/Si Single-Heterojunction Solar Cells Using wxAMPS

2014 ◽  
Vol 665 ◽  
pp. 111-114 ◽  
Author(s):  
Ying Huang ◽  
Xiao Ming Shen ◽  
Xiao Feng Wei
Keyword(s):  
Solar Cells ◽  
Fill Factor ◽  
High Efficiency ◽  
Open Circuit Voltage ◽  
Short Circuit ◽  
Short Circuit Current ◽  
Indium Content ◽  
Open Circuit ◽  
Heterojunction Solar Cells ◽  
Si Solar Cells

In this paper, InAlN/Si single-heterojunction solar cells have been theoretically simulated based on wxAMPS software. The photovoltaic parameters, such as open circuit voltage, short circuit current, fill factor and conversion efficiency were investigated with changing the indium content and thickness of n-InAlN layer. Simulation results show that the optimum efficiency of InAlN/Si solar cells is 23.1% under AM 1.5G spectral illuminations, with the indium content and thickness of n-InAlN layer are 0.65 and 600nm, respectively. The simulation would contribute to design and fabricate high efficiency InAlN/Si solar cells in experiment.

Comparison of Prolonged Light Soaking of Single and Stacked Junction A-SI:H Solar Cells

1989 ◽  
Vol 149 ◽  
Author(s):  
P. Lechner ◽  
B. Scheppat ◽  
R. Geyer ◽  
H. Rübel ◽  
M. Gorn ◽  
...  
Keyword(s):  
Solar Cells ◽  
Layer Thickness ◽  
Fill Factor ◽  
Open Circuit Voltage ◽  
Prolonged Exposure ◽  
Single Cells ◽  
Open Circuit ◽  
Si Solar Cells ◽  
Extended Exposure ◽  
Interface Effects

ABSTRACTLight-induced degradation of a-Si solar cells is dependent on their design. The degradation rate for single cells increases with i-layer thickness. Very thin i-layer devices (d < 100 nm) exhibit a delayed onset of degradation which is accompanied by a severe loss of open circuit voltage at prolonged exposure times. By extrapolating i-layer thickness to zero and therefore separating bulk and interface effects, the latter may account for a substantial loss of stability. The introduction of a SiC buffer layer at the p/i interface results in a considerable higher degradation mainly caused by a loss in fill factor.Double stacked cells, as compared to single cells having similar initial efficiences, show higher stability. The instability at extended exposure times of very thin single cells as used in a tandem configuration did not influence the stacked device.

Microcrystalline (Si,Ge):H Solar Cells

2003 ◽  
Vol 762 ◽  
Author(s):  
Jianhua Zhu ◽  
Vikram L. Dalal
Keyword(s):  
Solar Cells ◽  
Buffer Layer ◽  
Quantum Efficiency ◽  
Fill Factor ◽  
Open Circuit Voltage ◽  
Defect Density ◽  
Cell Structure ◽  
Open Circuit ◽  
Base Layer ◽  
Ecr Plasma

AbstractWe report on the growth and properties of microcrystalline Si:H and (Si,Ge):H solar cells on stainless steel substrates. The solar cells were grown using a remote, low pressure ECR plasma system. In order to crystallize (Si,Ge), much higher hydrogen dilution (∼40:1) had to be used compared to the case for mc-Si:H, where a dilution of 10:1 was adequate for crystallization. The solar cell structure was of the p+nn+ type, with light entering the p+ layer. It was found that it was advantageous to use a thin a-Si:H buffer layer at the back of the cells in order to reduce shunt density and improve the performance of the cells. A graded gap buffer layer was used at the p+n interface so as to improve the open-circuit voltage and fill factor. The open circuit voltage and fill factor decreased as the Ge content increased. Quantum efficiency measurements indicated that the device was indeed microcrystalline and followed the absorption characteristics of crystalline ( Si,Ge). As the Ge content increased, quantum efficiency in the infrared increased. X-ray measurements of films indicated grain sizes of ∼ 10nm. EDAX measurements were used to measure the Ge content in the films and devices. Capacitance measurements at low frequencies ( ~100 Hz and 1 kHz) indicated that the base layer was indeed behaving as a crystalline material, with classical C(V) curves. The defect density varied between 1x1016 to 2x1017/cm3, with higher defects indicated as the Ge concentration increased.

scholarly journals Numerical Simulation Analysis of Ag Crystallite Effects on Interface of Front Metal and Silicon in the PERC Solar Cell

Energies ◽  
2021 ◽  
Vol 14 (3) ◽  
pp. 592
Author(s):  
Myeong Sang Jeong ◽  
Yonghwan Lee ◽  
Ka-Hyun Kim ◽  
Sungjin Choi ◽  
Min Gu Kang ◽  
...  
Keyword(s):  
Solar Cells ◽  
Solar Cell ◽  
High Efficiency ◽  
Open Circuit Voltage ◽  
Surface Recombination ◽  
Open Circuit ◽  
Surface Recombination Velocity ◽  
Metal Interface ◽  
Ag Crystallites ◽  
Recombination Velocity

In the fabrication of crystalline silicon solar cells, the contact properties between the front metal electrode and silicon are one of the most important parameters for achieving high-efficiency, as it is an integral element in the formation of solar cell electrodes. This entails an increase in the surface recombination velocity and a drop in the open-circuit voltage of the solar cell; hence, controlling the recombination velocity at the metal-silicon interface becomes a critical factor in the process. In this study, the distribution of Ag crystallites formed on the silicon-metal interface, the surface recombination velocity in the silicon-metal interface and the resulting changes in the performance of the Passivated Emitter and Rear Contact (PERC) solar cells were analyzed by controlling the firing temperature. The Ag crystallite distribution gradually increased corresponding to a firing temperature increase from 850 ∘C to 950 ∘C. The surface recombination velocity at the silicon-metal interface increased from 353 to 599 cm/s and the open-circuit voltage of the PERC solar cell decreased from 659.7 to 647 mV. Technology Computer-Aided Design (TCAD) simulation was used for detailed analysis on the effect of the surface recombination velocity at the silicon-metal interface on the PERC solar cell performance. Simulations showed that the increase in the distribution of Ag crystallites and surface recombination velocity at the silicon-metal interface played an important role in the decrease of open-circuit voltage of the PERC solar cell at temperatures of 850–900 ∘C, whereas the damage caused by the emitter over fire was determined as the main cause of the voltage drop at 950 ∘C. These results are expected to serve as a steppingstone for further research on improvement in the silicon-metal interface properties of silicon-based solar cells and investigation on high-efficiency solar cells.

The Effect of Al-BSF on Seff and Rb in Industrialized Mono-Silicon Solar Cells

2012 ◽  
Vol 472-475 ◽  
pp. 1846-1850
Author(s):  
Shan Shan Dai ◽  
Gao Jie Zhang ◽  
Xiang Dong Luo ◽  
Jing Xiao Wang ◽  
Wen Jun Chen ◽  
...  
Keyword(s):  
Solar Cells ◽  
Spectral Response ◽  
Short Circuit ◽  
Rear Surface ◽  
Surface Recombination ◽  
Short Circuit Current ◽  
Open Circuit ◽  
Surface Recombination Velocity ◽  
Silicon Solar Cells ◽  
Back Surface

In this work, the effect of aluminum back surface field formed by screen printed various amount of Al paste on the effective rear surface recombination velocity (Seff) and the internal rear reflectance coeffeicient (Rb) of commercial mono-silicon solar cells was investigated. We demonstrated the effect of Seffand Rbon the performance of Al-BSF solar cells by simulating them with PC1D. The simulated results showed that the lower Seffcould get higher open circuit voltage (Voc), at the same time, the larger Rbcould get higher short-circuit current (Isc). Experimentally, we investigated the Seffand Rbthrough depositing Al paste with various amount (3.7, 5, 6, and 8 mg/cm2) for fabricating Al-BSF mono-silicon solar cells. Four group cells were characterized by light I-V, spectral response, hemispherical reflectance and scanning electron microscope (SEM) measurements. It was found that, a minimum Seffof 350 cm/s was gotten from the cells with Al paste of 8 mg/cm2, which was extracted by matching quantum efficiency (QE) from 800 nm to 1200 nm with PC1D, and a maximum Rbof 53.5% was obtained from Al paste of 5 mg/cm2by calculating at 1105 nm with PC1D. When the amount of Al paste was higher than 5mg/cm2, there were less Seffand lower Rb. On the other hand, when Al amount was 3.7mg/cm2, it was too little to form a closed BSF. Based on the SEM graphs and simulations with PC1D, a simple explaination was proposed for the experimental results.

Degradation Mechanism of III-V Triple Junction Solar Cells Analyzed Using Step Stress Tests

2013 ◽  
Vol 284-287 ◽  
pp. 281-286 ◽  
Author(s):  
Hwen Fen Hong ◽  
Jin Wei ◽  
Mei Hui Chiang ◽  
Zun Hao Shih ◽  
Wu Yih Uen ◽  
...  
Keyword(s):  
Solar Cells ◽  
Triple Junction ◽  
Fill Factor ◽  
Degradation Mechanism ◽  
Depletion Region ◽  
Open Circuit ◽  
Protective Film ◽  
Stress Tests ◽  
Accelerated Degradation ◽  
Recombination Current

We analyzed the degradation mechanism of GaInP/GaInAs/Ge triple junction solar cells without coating any protective film. Gradual degradation in the dark and light I-V characteristics of the solar cells were observed after the step stress accelerated degradation tests (SSADT) were conducted on these devices sequentially at 90, 110, 130 and 150°Cfor 25, 55, 85 and 135 hours, respectively. The recombination current in the depletion region at the chip perimeter of solar cells, resulting in the decrease of open-circuit voltage (VOC), fill factor (FF) and efficiency, is suggested to be the important degradation mechanism for GaInP/GaInAs/Ge triple junction solar cells.

scholarly journals Ultra-low p-doping of poly(3-hexylthiophene) and its impact on polymer aggregation and photovoltaic performance

2016 ◽  
Vol 4 (1) ◽  
Author(s):  
Marcel M. Said ◽  
Yadong Zhang ◽  
Raghunath R. Dasari ◽  
Dalaver H. Anjum ◽  
Rahim Munir ◽  
...  
Keyword(s):  
Solar Cells ◽  
Fill Factor ◽  
Open Circuit Voltage ◽  
Photovoltaic Performance ◽  
Photovoltaic Cells ◽  
Open Circuit ◽  
Device Performance ◽  
Long Range Order ◽  
P3ht Film ◽  
Low Levels

AbstractPoly(3-hexylthiophene) (P3HT) films and P3HT / fullerene photovoltaic cells have been p-doped with very low levels (< 1 wt. %) of molybdenum tris[1-(trifluoromethylcarbonyl)- 2-(trifluoromethyl)-ethane-1,2-dithiolene]. The dopants are inhomogenously distributed within doped P3HT films, both laterally and as a function of depth, and appear to aggregate in some instances. Doping also results in subtle changes in the local and long range order of the P3HT film. These effects likely contribute to the complexity of the observed evolutions in conductivity, mobility and work function with doping levels. They also negatively affect the open-circuit voltage and fill factor of solar cells in unexpected ways, indicating that dopant aggregation and non-uniform distribution can harm device performance.

Sign in / Sign up

Export Citation Format

Share Document