ZnO and ZnMgO Growth by Molecular Beam Epitaxy

2002 ◽  
Vol 744 ◽  
Author(s):  
Mitsuaki Yano ◽  
Ken-ichi Ogata ◽  
FengPing Yan ◽  
Kazuto Koike ◽  
Shigehiko Sasa ◽  
...  

ABSTRACTCharacteristics of the ZnO and ZnMgO films grown by radical-source molecular beam epitaxy are reported. The ZnO films on a-plane sapphire substrates had a superior quality in crystallographic, optical and electrical properties, and n-type doping with Al was successfully performed up to 1020 cm–3. The Mg-content of ZnMgO alloys was found to be controlled by a simple growth mechanism as a function of Mg-cell temperature. The alloying in the ZnO-rich region resulted in single-crystalline growth although the photoluminescence characteristics at x = 0.22 suggested the presence of microscopic phase separation. Single-crystalline growth was also achieved on Si (111) substrates by using a CaF2 buffer layer to protect the Si-surface from oxidation.

2011 ◽  
Vol 29 (3) ◽  
pp. 03A111 ◽  
Author(s):  
Seok Kyu Han ◽  
Hyo Sung Lee ◽  
Dong Seok Lim ◽  
Soon-Ku Hong ◽  
Nara Yoon ◽  
...  

2011 ◽  
Vol 519 (19) ◽  
pp. 6394-6398 ◽  
Author(s):  
Seok Kyu Han ◽  
Soon-Ku Hong ◽  
Jae Wook Lee ◽  
Jae Goo Kim ◽  
Myoungho Jeong ◽  
...  

2003 ◽  
Vol 93 (4) ◽  
pp. 1961-1965 ◽  
Author(s):  
Takeshi Ohgaki ◽  
Naoki Ohashi ◽  
Hirofumi Kakemoto ◽  
Satoshi Wada ◽  
Yutaka Adachi ◽  
...  

2004 ◽  
Vol 1 (4) ◽  
pp. 868-871
Author(s):  
P. Fons ◽  
H. Tampo ◽  
K. Nakahara ◽  
A. Yamada ◽  
K. Matsubara ◽  
...  

2001 ◽  
Vol 692 ◽  
Author(s):  
Kazuto Koike ◽  
Takanori Tanite ◽  
Shigehiko Sasa ◽  
Masataka Inoue ◽  
Mitsuaki Yano

AbstractThis report describes the growth of single-crystalline ZnO films on Si (111) substrates by plasma-assisted molecular-beam epitaxy. X-ray diffraction measurement shows that c-axis oriented ZnO films are easily grown on Si (111) substrates. However, in-plane random rotational domains are included in the ZnO films due to the inevitable oxidation of substrate surface at the initial stage of ZnO growth. By employing a thin CaF2 buffer layer between the ZnO films and Si substrates, we have succeeded in suppressing the generation of rotational domains and in obtaining an intense ultraviolet photoluminescence even at room temperature. These results indicate that the use of CaF2 buffer layer is promising for the growth of device-quality ZnO films on Si (111) substrates.


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