Current Chemistry: Characterization of Thin-Film Surfaces and Interfaces Using Neutron Reflectometry

2001 ◽  
Vol 54 (8) ◽  
pp. 487 ◽  
Author(s):  
Michael James
Keyword(s):  
Thin Film ◽  
Data Analysis ◽  
Experimental Design ◽  
Extreme Environments ◽  
Neutron Reflectometry ◽  
Buried Interfaces ◽  
Surfaces And Interfaces ◽  
Wide Range ◽  
Non Destructive

Neutron reflectometry has become an increasingly important technique in the characterization of thin-film surfaces and interfaces. Recent advances in instrumentation, experimental design, sample environments and methods of data analysis now make it possible to obtain an angstrom-precision depth profile of the film composition. Neutrons are non-destructive and highly penetrating which makes them ideal probes for the study of buried interfaces as well as surfaces under a wide range of extreme environments. Isotopic H/D substitution (particularly in colloidal, polymeric or biological systems) provides a unique tool for selectively labelling different components of complex planar architectures. The fundamental aspects of neutron reflectometry are discussed, and the utility of this technique is illustrated by a review of several recent studies.

scholarly journals Applications of neutron reflectometry in biology

2020 ◽  
Vol 236 ◽  
pp. 04002 ◽  
Author(s):  
Yuri Gerelli
Keyword(s):  
Thin Films ◽  
Structural Features ◽  
Neutron Reflectometry ◽  
Protein Films ◽  
Biologically Relevant ◽  
Buried Interfaces ◽  
Biological Thin Films ◽  
Non Destructive

Over the last 10 years, neutron reflectometry (NR) has emerged as a powerful technique for the investigation of biologically relevant thin films. The great advantage of NR with respect to many other surface-sensitive techniques is its sub-nanometer resolution that enables structural characterizations at the molecular level. In the case of bio-relevant samples, NR is non-destructive and can be used to probe thin films at buried interfaces or enclosed in bulky sample environment equipment. Moreover, recent advances in biomolecular deutera-tion enabled new labeling strategies to highlight certain structural features and to resolve with better accuracy the location of chemically similar molecules within a thin film. In this chapter I will describe some applications of NR to bio-relevant samples and discuss some of the data analysis approaches available for biological thin films. In particular, examples on the structural characterization of biomembranes, protein films and protein-lipid interactions will be described.

Synchrotron-based spectroscopy for the characterization of surfaces and interfaces in chalcopyrite solar cells

2005 ◽  
Vol 865 ◽  
Author(s):  
Iver Lauermann ◽  
Paul Pistor ◽  
Immo Kötschau ◽  
Marcus Bär
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
State Of The Art ◽  
Depth Information ◽  
Spectroscopic Methods ◽  
Photovoltaic Devices ◽  
Buried Interfaces ◽  
Surfaces And Interfaces

AbstractIn this paper we describe synchrotron based, state-of-the-art spectroscopic methods for the analysis of surfaces and interfaces in thin film photovoltaic devices, their merits and their limitations. Using results obtained with the “CISSY” end station at the BESSY synchrotron in Berlin, Germany, we show how surface sensitive Synchrotron excitedX-rayPhotoelectronSpectroscopy(SXPS)andSoftX-rayEmissionSpectroscopy (SXES), which yields compositional and chemical depth information in the ten to hundred nm scale, have increased our knowledge of the chemistry of surfaces and buried interfaces of these systems.

Wet-Chemical Conditioning of H-Terminated Silicon Solar Cell Substrates Investigated by Surface Photovoltage Measurements

2012 ◽  
Vol 195 ◽  
pp. 301-304 ◽  
Author(s):  
Heike Angermann ◽  
U. Stürzebecher ◽  
J. Kegel ◽  
C. Gottschalk ◽  
K. Wolke ◽  
...  
Keyword(s):  
Solar Cell ◽  
Silicon Solar Cell ◽  
Energy Conversion Efficiency ◽  
Charge Carriers ◽  
Surface Charges ◽  
Surfaces And Interfaces ◽  
Wet Chemical ◽  
Substrate Surfaces ◽  
Non Destructive

For further enhancement of solar energy conversion efficiency the passivation of silicon (Si) substrate surfaces and interfaces of Si-based solar cell devices is a decisive precondition to reduce recombination losses of photogenerated charge carriers. These losses are mainly controlled by surface charges, the density and the character of rechargeable interface states (Dit) [], which are induced by defects localised in a small interlayer extending over only few Å. Therefore, the application of fast non-destructive methods for characterization of the electronic interface properties directly during the technological process has received an increasing interest in recent years.

X-RAY DIFFRACTION FOR SURFACES AND BURIED INTERFACES

2000 ◽  
Vol 07 (04) ◽  
pp. 437-446 ◽  
Author(s):  
G. RENAUD
Keyword(s):  
Grazing Incidence ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Sizes ◽  
Buried Interfaces ◽  
Surfaces And Interfaces ◽  
Coherent Interfaces

The application of X-rays to the structural characterization of surfaces and interfaces, in situ and in UHV, is discussed on selected examples. Grazing incidence X-ray diffraction is not only a very powerful technique for quantitatively investigating the atomic structure of surfaces and interfaces, but is also very useful for providing information on the interfacial registry for coherent interfaces or on the strain deformation, island and grain sizes for incoherent epilayers.

Holistic Characterization of Carbon Nanotube Membrane for Capacitive Deionization Electrodes Application

2015 ◽  
Vol 1752 ◽  
pp. 125-130 ◽  
Author(s):  
Yamila M. Omar ◽  
Carlo Maragliano ◽  
Chia-Yun Lai ◽  
Francesco Lo Iacono ◽  
Nicolas Bologna ◽  
...  
Keyword(s):  
Thin Film ◽  
Material Characterization ◽  
Capacitive Deionization ◽  
Carbon Nanostructure ◽  
Rate Dependent ◽  
Wide Range ◽  
Materials Used ◽  
Multiwall Carbon ◽  
Mechanical Surface

ABSTRACTOne of the main areas of improvement in capacitive deionization technologies is the materials used for electrodes which have very specific requirements. In the present work, a wide range of material characterization techniques are employed to determine the suitability of a multiwall carbon nanostructure thin film as electrode material. The electrical, mechanical, surface and wetting characteristics are studied proving the membrane highly conductive (σ=7.25 103 S/m), having competitive electro-sorption capacity (11.7 F/g at 10 mV/s) and surface area (149 m2/g), strain rate dependent mechanical properties and hydrophobic wetting behavior.

scholarly journals Off-Specular X-ray and Neutron Reflectometry for the Structural Characterization of Buried Interfaces

2007 ◽  
Author(s):  
Kristopher A. Lavery ◽  
Vivek M. Prabhu ◽  
Eric K. Lin ◽  
Wen-li Wu ◽  
Sushil Satija ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Neutron Reflectometry ◽  
X Ray ◽  
Buried Interfaces

Non-Destructive Measurement of Plastic Deformation under the Extreme Environments

2016 ◽  
Vol 827 ◽  
pp. 31-34
Author(s):  
Radka Pernicová ◽  
Jindřich Zeman
Keyword(s):  
Extreme Environments ◽  
Catastrophic Failure ◽  
Defect Analysis ◽  
Wide Range ◽  
Before And After ◽  
Microscopy Analysis ◽  
Destructive Measurement ◽  
Non Destructive ◽  
Paper Method ◽  
Distance Change

Measuring of the non-elastic deformation of wide range of materials under extreme environments, such as high temperature, underwater or lack of space, is described in this paper. Method, called Predictive Instant Defect Analysis of Constructions for short PIDAC, is based on precise indication of defined distance change between two points before and after loading. Distance is mechanical imprinted into an indication specimen and consequently measured by microscopy analysis. The technology solves not only problem of measuring plastic length deformations but also offers the capability of predicting catastrophic failure due to the breaking, tearing, or deforming of materials.

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