Reaction of common bean progenies to white mold derived from recurrent selection

This study was realized with the objective of verifying the resistance to white mold of common bean progenies derived from recurrent selection for resistance to angular leaf spot. The plant material used was obtained from a program of recurrent selection, which was started by crossing seven lines with carioca grain type with ten sources of resistance to angular leaf spot according to the partial diallel scheme. To evaluate the resistance to white mold, it was verified the reaction of 17 parents plus 35 selected progenies, to oxalic acid. Huge heterogeneity among the parents was observed, showing that some of them have resistance alleles to white mold, and thus, there is a possibility of recombine these alleles through the recurrent selection and obtaining progenies with high levels of resistance. Even in initial cycles, some progenies exhibited resistance to white mold similar to the one of cultivar 'G-122', which presents good level of resistance to this disease. This leads to infer that the original population already had some level of physiological resistance for the reaction to absorption of oxalic acid, and also for resistance to angular leaf spot. Thus, among the selected progenies for resistance to angular leaf spot, grain type and high yield, at least four progenies have resistance to white mold similar to the source of resistance 'G-122'.

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Eight cycles of recurrent selection for resistance to angular leaf spot in common bean

Cropp Breeding and Applied Biotechnology ◽

10.1590/s1984-70332010000300008 ◽

2010 ◽

Vol 10 (3) ◽

pp. 232-237 ◽

Cited By ~ 14

Author(s):

Lúcio de Oliveira Arantes ◽

Ângela de Fátima Barbosa Abreu ◽

Magno Antonio Patto Ramalho

Keyword(s):

Common Bean ◽

Leaf Spot ◽

Recurrent Selection ◽

Diallel Cross ◽

Angular Leaf Spot ◽

Population Cycle ◽

Direct Selection ◽

Genetic Progress ◽

Yield Gain ◽

Selection For

The genetic progress (GP) was evaluated after eight cycles of recurrent selection for resistance to angular leaf spot in common bean and indirect gain for yield and grain type. The base population (Cycle-0) was obtained from the diallel cross of seven lines with carioca grain and ten resistance sources. To obtain Cycle I, the most resistant S0 plants of Cycle 0 were intercrossed. The same procedure was adopted in the subsequent cycles. GP for resistance to the pathogen was estimated by the overall average of the progenies of each cycle in comparison with control Carioca MG and for productivity in comparison to the controls Carioca MG and Pérola. Lines of the first six cycles were used for grain type. No GP was detected for resistance to angular leaf spot. However, the indirect yield gain was 2.3% and 2.5% in the selection for grain type, with values similar to those obtained by direct selection for these traits.

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Prevalence of angular leaf spot disease and sources of resistance in common bean in eastern Democratic Republic of Congo

African Crop Science Journal ◽

10.4314/acsj.v25i1.8 ◽

2017 ◽

Vol 25 (1) ◽

pp. 109 ◽

Cited By ~ 2

Author(s):

R Kijana ◽

M Abang ◽

R Edema ◽

C Mukankusi ◽

R Buruchara

Keyword(s):

Common Bean ◽

Leaf Spot ◽

Democratic Republic ◽

Democratic Republic Of Congo ◽

Angular Leaf Spot ◽

Leaf Spot Disease ◽

Sources Of Resistance ◽

Republic Of Congo ◽

Spot Disease

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Increasing the efficiency of recurrent selection for angular leaf spot resistance in common bean

Crop Science ◽

10.1002/csc2.20010 ◽

2020 ◽

Vol 60 (2) ◽

pp. 751-758

Author(s):

Samira Santiago Librelon ◽

Paula Furtado de Pádua ◽

Ângela de Fátima Barbosa Abreu ◽

Magno Antonio Patto Ramalho ◽

Elaine Aparecida de Souza

Keyword(s):

Common Bean ◽

Leaf Spot ◽

Recurrent Selection ◽

Angular Leaf Spot ◽

Selection For

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Screening Common Bean (Phaseolus vulgaris L.) Germplasm for Resistance against Angular Leaf Spot (Pseudocercospora griseola) Disease under Field Condition

Journal of Plant Studies ◽

10.5539/jps.v8n1p30 ◽

2019 ◽

Vol 8 (1) ◽

pp. 30

Author(s):

Yayis Rezene ◽

Shiferw Mekonin

Keyword(s):

Common Bean ◽

Field Condition ◽

Leaf Spot ◽

Genetic Resistance ◽

Angular Leaf Spot ◽

Eastern Africa ◽

Leaf Spot Disease ◽

Sources Of Resistance ◽

The Common ◽

Pseudocercospora Griseola

Angular leaf spot (ALS) caused by the fungus Pseudocercospora griseola is one of the most destructive disease in Latin America and eastern Africa countries. The fungus, P. griseola is highly variable and a diverse sources of resistance genes is required to manage this economically important disease. The use of genetic resistance is the most practical and economic way to manage angular leaf spot of the common bean. Common bean (Phaseolus vulgarise L.) germplasm were screened for resistance against Angular leaf spot (ALS) under field conditions at Wonodogenet and Areka Research farms. Out of 300 common bean accessions evaluated only 14 (4.6%) common bean accessions were resistant to naturally epidemics of angular leaf spot disease under field condition. Therefore, all common bean germplasm that showed resistance reaction can be involved in breeding program for the improvement of the common bean.

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Adaptation and Resistance to Diseases in Brazil of Putative Sources of Common Bean Resistance to White Mold

Plant Disease ◽

10.1094/pdis-09-14-0939-re ◽

2015 ◽

Vol 99 (8) ◽

pp. 1098-1103 ◽

Cited By ~ 11

Author(s):

M. S. Lehner ◽

H. Teixeira ◽

T. J. Paula Júnior ◽

R. F. Vieira ◽

R. C. Lima ◽

...

Keyword(s):

Common Bean ◽

Partial Resistance ◽

Field Experiments ◽

Yield Potential ◽

White Mold ◽

High Yield ◽

Sources Of Resistance ◽

Breeding Programs ◽

Intermediate Resistance ◽

High Yield Potential

Common bean breeding programs for white mold (WM) resistance are in their initial stages in Brazil. Sources of partial resistance to WM are available abroad but their performance in Brazil is unknown. In two greenhouse (straw test) and three field experiments conducted in three districts in the state of Minas Gerais, Brazil, we evaluated a total of 23 lines with putative WM resistance with the objective to select lines with resistance to WM and other diseases associated with high yield potential. Two field-resistant local lines, two susceptible local cultivars, and two susceptible international lines were also included in the study. In the greenhouse, Cornell 605, A 195, and G122 were among the lines with the highest partial resistance to WM. In the field, these three lines were highly resistant to WM and had intermediate resistance or were resistant to anthracnose, angular leaf spot, rust, and Fusarium wilt. Cornell 605 and A 195 had high-yield potential but G122 yielded 47% less than the local lines under WM pressure. Our results suggest that Cornell 605 and A 195 are the most useful sources of resistance to WM for use in common bean breeding programs in Brazil.

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