Development of Instrument Calibration Method for Dynamic Olfactometers

2008 ◽  
Vol 2008 (4) ◽  
pp. 16-23
Author(s):  
John Jiang
Keyword(s):  
Calibration Method ◽  
Instrument Calibration ◽  
Development Of Instrument

Research on the Calibration Method for Analog Measuring Instrument

2014 ◽  
Vol 926-930 ◽  
pp. 1554-1557
Author(s):  
Xiao Ju Ma ◽  
Yu Gao ◽  
Lin Yun Zhou
Keyword(s):  
Template Matching ◽  
Calibration Method ◽  
Measuring Instruments ◽  
Measuring Instrument ◽  
Bottom Line ◽  
Instrument Calibration ◽  
Analog Measuring ◽  
Rectangular Area

This paper presents a pointer instrument calibration method based on template matching, which segments the image that area closest to the pointer by setting the width on the basis of the meter needle positioning, scans the region from top to bottom line by line, determines smaller rectangular area containing calibration digital only, uses template matching to identify numbers theory to identify the calibration digital in the region. Experiments show that this method can identify the calibration digital quickly and efficiently in analog measuring instruments.

Distortion in lattice-resolution scanned-probe microscope images

1993 ◽  
Vol 51 ◽  
pp. 522-523
Author(s):  
L. Fei
Keyword(s):  
Film Studies ◽  
Lattice Structure ◽  
Substrate Material ◽  
Repulsive Force ◽  
Instrument Calibration ◽  
Microscope Images ◽  
Probe Microscope ◽  
Electron Microscopes ◽  
Diffraction Patterns ◽  
Lattice Resolution

Scanned probe microscopes (SPM) have been widely used for studying the structure of a variety material surfaces and thin films. Interpretation of SPM images, however, remains a debatable subject at best. Unlike electron microscopes (EMs) where diffraction patterns and images regularly provide data on lattice spacings and angles within 1-2% and ∽1° accuracy, our experience indicates that lattice distances and angles in raw SPM images can be off by as much as 10% and ∽6°, respectively. Because SPM images can be affected by processes like the coupling between fast and slow scan direction, hysteresis of piezoelectric scanner, thermal drift, anisotropic tip and sample interaction, etc., the causes for such a large discrepancy maybe complex even though manufacturers suggest that the correction can be done through only instrument calibration.We show here that scanning repulsive force microscope (SFM or AFM) images of freshly cleaved mica, a substrate material used for thin film studies as well as for SFM instrument calibration, are distorted compared with the lattice structure expected for mica.

Practical color calibration method for multi-projectors display

2009 ◽  
Vol 29 (4) ◽  
pp. 982-986
Author(s):  
Jun ZHANG ◽  
Bang-ping WANG ◽  
Cheng YI ◽  
Xiao-feng LI ◽  
Hui LI
Keyword(s):  
Calibration Method ◽  
Color Calibration

A Calibration Method for Mutual Coupling Across a Vector Sensor

2013 ◽  
Vol 34 (7) ◽  
pp. 1558-1561 ◽  
Author(s):  
Gui-bao Wang ◽  
Hai-hong Tao ◽  
Lan-mei Wang
Keyword(s):  
Mutual Coupling ◽  
Calibration Method ◽  
Vector Sensor

Kinematic Calibration Method of Robots Based on Distance Error

ROBOT ◽  
2013 ◽  
Vol 35 (5) ◽  
pp. 600 ◽  
Author(s):  
Wenbin GAO ◽  
Hongguang WANG ◽  
Yong JIANG ◽  
Xin'an PAN
Keyword(s):  
Calibration Method ◽  
Kinematic Calibration ◽  
Distance Error

An Online Calibration Method for Manipulator with Joint Clearance

ROBOT ◽  
2013 ◽  
Vol 35 (5) ◽  
pp. 521
Author(s):  
Feng WANG ◽  
Kai CHEN ◽  
Xiaoping CHEN
Keyword(s):  
Calibration Method ◽  
Joint Clearance ◽  
Online Calibration
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