scholarly journals UNCERTAINTY IN BUSINESS VALUATION FOR TAX PURPOSES

2021 ◽  
Vol 19 (17) ◽  
Author(s):  
Kristian Agung Prasetyo ◽  
Adhipradana Prabu Swasito ◽  
Dhian Adhetiya Safitra
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Scenario Analysis ◽  
Economic Structure ◽  
Complete Information ◽  
Political Leader ◽  
Business Risk ◽  
Business Valuation ◽  
Uncertain Variables ◽  
Investigation Process

An important but often neglected aspect in business valuation for tax purposes is uncertainty. It is known in the literature that changes in economic structure, people’s behavior, business risk, or political leader are expected. Unfortunately, these factors cannot be effectively measured and reported in business valuation for tax purposes. As such, most business valuations for tax purposes are unable to capture uncertainty adequately. Valuation reports under a tax investigation process only present an estimated value in the form of a single value, which is unable to represent uncertainty sufficiently. This paper aims to demonstrate a method to quantify uncertain variables into the business valuation for tax purposes. The research engaged scenario analysis to arrive in three different possible value estimates, and Monte Carlo simulation to take uncertainties into accountto produce a frequency distribution containing all possible values between predetermined limits. Using the range of value produced in the simulation, a taxpayer will have more complete information to decide whether taxpayers submit an undervalue report or not.

scholarly journals Monte Carlo Simulation and Scenario Analysis Based Limestone Quarry Production Planning

2021 ◽  
Vol 12 (1) ◽  
pp. 41-45
Author(s):  
Kausar Sultan Shah ◽  
Safi Ur Rehman
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Chemical Composition ◽  
Production Planning ◽  
Scenario Analysis ◽  
Raw Materials ◽  
Raw Material ◽  
Mix Design ◽  
Efficient Planning ◽  
The Impact

The key factor behind raw mix design in the cement factory is the appropriate production planning, resulting in high-quality raw material. Quarry managers usually come up with uncertainty-related raw materials due to variations in chemical composition. These uncertainties required efficient planning in terms of useful insight into this problem. This research provides a detailed explanation of scenario analysis of raw materials used in cement manufacturing using Monte Carlo simulation (MCS) and indices. Scenario analysis is used to predict the possibility of best, worst and most likely cases of raw material’s quality. Whereas, Monte Carlo simulation is used to evaluate the inherent uncertainty associated with chemical composition values in order to analyze the impact of truly unpredictable scenarios. The predictive results help in decisions related to production planning, raw mix design optimization and increasing the probability of designing the best plan.

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

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