High spatial resolution scanning electron microscope: evaluation and structural analysis of nanostructured materials. Part 2

Analytics ◽  
2018 ◽  
Vol 8 (5) ◽  
pp. 448-456
Author(s):  
Osamu Terasaki ◽  
Yanhang Ma ◽  
Yuusuke Sakuda ◽  
Hideyuki Takahashi ◽  
Kenichi Tsutsumi ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Structural Analysis ◽  
Scanning Electron Microscope ◽  
Nanostructured Materials ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Scanning Electron

High Spatial Resolution Spin-Polarized Scanning Electron Microscope

1985 ◽  
Vol 24 (Part 2, No. 10) ◽  
pp. L833-L834 ◽  
Author(s):  
Kazuyuki Koike ◽  
Hideo Matsuyama ◽  
Hideo Todokoro ◽  
Kazunobu Hayakawa
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Spin Polarized ◽  
Scanning Electron

High-Spatial-Resolution Cathodoluminescence Measurement of InGaN

2002 ◽  
Vol 743 ◽  
Author(s):  
Hisashi Kanie ◽  
Hiroaki Okado ◽  
Takaya Yoshimura
Keyword(s):  
Electron Microscope ◽  
Energy Level ◽  
Spatial Resolution ◽  
Diffusion Length ◽  
High Spatial Resolution ◽  
Lower State ◽  
Measuring Apparatus ◽  
Bulk Crystals ◽  
Recombination Centers ◽  
Scanning Electron

ABSTRACTThis paper described observation of cathodoluminescence (CL) of microcrystalline InGaN bulk crystals under a scanning electron microscope (SEM) with a high-spatial-resolution (HR) CL measuring apparatus. HR-CL spectra from facets of InGaN crystals vary from facet to facet and are single peaked. Histogram analysis of the CL peak positions of HR spectra from the facets of the crystals in the area scanned during a low-resolution CL measurement shows a two-peaked form with comparable peak wavelengths. The diffusion length of a generated electron- ho le pair or an exciton from the recombination centers with a higher-energy-level state to that with a lower state is estimated to be 500 nm at the longest by the comparison of two monochromatic HR-CL images of adjoining facets.

Critical assessment on structural analysis of scalp hair using scanning electron microscope (SEM) and compound microscope

2020 ◽  
Vol 29 ◽  
pp. 244-249
Author(s):  
Cavalera Davis ◽  
Putri Nabihah Abdul Khofar ◽  
Umi Kalsum Abdul Karim ◽  
Reena Abd Rashid ◽  
Mohd Muzamir Mahat ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Structural Analysis ◽  
Scanning Electron Microscope ◽  
Scalp Hair ◽  
Critical Assessment ◽  
Scanning Electron

Shedding New Light on Cathodoluminescence—A Low Voltage Perspective

2012 ◽  
Vol 18 (6) ◽  
pp. 1246-1252
Author(s):  
Natasha Erdman ◽  
Charles Nielsen ◽  
Vernon E. Robertson
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Low Voltage ◽  
Beam Specimen ◽  
Interaction Volume ◽  
Industrial Grade ◽  
Recent Developments ◽  
Scanning Electron

AbstractPreviously, imaging and analysis with cathodoluminescence (CL) detectors required using high accelerating voltages. Utilization of lower accelerating voltage for microanalysis has the advantages of reduced beam-specimen interaction volume, and thus better spatial resolution, as well as reduction in electron beam induced damage. This article will highlight recent developments in field emission gun–scanning electron microscope technology that have allowed acquisition of high spatial resolution CL images at very low accelerating voltages. The advantages of low kV CL imaging will be shown using examples of a geological specimen (shale) and a specimen of an industrial grade diamond.

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