Accurate microcrystallography at high spatial resolution using electron back-scattering patterns in a field emission gun scanning electron microscope

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

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Comparison of freeze-fractured yeast replicas using conventional TEM and low-voltage field-emission SEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152343 ◽

1989 ◽

Vol 47 ◽

pp. 74-75

Author(s):

William P. Wergin ◽

Eric F. Erbe ◽

Terrence W. Reilly

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Field Emission ◽

Low Voltage ◽

Objective Lens ◽

Specimen Preparation ◽

Lens System ◽

Air Drying ◽

Preparation Techniques ◽

Scanning Electron

Although the first commercial scanning electron microscope (SEM) was introduced in 1965, the limited resolution and the lack of preparation techniques initially confined biological observations to relatively low magnification images showing anatomical surface features of samples that withstood the artifacts associated with air drying. As the design of instrumentation improved and the techniques for specimen preparation developed, the SEM allowed biologists to gain additional insights not only on the external features of samples but on the internal structure of tissues as well. By 1985, the resolution of the conventional SEM had reached 3 - 5 nm; however most biological samples still required a conductive coating of 20 - 30 nm that prevented investigators from approaching the level of information that was available with various TEM techniques. Recently, a new SEM design combined a condenser-objective lens system with a field emission electron source.

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Bacteriophage and Bacteriocin as Revealed by Field Emission Source Scanning Electron Microscope

Journal of Electron Microscopy ◽

10.1093/oxfordjournals.jmicro.a049937 ◽

1974 ◽

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Field Emission ◽

Emission Source ◽

Scanning Electron

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“Wien–type” Filtered Secondary Electron Imaging of Immunocytochemically Labeled Methacrylate Sections of Tissues in a Field Emission Scanning Electron Microscope (FESEM)

Microscopy and Microanalysis ◽

10.1017/s1431927605501338 ◽

2005 ◽

Vol 11 (S02) ◽

Cited By ~ 1

Author(s):

C A Ackerley ◽

A Tilups ◽

C Nielsen

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Field Emission ◽

Secondary Electron ◽

Electron Imaging ◽

Scanning Electron

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High-Spatial-Resolution Cathodoluminescence Measurement of InGaN

MRS Proceedings ◽

10.1557/proc-743-l3.52 ◽

2002 ◽

Vol 743 ◽

Author(s):

Hisashi Kanie ◽

Hiroaki Okado ◽

Takaya Yoshimura

Keyword(s):

Electron Microscope ◽

Energy Level ◽

Spatial Resolution ◽

Diffusion Length ◽

High Spatial Resolution ◽

Lower State ◽

Measuring Apparatus ◽

Bulk Crystals ◽

Recombination Centers ◽

Scanning Electron

ABSTRACTThis paper described observation of cathodoluminescence (CL) of microcrystalline InGaN bulk crystals under a scanning electron microscope (SEM) with a high-spatial-resolution (HR) CL measuring apparatus. HR-CL spectra from facets of InGaN crystals vary from facet to facet and are single peaked. Histogram analysis of the CL peak positions of HR spectra from the facets of the crystals in the area scanned during a low-resolution CL measurement shows a two-peaked form with comparable peak wavelengths. The diffusion length of a generated electron- ho le pair or an exciton from the recombination centers with a higher-energy-level state to that with a lower state is estimated to be 500 nm at the longest by the comparison of two monochromatic HR-CL images of adjoining facets.

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