High-Spatial-Resolution Cathodoluminescence Measurement of InGaN

2002 ◽  
Vol 743 ◽  
Author(s):  
Hisashi Kanie ◽  
Hiroaki Okado ◽  
Takaya Yoshimura
Keyword(s):  
Electron Microscope ◽  
Energy Level ◽  
Spatial Resolution ◽  
Diffusion Length ◽  
High Spatial Resolution ◽  
Lower State ◽  
Measuring Apparatus ◽  
Bulk Crystals ◽  
Recombination Centers ◽  
Scanning Electron

ABSTRACTThis paper described observation of cathodoluminescence (CL) of microcrystalline InGaN bulk crystals under a scanning electron microscope (SEM) with a high-spatial-resolution (HR) CL measuring apparatus. HR-CL spectra from facets of InGaN crystals vary from facet to facet and are single peaked. Histogram analysis of the CL peak positions of HR spectra from the facets of the crystals in the area scanned during a low-resolution CL measurement shows a two-peaked form with comparable peak wavelengths. The diffusion length of a generated electron- ho le pair or an exciton from the recombination centers with a higher-energy-level state to that with a lower state is estimated to be 500 nm at the longest by the comparison of two monochromatic HR-CL images of adjoining facets.

High Spatial Resolution Spin-Polarized Scanning Electron Microscope

1985 ◽  
Vol 24 (Part 2, No. 10) ◽  
pp. L833-L834 ◽  
Author(s):  
Kazuyuki Koike ◽  
Hideo Matsuyama ◽  
Hideo Todokoro ◽  
Kazunobu Hayakawa
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Spin Polarized ◽  
Scanning Electron

High spatial resolution scanning electron microscope: evaluation and structural analysis of nanostructured materials. Part 2

Analytics ◽  
2018 ◽  
Vol 8 (5) ◽  
pp. 448-456
Author(s):  
Osamu Terasaki ◽  
Yanhang Ma ◽  
Yuusuke Sakuda ◽  
Hideyuki Takahashi ◽  
Kenichi Tsutsumi ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Structural Analysis ◽  
Scanning Electron Microscope ◽  
Nanostructured Materials ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Scanning Electron

Shedding New Light on Cathodoluminescence—A Low Voltage Perspective

2012 ◽  
Vol 18 (6) ◽  
pp. 1246-1252
Author(s):  
Natasha Erdman ◽  
Charles Nielsen ◽  
Vernon E. Robertson
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Low Voltage ◽  
Beam Specimen ◽  
Interaction Volume ◽  
Industrial Grade ◽  
Recent Developments ◽  
Scanning Electron

AbstractPreviously, imaging and analysis with cathodoluminescence (CL) detectors required using high accelerating voltages. Utilization of lower accelerating voltage for microanalysis has the advantages of reduced beam-specimen interaction volume, and thus better spatial resolution, as well as reduction in electron beam induced damage. This article will highlight recent developments in field emission gun–scanning electron microscope technology that have allowed acquisition of high spatial resolution CL images at very low accelerating voltages. The advantages of low kV CL imaging will be shown using examples of a geological specimen (shale) and a specimen of an industrial grade diamond.

scholarly journals Enhanced method for High Spatial Resolution surface imaging and analysis of fungal spores using Scanning Electron Microscopy

2018 ◽  
Vol 8 (1) ◽  
Author(s):  
Gopal Venkatesh Babu ◽  
Palani Perumal ◽  
Sakthivel Muthu ◽  
Sridhar Pichai ◽  
Karthik Sankar Narayan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Fungal Spores ◽  
Surface Imaging ◽  
Scanning Electron

scholarly journals Spatial Resolutions of On-Axis and Off-Axis Transmission Kikuchi Diffraction Methods

2019 ◽  
Vol 9 (21) ◽  
pp. 4478 ◽  
Author(s):  
Yitian Shen ◽  
Jingchao Xu ◽  
Yongsheng Zhang ◽  
Yongzhe Wang ◽  
Jimei Zhang ◽  
...  
Keyword(s):  
Grain Size ◽  
Electron Microscope ◽  
Spatial Resolution ◽  
Correlation Coefficients ◽  
Sample Thickness ◽  
Phase Identification ◽  
Specimen Thickness ◽  
Key Factors ◽  
Orientation Microscopy ◽  
Scanning Electron

Spatial resolution is one of the key factors in orientation microscopy, as it determines the accuracy of grain size investigation and phase identification. We determined the spatial resolutions of on-axis and off-axis transmission Kikuchi diffraction (TKD) methods by calculating correlation coefficients using only the effective parts of on-axis and off-axis transmission Kikuchi patterns. During the calculation, we used average filtering to evaluate the spatial resolution more accurately. The spatial resolutions of both on-axis and off-axis TKD methods were determined in the same scanning electron microscope at different accelerating voltages and specimen thicknesses. The spatial resolution of the on-axis TKD was higher than that of the off-axis TKD at the same parameters. Furthermore, with an increase in accelerating voltage or a decrease in specimen thickness, the spatial resolutions of the two configurations could be significantly improved, from tens of nanometers to below 10 nm. At a voltage of 30 kV and sample thickness of 74 nm, both on-axis and off-axis TKD methods exhibited the highest resolutions of 6.2 and 9.7 nm, respectively.

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