Unified Physical Concept of Friction and Wear of Rubber Part 5: Dynamics of Initiation and Propagation of Abrasion Pattern in Wear of Rubber

2021 ◽  
Vol 94 (5) ◽  
pp. 158-165
Author(s):  
Yoshihide FUKAHORI
2002 ◽  
Vol 75 (1) ◽  
pp. 29-48 ◽  
Author(s):  
David P. Gerrard ◽  
Joe Padovan

Abstract In Part 1, results of an experimental and analytical study are offered which examined the effects of a dynamically changing slip direction on a rubber surface's friction and wear performance and on the properties of an industrial abrasive. For a filled SBR compound, it was found that a dynamically changing slip direction had a small effect on the friction/traction performance, but a substantial beneficial effect on the surface's wear performance. The abrasive's ability to generate wear was found to be strongly dependent on the accumulation of side slip over the life of the abrasive. Conceptualization of the Damage Orientation Distribution Function is offered to describe the statistical nature of the oriented damage generated on a slipping rubber surface. The experimental results are shown to be in excellent agreement with model predictions based on several simple assumptions regarding the effects that changing slip orientation has on the response of the Distribution Function.


Author(s):  
D.I. Potter ◽  
M. Ahmed ◽  
K. Ruffing

Ion implantation, used extensively for the past decade in fabricating semiconductor devices, now provides a unique means for altering the near-surface chemical compositions and microstructures of metals. These alterations often significantly improve physical properties that depend on the surface of the material; for example, catalysis, corrosion, oxidation, hardness, friction and wear. Frequently the mechanisms causing these beneficial alterations and property changes remain obscure and much of the current research in the area of ion implantation metallurgy is aimed at identifying such mechanisms. Investigators thus confront two immediate questions: To what extent is the chemical composition changed by implantation? What is the resulting microstructure? These two questions can be investigated very fruitfully with analytical electron microscopy (AEM), as described below.


2002 ◽  
Vol 719 ◽  
Author(s):  
Myoung-Woon Moon ◽  
Kyang-Ryel Lee ◽  
Jin-Won Chung ◽  
Kyu Hwan Oh

AbstractThe role of imperfections on the initiation and propagation of interface delaminations in compressed thin films has been analyzed using experiments with diamond-like carbon (DLC) films deposited onto glass substrates. The surface topologies and interface separations have been characterized by using the Atomic Force Microscope (AFM) and the Focused Ion Beam (FIB) imaging system. The lengths and amplitudes of numerous imperfections have been measured by AFM and the interface separations characterized on cross sections made with the FIB. Chemical analysis of several sites, performed using Auger Electron Spectroscopy (AES), has revealed the origin of the imperfections. The incidence of buckles has been correlated with the imperfection length.


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