Detecting Momentary Shadows from Visible and Thermal Image Pair

Author(s):  
Kazuya Fujita ◽  
Ryo Matsuoka ◽  
Takahiro Okabe
Keyword(s):  
2021 ◽  
Author(s):  
Danick Panchard ◽  
François Marelli ◽  
Edouard De Moura Presa ◽  
Peter Wellig ◽  
Michael Liebling

Author(s):  
M. Palaniappan ◽  
V. Ng ◽  
R. Heiderhoff ◽  
J.C.H. Phang ◽  
G.B.M. Fiege ◽  
...  

Abstract Light emission and heat generation of Si devices have become important in understanding physical phenomena in device degradation and breakdown mechanisms. This paper correlates the photon emission with the temperature distribution of a short channel nMOSFET. Investigations have been carried out to localize and characterize the hot spots using a spectroscopic photon emission microscope and a scanning thermal microscope. Frontside investigations have been carried out and are compared and discussed with backside investigations. A method has been developed to register the backside thermal image with the backside illuminated image.


Clinical Pain ◽  
2019 ◽  
Vol 18 (2) ◽  
pp. 70-75
Author(s):  
Jihyun Park ◽  
Jang Woo Lee ◽  
Sang Eok Lee ◽  
Byung Hee Kim ◽  
Dougho Park

Author(s):  
S. W. Kwon ◽  
I. S. Song ◽  
S. W. Lee ◽  
J. S. Lee ◽  
J. H. Kim ◽  
...  

1974 ◽  
Vol 10 (22) ◽  
pp. 452 ◽  
Author(s):  
H.A.H. Boot ◽  
J.G. Castledine
Keyword(s):  

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