36.6 dB/mm Extinction Ratio in TE Mode Semiconductor Optical Isolators with Co

Author(s):  
Reo Oshikiri ◽  
Yuka Kobayashi ◽  
Satoshi Nishiyama ◽  
Hromasa Shimizu
2014 ◽  
Vol 53 (7) ◽  
pp. 072701
Author(s):  
Hiromasa Shimizu ◽  
Shohei Sakanishi ◽  
Takahiro Bando ◽  
Yuhi Yagi
Keyword(s):  
Te Mode ◽  

2004 ◽  
Vol 834 ◽  
Author(s):  
Hiromasa Shimizu ◽  
Yoshiaki Nakano

ABSTRACTWe have fabricated a TE mode InGaAsP active waveguide optical isolator based on the nonreciprocal loss shift in an optical fiber telecommunication wavelength of 1550nm. We demonstrated a TE mode nonreciprocal loss shift of 9.3dB/mm under a magnetic field of +/-1kG in the facricated InGaAsP active waveguide with Fe on an InP substrate at a wavelength of 1560nm. This result opens a way to the monolithic integration of semiconductor-waveguide-type optical isolators with edge emitting semiconductor lasers.


2017 ◽  
Vol 29 (7) ◽  
pp. 559-562 ◽  
Author(s):  
V. K. Sharma ◽  
Divya Madaan ◽  
A. Kapoor

Author(s):  
Tanmay Bhowmik ◽  
Debabrata Sikdar

Abstract Electro–optical modulation, where a radio frequency signal can be encoded in an optical field, is crucial to decide the overall performance of an integrated photonics system. Due to the growing internet penetration rate worldwide, polarization-division-multiplexing (PDM) technique has emerged to increase the link capacity, where polarization-independent modulators are desirable to reduce system complexity. In this study, we propose a novel parallel directional coupler based dual-polarization electro-absorption modulator based on epsilon-near-zero (ENZ) material. The proposed design is capable of independent and synchronized modulation of two fundamental modes viz. transverse magnetic (TM) and transverse electric (TE) mode of a standard silicon rib waveguide. Indium-tin-oxide (ITO)–Silicon based two parallel hybrid plasmonic waveguides (HPW1 and HPW2) are placed such that fundamental TM (TE) mode of the input bus waveguide can be coupled to HPW1 (HPW2). The ENZ-state of ITO, acquired upon two independent electrical gating, enables large modulation depth by utilizing enhancement of electric field at the absorptive carrier accumulation layer. With a 27 μm active length, the extinction ratio (ER) of the proposed design is 10.11 dB (9.66 dB) for TM (TE) modulation at 1550 nm wavelength. This results in a 0.45 dB ER-discrepancy and indicates the polarization-insensitive nature of the modulator. The insertion losses and modulation bandwidths of our design are less than 1 dB and more than 100 GHz, respectively, for both polarizations over the entire C-band of wavelength. The proposed design can find potential applications in the PDM-enabled integrated photonics systems and high speed optical interconnections at data center networks.


2021 ◽  
Author(s):  
Keyvan Ahmadi ◽  
Mohamad Hossein Poorghadiri Isfahani ◽  
Mohamad Hossein Fathi

Abstract In this work the design, fabrication and characterization of a TE-pass plasmonic waveguide polarizer on Ti in-diffused channel waveguide fabricated on x-cut LiNbO3 substrate are reported. By deposition of MgF2 of 5nm thickness as the buffer layer and Au layer of about 30nm thickness as the cladding layer the polarization extinction ratio measured to be 32dB and insertion loss for TE mode was about 2dB in a single mode channel waveguide of 2.1cm length.


2020 ◽  
Vol 10 (4) ◽  
pp. 369-380
Author(s):  
K. Maji ◽  
K. Mukherjee ◽  
A. Raja

All optical tri-state frequency encoded logic gates NOT and NAND are proposed and numerically investigated using TOAD based interferometric switch for the first time to the best of our knowledge. The optical power spectrum, extinction ratio, contrast ration, and amplified spontaneous noise are calculated to analyze and confirm practical feasibility of the gates. The proposed device works for low switching energy and has high contrast and extinction ratio as indicated in this work.


2020 ◽  
Vol 0 (0) ◽  
Author(s):  
Jesuwanth Sugesh Ramesh Gabriel ◽  
Sivasubramanian Arunagiri

AbstractIn this paper, we report the performance of a carrier depletion Silicon PIN phase shifter with over layer of 130 nm. It is observed that an optimum intrinsic gap of 250 nm for a device length of 5 mm at 2 V, resulted in Extinction Ratio (ER) of 23.41 dB and Bit Error Rate (BER) of 1.00 × 10−7 is obtained for 50 Gbps. The phase shifter is also designed for length 2 mm with an intrinsic gap of 100 nm at an operating voltage <4 V. The study also reveals that the proposed design for Mach-Zehnder modulator operating at a data rate of 100 Gbps for the concentration of P = 7 × 1017 cm−3 and N = 5 × 1017 cm−3 gives better BER and phase performance. The proposed design was also analysed in an intra-data centre communication setup of fibre length 15 km.


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