scholarly journals Time-Resolved X-Ray Stress Analysis by Single Exposure Technique during Cyclic Loading.

1991 ◽  
Vol 40 (454) ◽  
pp. 825-831 ◽  
Author(s):  
Shin-ichi OHYA ◽  
Shozaburo OHTA ◽  
Ken-ichi HASEGAWA ◽  
Shigekazu MISONO
Keyword(s):  
Cyclic Loading ◽  
Stress Analysis ◽  
Single Exposure ◽  
Time Resolved ◽  
X Ray ◽  
Exposure Technique

scholarly journals Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection

2014 ◽  
Vol 996 ◽  
pp. 878-883
Author(s):  
Raphaëlle Guillou ◽  
Pierre-Olivier Renault ◽  
Eric Le Bourhis ◽  
Philippe Goudeau ◽  
Pierre Godard ◽  
...  
Keyword(s):  
Stress State ◽  
Mechanical Behavior ◽  
Stress Analysis ◽  
Biaxial Loading ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Multiphase Materials ◽  
Residual Stress State ◽  
Multilayered Thin Films

Synchrotron X-ray diffraction is a powerful tool to analyse the mechanical behavior of multiphase materials due to its selectivity. Simultaneous stress analysis of both phases of a W/Cu thin multilayer has been performed during a continuous biaxial loading on DiffAbs beamline at SOLEIL synchrotron (France). The use of a 2D detector with a large sample-detector distance is shown to give relatively accurate applied stress analysis even if only a small part of the usual ψ range of the sin2ψ method is considered. The results show the failure of the thin film multilayer while the W components are still under a strong compressive stress state of-3 GPa. It is concluded that the mechanical behavior is in fact mainly governed by the residual stress state.

X-Ray Stress Measurement by the Single-Exposure Technique

1967 ◽  
Vol 11 ◽  
pp. 401-410 ◽  
Author(s):  
John T. Norton
Keyword(s):  
Stress Measurement ◽  
Practical Method ◽  
Least Square ◽  
Single Exposure ◽  
X Ray ◽  
Tension And Compression ◽  
Diffraction Patterns ◽  
Time Required ◽  
Exposure Technique

AbstractX-ray techniques employing film recording continue to play an important role in the routine determination of residual stresses in metals, particularly where heavy and bulky specimens are involved. The single-exposure technique in which the two diffraction patterns required are obtained simultaneously in a single X-ray exposure has several practical advantages over the more conventional two-exposure technique for many routine applications. Details of the method are discussed and an analysis is made of the factors influencing the reliability of the stress determination. An apparatus for stress measurement having some unique features is described and a practical application presented, illustrating the use of the single-exposure technique for the determination of the stress constant of a specimen of hardened steel. The specimen was subjected to a series of known stresses in bending, both in tension and compression. The measured diffraction-line displacements were plotted against the applied stress, and a line was fitted to the points by a least-squares calculation. From its slope, the stress constant was determined. The standard deviation of individual stress determinations from the “true” values given by the least-square line was calculated and was in excellent agreement with the value calculated from the errors of measurement. It is concluded that the single-exposure technique with its reduced time required for measurement and less demanding requirement of precise instrumental adjustment provides a reliable and practical method for many routine stress measurement applications.

scholarly journals Time-resolved X-ray stress measurement by PSPC method during cyclic loading.

1989 ◽  
Vol 38 (430) ◽  
pp. 847-853
Author(s):  
Shin'ichi OHYA ◽  
Shozaburo OHTA
Keyword(s):  
Cyclic Loading ◽  
Stress Measurement ◽  
Time Resolved ◽  
X Ray

Time-Resolved X-ray Stress Measurement During Cyclic Loading

1989 ◽  
Vol 33 ◽  
pp. 335-340
Author(s):  
Shin'ichi Ohya ◽  
Shozaburo Ohta
Keyword(s):  
Residual Stress ◽  
Cyclic Loading ◽  
Static Loading ◽  
Stress Measurement ◽  
Fatigue Behavior ◽  
Residual Stress Distribution ◽  
X Rays ◽  
Time Resolved ◽  
X Ray ◽  
Actual Stress

X-ray stress analysis is widely used in the measurement of residual stress or stress under static loading. If it is possible to measure actual stress at any applied stress level during cyclic loading by using x-rays, it will be of much help in investigating dynamical fatigue behavior such as crack closure and change of residual stress distribution.

Time-Resolved X-Ray Stress Measurement During Cyclic Loading

1990 ◽  
pp. 335-340
Author(s):  
Shin’ichi Ohya ◽  
Shozaburo Ohta
Keyword(s):  
Cyclic Loading ◽  
Stress Measurement ◽  
Time Resolved ◽  
X Ray

Sub-nanosecond X-ray powder diffraction

1990 ◽  
Vol 23 (5) ◽  
pp. 441-443 ◽  
Author(s):  
N. C. Woolsey ◽  
J. S. Wark ◽  
D. Riley
Keyword(s):  
Powder Diffraction ◽  
Laser Light ◽  
Polycrystalline Materials ◽  
Spectral Brightness ◽  
X Rays ◽  
Single Exposure ◽  
Time Resolved ◽  
X Ray ◽  
Titanium Target ◽  
Diffraction Patterns

The X-rays emitted from a laser-produced plasma have been used to obtain powder diffraction patterns with exposures of less than a nanosecond. The X-rays were produced by focusing approximately 50 J of 0.53 μm laser light in a 600 ps (FWHM) pulse to a tight (~100 μm diameter) spot on a solid titanium target. The spectral brightness of the resonance line of the helium-like titanium thus produced was sufficient to record diffraction from LiF powder in a single exposure using the Seemann–Bohlin geometry. These results indicate that time-resolved measurements of the lattice parameters of polycrystalline materials can be made with sub-nanosecond temporal resolution.

Microtubule nucleation sequence studied by time-resolved x-ray scattering and electron microscopy

1983 ◽  
Vol 41 ◽  
pp. 766-767
Author(s):  
Eva-Maria Mandelkow ◽  
Eckhard Mandelkow ◽  
Joan Bordas
Keyword(s):  
Electron Microscopy ◽  
Dynamic Equilibrium ◽  
Time Resolved ◽  
X Ray ◽  
Additional Information ◽  
X Ray Scattering ◽  
Low Concentrations ◽  
Microtubule Growth ◽  
Ray Patterns ◽  
Ray Scattering

When a solution of microtubule protein is changed from non-polymerising to polymerising conditions (e.g. by temperature jump or mixing with GTP) there is a series of structural transitions preceding microtubule growth. These have been detected by time-resolved X-ray scattering using synchrotron radiation, and they may be classified into pre-nucleation and nucleation events. X-ray patterns are good indicators for the average behavior of the particles in solution, but they are difficult to interpret unless additional information on their structure is available. We therefore studied the assembly process by electron microscopy under conditions approaching those of the X-ray experiment. There are two difficulties in the EM approach: One is that the particles important for assembly are usually small and not very regular and therefore tend to be overlooked. Secondly EM specimens require low concentrations which favor disassembly of the particles one wants to observe since there is a dynamic equilibrium between polymers and subunits.

Time-Resolved Cryo-Electron Microscopy of Oscillating Microtubules

1990 ◽  
Vol 48 (1) ◽  
pp. 502-503
Author(s):  
Eva-Maria Mandelkow ◽  
Ron Milligan
Keyword(s):  
Electron Microscopy ◽  
Dynamic Instability ◽  
Entire Solution ◽  
Reaction Scheme ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
A Chain ◽  
Ray Scattering

Microtubules form part of the cytoskeleton of eukaryotic cells. They are hollow libers of about 25 nm diameter made up of 13 protofilaments, each of which consists of a chain of heterodimers of α-and β-tubulin. Microtubules can be assembled in vitro at 37°C in the presence of GTP which is hydrolyzed during the reaction, and they are disassembled at 4°C. In contrast to most other polymers microtubules show the behavior of “dynamic instability”, i.e. they can switch between phases of growth and phases of shrinkage, even at an overall steady state [1]. In certain conditions an entire solution can be synchronized, leading to autonomous oscillations in the degree of assembly which can be observed by X-ray scattering (Fig. 1), light scattering, or electron microscopy [2-5]. In addition such solutions are capable of generating spontaneous spatial patterns [6].In an earlier study we have analyzed the structure of microtubules and their cold-induced disassembly by cryo-EM [7]. One result was that disassembly takes place by loss of protofilament fragments (tubulin oligomers) which fray apart at the microtubule ends. We also looked at microtubule oscillations by time-resolved X-ray scattering and proposed a reaction scheme [4] which involves a cyclic interconversion of tubulin, microtubules, and oligomers (Fig. 2). The present study was undertaken to answer two questions: (a) What is the nature of the oscillations as seen by time-resolved cryo-EM? (b) Do microtubules disassemble by fraying protofilament fragments during oscillations at 37°C?

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