scholarly journals X-Ray Stress Measurement of Nickel-Base Single Crystal Superalloy Using Two-Dimensional PSPC

2007 ◽  
Vol 56 (7) ◽  
pp. 594-601 ◽  
Author(s):  
Shutarou MACHIYA ◽  
Keisuke TANAKA ◽  
Yoshiaki AKINIWA
2006 ◽  
Vol 522-523 ◽  
pp. 293-300
Author(s):  
Ying Na Wu ◽  
Aya S. Suzuki ◽  
Hideyuki Murakami ◽  
Seiji Kuroda

In the present study, platinum-iridium alloys (Ir = 15.8, 27.3, 36.1, 100at.%) were electroplated on a nickel-base single crystal superalloy TMS-82+ followed by a diffusion treatment at 1373K for 1 h. Interdiffusion behavior between the Pt-Ir films and substrates was investigated in terms of chemical composition, phase constitution and morphology. X-ray analysis revealed that annealed specimens consisted of several fcc solid solutioned phases with various lattice parameters, together with ordered intermetallic compounds (L12-(Pt,Ni)3Al and B2-(Ir,Ni)Al), due to the inward diffusion of Pt and Ir from the electrodeposited films to the superalloy substrates, and the outward diffusion of solute elements (Ni, Al, Cr, Co) in the superalloy substrates into the films during annealing. The depth concentration analysis indicated that the Pt-36.1Ir film effectively retarded the outward diffusion of solute elements, especially nickel, from the substrate.


2021 ◽  
pp. 109737
Author(s):  
Hai-Qing Pei ◽  
Meng Li ◽  
Ping Wang ◽  
Xiao-Hu Yao ◽  
Zhi-Xun Wen ◽  
...  

2021 ◽  
pp. 111180
Author(s):  
Keli Liu ◽  
Junsheng Wang ◽  
Bing Wang ◽  
Pengcheng Mao ◽  
Yanhong Yang ◽  
...  

2007 ◽  
Vol 539-543 ◽  
pp. 3059-3063 ◽  
Author(s):  
G. Schumacher ◽  
N. Darowski ◽  
I. Zizak ◽  
Hellmuth Klingelhöffer ◽  
W. Chen ◽  
...  

The profiles of 001 and 002 reflections have been measured at 1173 K as a function of time by means of X-ray diffraction (XRD) on tensile-creep deformed specimens of single crystal superalloy SC16. Decrease in line width (full width at half maximum: FWHM) by about 7 % and increase in peak position by about 3x10-4 degrees was detected after 8.5x104 s. Broadening of the 002 peak profile indicated a more negative value of the lattice misfit after the same time period. The results are discussed in the context of the anisotropic arrangement of dislocations at the γ/γ’ interfaces during creep and their rearrangement during the thermal treatment at 1173 K.


2015 ◽  
Vol 636 ◽  
pp. 608-612 ◽  
Author(s):  
Xinhong Xiong ◽  
Dunmiao Quan ◽  
Pengdan Dai ◽  
Zhiping Wang ◽  
Qiaoxin Zhang ◽  
...  

Author(s):  
Piao Li ◽  
Wen Jiang ◽  
Shao-Shi Rui ◽  
Wei-xing Yao ◽  
Hui-ji Shi ◽  
...  

2015 ◽  
Vol 750 ◽  
pp. 139-144 ◽  
Author(s):  
De Long Shu ◽  
Su Gui Tian ◽  
Xin Ding ◽  
Jing Wu ◽  
Qiu Yang Li ◽  
...  

By means of heat treatment and creep property measurement, an investigation has made into the creep behaviors of a containing 4.5% Re nickel-base single crystal superalloy at high temperature. Results show that the elements W, Mo and Re are enriched in the dendrite arm regions, the elements Al, Ta, Cr and Co are enriched in the inter-dendrite region, and the segregation extent of the elements may be obviously reduced by means of heat treatment at high temperature. In the temperature ranges of 1070--1100 °C, the 4.5% Re single crystal nickel-based superallloy displays a better creep resistance and longer creep life. The deformation mechanism of the alloy during steady state creep is dislocations slipping in the γ matrix and climbing over the rafted γ′ phase. In the later stage of creep, the deformation mechanism of alloy is dislocations slipping in the γ matrix, and shearing into the rafted γ′ phase, which may promote the initiation and propagation of the micro-cracks at the interfaces of γ/γ′ phases up to the occurrence of creep fracture.


2005 ◽  
Vol 38 (4) ◽  
pp. 678-684 ◽  
Author(s):  
Balder Ortner

A method for the X-ray determination of lattice-plane distances is given. Similar to Bond's method, it is based on the measurement of rocking curves, with some advantages and disadvantages compared with the former method. The new method is especially designed for single-crystal stress measurement. Its usefulness is demonstrated in two examples of lattice-constant and stress measurement.


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