Measurement of Local Electrical Conductivity by Four-Point Probe Atomic Force Microscope Technique

2007 ◽  
Vol 56 (10) ◽  
pp. 896-899
Author(s):  
Yang JU ◽  
Masumi SAKA
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscope ◽  
Atomic Force ◽  
Microscope Technique

Measurement of the loss tangent of a thin polymeric film using the atomic force microscope

2004 ◽  
Vol 19 (1) ◽  
pp. 387-395 ◽  
Author(s):  
P.M. McGuiggan ◽  
D.J. Yarusso
Keyword(s):  
Atomic Force Microscope ◽  
Loss Tangent ◽  
Oscillation Amplitude ◽  
Polymer Surface ◽  
Pressure Sensitive Adhesive ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Measurement ◽  
Microscope Technique ◽  
Tan Δ

An atomic force microscope was used to measure the loss tangent, tan δ, of a pressure-sensitive adhesive transfer tape as a function of frequency (0.01 to 10 Hz). For the measurement, the sample was oscillated normal to the surface and the response of the cantilever resting on the polymer surface (as measured via the photodiode) was monitored. Both oscillation amplitude and phase were recorded as a function of frequency. The atomic force microscopy measurement gave the same frequency dependence of tan δ as that measured by a dynamic shear rheometer on a film 20 times thicker. The results demonstrate that the atomic force microscope technique can quantitatively measure rheological properties of soft thin polymeric films.

Imaging of a soft, weakly adsorbing, living cell with a colloid probe tapping atomic force microscope technique

2006 ◽  
Vol 47 (1) ◽  
pp. 85-89 ◽  
Author(s):  
Cathy E. McNamee ◽  
Nayoung Pyo ◽  
Saaya Tanaka ◽  
Yoichi Kanda ◽  
Ko Higashitani
Keyword(s):  
Atomic Force Microscope ◽  
Living Cell ◽  
Atomic Force ◽  
Microscope Technique
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