Measurement of the loss tangent of a thin polymeric film using the atomic force microscope

2004 ◽  
Vol 19 (1) ◽  
pp. 387-395 ◽  
Author(s):  
P.M. McGuiggan ◽  
D.J. Yarusso
Keyword(s):  
Atomic Force Microscope ◽  
Loss Tangent ◽  
Oscillation Amplitude ◽  
Polymer Surface ◽  
Pressure Sensitive Adhesive ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Measurement ◽  
Microscope Technique ◽  
Tan Δ

An atomic force microscope was used to measure the loss tangent, tan δ, of a pressure-sensitive adhesive transfer tape as a function of frequency (0.01 to 10 Hz). For the measurement, the sample was oscillated normal to the surface and the response of the cantilever resting on the polymer surface (as measured via the photodiode) was monitored. Both oscillation amplitude and phase were recorded as a function of frequency. The atomic force microscopy measurement gave the same frequency dependence of tan δ as that measured by a dynamic shear rheometer on a film 20 times thicker. The results demonstrate that the atomic force microscope technique can quantitatively measure rheological properties of soft thin polymeric films.

scholarly journals Effect of Eigenmode Frequency on Loss Tangent Atomic Force Microscopy Measurements

2021 ◽  
Vol 11 (15) ◽  
pp. 6813
Author(s):  
Babak Eslami ◽  
Dylan Caputo
Keyword(s):  
Atomic Force Microscopy ◽  
Loss Tangent ◽  
Oscillation Amplitude ◽  
Excitation Frequency ◽  
Chemical Properties ◽  
Sample Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Tip Radius

Atomic Force Microscopy (AFM) is no longer used as a nanotechnology tool responsible for topography imaging. However, it is widely used in different fields to measure various types of material properties, such as mechanical, electrical, magnetic, or chemical properties. One of the recently developed characterization techniques is known as loss tangent. In loss tangent AFM, the AFM cantilever is excited, similar to amplitude modulation AFM (also known as tapping mode); however, the observable aspects are used to extract dissipative and conservative energies per cycle of oscillation. The ratio of dissipation to stored energy is defined as tanδ. This value can provide useful information about the sample under study, such as how viscoelastic or elastic the material is. One of the main advantages of the technique is the fact that it can be carried out by any AFM equipped with basic dynamic AFM characterization. However, this technique lacks some important experimental guidelines. Although there have been many studies in the past years on the effect of oscillation amplitude, tip radius, or environmental factors during the loss tangent measurements, there is still a need to investigate the effect of excitation frequency during measurements. In this paper, we studied four different sets of samples, performing loss tangent measurements with both first and second eigenmode frequencies. It is found that performing these measurements with higher eigenmode is advantageous, minimizing the tip penetration through the surface and therefore minimizing the error in loss tangent measurements due to humidity or artificial dissipations that are not dependent on the actual sample surface.

Wrinkling Poly(trimethylene 2,5-Furanoate) Free-standing Films: Nanostructure Formation and Physical Properties

2020 ◽  
Author(s):  
Michelina Soccio ◽  
Nadia Lotti ◽  
Andrea Munari ◽  
Esther Rebollar ◽  
Daniel E Martínez-Tong
Keyword(s):  
Irradiation Time ◽  
Polymer Surface ◽  
Laser Source ◽  
Free Standing ◽  
Force Microscopy ◽  
Nanostructure Formation ◽  
Physicochemical Changes ◽  
Angle Measurements ◽  
Atomic Force ◽  
Contact Angle Measurements

<p>Nanostructured wrinkles were developed on fully bio-based poly(trimethylene furanoate) (PTF) films by using the technique of Laser Induced Periodic Surface Structures (LIPSS). We investigated the effect of irradiation time on wrinkle formation using an UV pulsed laser source, at a fluence of 8 mJ/cm2. It was found that the pulse range between 600 and 4800 pulses allowed formation of periodic nanometric ripples. The nanostructured surface was studied using a combined macro- and nanoscale approach. We evaluated possible physicochemical changes taking place on the polymer surface after irradiation by infrared spectroscopy, contact angle measurements and atomic force microscopy. The macroscopic physicochemical properties of PTF showed almost no changes after nanostructure formation, differently from the results previously found for the terephthalic counterparts, as poly(ethyleneterephthalate), PET, and poly(trimethyleneterephthalate), PTT. The surface mechanical properties of the nanostructured PTF were found to be improved, as evidenced by nanomechanical force spectroscopy measurements. In particular, an increased Young’s modulus and higher stiffness for the nanostructured sample were measured. <br></p>

Sensor Egregium – An Atomic Force Microscope Sensor for Continuously Variable Resonance Amplification

2021 ◽  
pp. 1-23
Author(s):  
Rafiul Shihab ◽  
Tasmirul Jalil ◽  
Burak Gulsacan ◽  
Matteo Aureli ◽  
Ryan Tung
Keyword(s):  
Finite Element Analysis ◽  
Atomic Force Microscope ◽  
Natural Frequencies ◽  
Proof Of Concept ◽  
Element Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Wide Range ◽  
Curve Veering ◽  
Dynamic Phenomena

Abstract Numerous nanometrology techniques concerned with probing a wide range of frequency dependent properties would benefit from a cantilevered sensor with tunable natural frequencies. In this work, we propose a method to arbitrarily tune the stiffness and natural frequencies of a microplate sensor for atomic force microscope applications, thereby allowing resonance amplification at a broad range of frequencies. This method is predicated on the principle of curvature-based stiffening. A macroscale experiment is conducted to verify the feasibility of the method. Next, a microscale finite element analysis is conducted on a proof-of-concept device. We show that both the stiffness and various natural frequencies of the device can be highly controlled through applied transverse curvature. Dynamic phenomena encountered in the method, such as eigenvalue curve veering, are discussed and methods are presented to accommodate these phenomena. We believe that this study will facilitate the development of future curvature-based microscale sensors for atomic force microscopy applications.

Review of Polymer Surface Modification Method

2016 ◽  
Vol 852 ◽  
pp. 626-631 ◽  
Author(s):  
Li Yuan Yu ◽  
Bo Zhu ◽  
Xun Cai ◽  
Yong Wei Wang ◽  
Rong Huan Han ◽  
...  
Keyword(s):  
Surface Modification ◽  
Polymer Surface ◽  
Processing Method ◽  
Surface Grafting ◽  
Atomic Force Microscopy Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Irradiation Treatment ◽  
Modification Method ◽  
Polymer Surface Modification

This paper reviewed a variety of methods of polymer surface modification, which mainly includes Solution processing method, Plasma treatment，Surface grafting method，Irradiation treatment and method of Atomic force microscopy probe shock , and the specific polymer material combined with the modification method and its modification mechanism was introduced in detail.Polymer has very extensive application both in chemical fields and in daily life, but due to its poor surface hydrophilicity and wear resistance, the further application of polymer materials were limited. In order to improve its surface properties, modification are needed on the surface of the polymer. Polymer surface modification means to operate on the surface of polymer within the scope of nanometer level, and give some new properties on material surface, such as hydrophilicity, scratch resistance, under the premise of without affecting the material ontic properties.There are many methods of polymer surface modification. This paper reviewed Solution processing method, Plasma treatment，Surface grafting method，Irradiation treatment and method of Atomic force microscopy probe shock . Different methods of modification combined with specific materials are introduced as follow.

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