Investigation of borophosphosilicate glass roughness and planarization with the atomic force microscope technique

1999 ◽  
Vol 352 (1-2) ◽  
pp. 77-84 ◽  
Author(s):  
S.K Tang ◽  
V.Y Vassiliev ◽  
S Mridha ◽  
L.H Chan
Keyword(s):  
Atomic Force Microscope ◽  
Atomic Force ◽  
Microscope Technique ◽  
Borophosphosilicate Glass

Measurement of the loss tangent of a thin polymeric film using the atomic force microscope

2004 ◽  
Vol 19 (1) ◽  
pp. 387-395 ◽  
Author(s):  
P.M. McGuiggan ◽  
D.J. Yarusso
Keyword(s):  
Atomic Force Microscope ◽  
Loss Tangent ◽  
Oscillation Amplitude ◽  
Polymer Surface ◽  
Pressure Sensitive Adhesive ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Measurement ◽  
Microscope Technique ◽  
Tan Δ

An atomic force microscope was used to measure the loss tangent, tan δ, of a pressure-sensitive adhesive transfer tape as a function of frequency (0.01 to 10 Hz). For the measurement, the sample was oscillated normal to the surface and the response of the cantilever resting on the polymer surface (as measured via the photodiode) was monitored. Both oscillation amplitude and phase were recorded as a function of frequency. The atomic force microscopy measurement gave the same frequency dependence of tan δ as that measured by a dynamic shear rheometer on a film 20 times thicker. The results demonstrate that the atomic force microscope technique can quantitatively measure rheological properties of soft thin polymeric films.

Imaging of a soft, weakly adsorbing, living cell with a colloid probe tapping atomic force microscope technique

2006 ◽  
Vol 47 (1) ◽  
pp. 85-89 ◽  
Author(s):  
Cathy E. McNamee ◽  
Nayoung Pyo ◽  
Saaya Tanaka ◽  
Yoichi Kanda ◽  
Ko Higashitani
Keyword(s):  
Atomic Force Microscope ◽  
Living Cell ◽  
Atomic Force ◽  
Microscope Technique

Formation of Metallic Micro/Nanomaterials by Utilizing Migration Phenomena and Techniques for their Applications

2009 ◽  
Vol 614 ◽  
pp. 3-9 ◽  
Author(s):  
Masumi Saka ◽  
Hironori Tohmyoh ◽  
M. Muraoka ◽  
Yang Ju ◽  
K. Sasagawa
Keyword(s):  
Electrical Properties ◽  
Atomic Force Microscope ◽  
Joule Heating ◽  
The Other ◽  
Acoustic Microscopy ◽  
Concentrated Mass ◽  
Cu Nanowires ◽  
Mechanical And Electrical Properties ◽  
Atomic Force ◽  
Microscope Technique

Migration of atoms is presented to be utilized for fabrication of metallic micro/nanomaterials by controlling the phenomenon. Two kinds of migration phenomena are treated; one is electromigration and the other is stress migration. In addition to the formation of micro/nanomaterials, some achievements in enhancing their functions are demonstrated. One is a technique to fabricate nanocoils from the formed Cu nanowires. The others are techniques to weld or cut the micro/nanowires by using Joule heating. Finally, regarding evaluation of mechanical and electrical properties of the micro/nanomaterials, the concentrated-mass cantilever technique in atomic force acoustic microscopy and the four-point atomic force microscope technique are shown to be powerful tools, respectively.

Self-organized InGaAs quantum dots grown on GaAs (311)B substrate studied by conductive atomic force microscope technique

2002 ◽  
Vol 245 (3-4) ◽  
pp. 212-218 ◽  
Author(s):  
Yoshitaka Okada ◽  
Masashi Miyagi ◽  
Kouichi Akahane ◽  
Mitsuo Kawabe ◽  
Hidemi Shigekawa
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscope ◽  
Self Organized ◽  
Atomic Force ◽  
Microscope Technique

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

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