scholarly journals Evaluation of Ductile Damage in Aluminum Single Crystal with Prior Activity of Single Slip System under Tensile Loading

2014 ◽  
Vol 63 (7) ◽  
pp. 533-538
Author(s):  
Jun-ichi SHIBANO ◽  
Kentaro KAJIWARA ◽  
Takuya TSUKAMOTO ◽  
Hirokazu KAWAI ◽  
Setsuo MIURA ◽  
...  
2014 ◽  
Vol 777 ◽  
pp. 176-181 ◽  
Author(s):  
Junichi Shibano ◽  
Kentaro Kajiwara ◽  
T. Tsukamoto ◽  
H. Kawai ◽  
Setsuo Miura ◽  
...  

A ductile damage progress of an aluminum single crystal with the prior activity of the single slip system under tensile loading was verified by a profile analysis using white X-ray obtained in BL28B2 beam line of SPring-8. In this study, the aluminum single crystal of the purity 6N was used as a specimen prepared in I-type geometry for tensile test. A notch was introduced into one side of the center of a parallel part of the specimen by the wire electric discharge machining. White X-ray beam, which has 50 μm in both height and width, was incident into the specimen on the Bragg angle θ of 3 degrees using energy dispersive X-ray diffraction technique. The specimen was deformed by elongation in the direction of 45°to [11 and [11 crystal orientations, respectively, and a diffraction profile of the white X-ray from Al220 plane was analyzed. In profile analysis, an instrumental function was defined in consideration both of a divergence by a slit and a response function peculiar to the energy dispersive method. The Gauss component of integral breadth related to non-uniform strain and the Cauchy component of integral breadth related to crystallite size were determined by eliminating the broadening by the instrumental function from the diffraction profile of white X-ray. As a result, the characteristics of ductile damage progress near the notch of the aluminum single crystal were inspected from the distribution of both non-uniform strain and dislocation density.


2013 ◽  
Vol 62 (7) ◽  
pp. 443-450 ◽  
Author(s):  
Jun-ichi SHIBANO ◽  
Minoru KISO ◽  
Kentaro KAJIWARA ◽  
Takahisa SHOBU ◽  
Setsuo MIURA ◽  
...  

2013 ◽  
Vol 768-769 ◽  
pp. 358-365 ◽  
Author(s):  
Junichi Shibano ◽  
Minoru Kiso ◽  
Kentaro Kajiwara ◽  
Takahisa Shobu ◽  
Setsuo Miura ◽  
...  

A ductile damage progress of FCC single crystal was verified by a profile analysis using white X-ray obtained in BL28B2 beam line of SPring-8. In this study, an aluminum single crystal of the purity 6N was used as a specimen prepared in I-type geometry for tensile test. A notch was introduced into one side of the center of a parallel part of the specimen by the wire electric discharge machining. White X-ray, which has 100 microns in height and 200 microns in width, was incident into the specimen on the Bragg angle θ of 3 degrees using energy dispersive X-ray diffraction technique. The specimen was deformed by elongation along crystal orientation [001], and a diffraction profile of the white X-ray which penetrated it was analyzed. In profile analysis, an instrumental function was defined in consideration both of a divergence by a slit and a response function peculiar to the energy dispersive method. The Gauss component of integral breadth related to non-uniform strain and the Cauchy component of integral breadth related to crystallite size were determined by eliminating the broadening by the instrumental function from the diffraction profile of white X-ray. As a result, the direction of progress and the characteristics of ductile damage near the notch of the aluminum single crystal were clarified from the Gauss component and the Cauchy component of integral width of the single diffraction profile.


2015 ◽  
Vol 2015 (0) ◽  
pp. _G0301303--_G0301303-
Author(s):  
Masato EGUCHI ◽  
Kenichi FUKUDA ◽  
Kentaro KAJIWARA ◽  
Ayumi SHIRO ◽  
Takahisa SHOBU ◽  
...  

2018 ◽  
Vol 146 ◽  
pp. 121-126
Author(s):  
Yutaka Yoshida ◽  
Jun-ichi Shibano ◽  
Ken-ichi Fukuda ◽  
Kengo Terabayashi ◽  
Masato Eguchi ◽  
...  

2013 ◽  
Vol 2013.52 (0) ◽  
pp. 9-10
Author(s):  
Hirokazu KAWAI ◽  
Jun-ichi SHIBANO ◽  
Setsuo MIURA ◽  
Kentaro Kajiwara

1965 ◽  
Vol 13 (10) ◽  
pp. 1083-1084 ◽  
Author(s):  
R.R. Hasiguti ◽  
N. Igata ◽  
K. Tanaka

Author(s):  
G. A. Stone ◽  
G. Thomas

A single crystal stressed in the [3]𝛄 direction at 185°K was transformed to 5% 𝛂 martensite and 2% Ɛ martensite by volume. The austenite slip system of maximum shear stress is the (11)𝛄 [01)𝛄. Fig. 1 shows a two surface study using the electron and optical microscopes. The a martensite is confined between £martensite plates with the (0001)Ɛ ∥ (11)𝛄. The size of the acicular martensite crystals is controlled by the spacing of the £ martensite plates. These £ martensite plates are seen in Fig. 1A as dark vertical bands. The axes of the acicular crystals lie in the (11)𝛄 plane. The £ martensite habit plane is defined as the plane perpendicular to the (11)𝛄 containing the vector defining the crystal axis.


1998 ◽  
Vol 552 ◽  
Author(s):  
Q. Feng ◽  
S. H.

ABSTRACTThe temperature as well as orientation dependence in anomalous hardening occurs in single crystal Ti-56AI between 673K and 1073K under single slip of ordinary dislocations. The ordinary dislocations (1/2<110]) are gliding not only on (111) plane but also on (110) plane in the temperature range where the anomalous hardening occurs in single crystal Ti-56A1. The TEM study shows that the (110) cross-slip of ordinary dislocations is a double cross-slip in nature in which first, the dislocations cross-slip from the primary (111) slip plane to (110) plane followed by cross-slipping again onto another primary slip plane. This double cross-slip leaves a pair of edge segments 'superjogs' in (110) planes. It appears that these superjogs are immobile in the forward direction and act as pinning points. Furthermore, these pinning points would act as a Frank-Read source for the double cross-slipped dislocations, which generate dislocation loops as well as dislocation dipoles. The pinning structure, multiplane dislocation loops, and dipoles of double cross-slip origin all contribute to anomalous hardening at high temperatures in this material.


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