Study on Ductile Damage Progress of Aluminum Single Crystal Using Synchrotron White X-Ray

2013 ◽  
Vol 768-769 ◽  
pp. 358-365 ◽  
Author(s):  
Junichi Shibano ◽  
Minoru Kiso ◽  
Kentaro Kajiwara ◽  
Takahisa Shobu ◽  
Setsuo Miura ◽  
...  

A ductile damage progress of FCC single crystal was verified by a profile analysis using white X-ray obtained in BL28B2 beam line of SPring-8. In this study, an aluminum single crystal of the purity 6N was used as a specimen prepared in I-type geometry for tensile test. A notch was introduced into one side of the center of a parallel part of the specimen by the wire electric discharge machining. White X-ray, which has 100 microns in height and 200 microns in width, was incident into the specimen on the Bragg angle θ of 3 degrees using energy dispersive X-ray diffraction technique. The specimen was deformed by elongation along crystal orientation [001], and a diffraction profile of the white X-ray which penetrated it was analyzed. In profile analysis, an instrumental function was defined in consideration both of a divergence by a slit and a response function peculiar to the energy dispersive method. The Gauss component of integral breadth related to non-uniform strain and the Cauchy component of integral breadth related to crystallite size were determined by eliminating the broadening by the instrumental function from the diffraction profile of white X-ray. As a result, the direction of progress and the characteristics of ductile damage near the notch of the aluminum single crystal were clarified from the Gauss component and the Cauchy component of integral width of the single diffraction profile.

2014 ◽  
Vol 777 ◽  
pp. 176-181 ◽  
Author(s):  
Junichi Shibano ◽  
Kentaro Kajiwara ◽  
T. Tsukamoto ◽  
H. Kawai ◽  
Setsuo Miura ◽  
...  

A ductile damage progress of an aluminum single crystal with the prior activity of the single slip system under tensile loading was verified by a profile analysis using white X-ray obtained in BL28B2 beam line of SPring-8. In this study, the aluminum single crystal of the purity 6N was used as a specimen prepared in I-type geometry for tensile test. A notch was introduced into one side of the center of a parallel part of the specimen by the wire electric discharge machining. White X-ray beam, which has 50 μm in both height and width, was incident into the specimen on the Bragg angle θ of 3 degrees using energy dispersive X-ray diffraction technique. The specimen was deformed by elongation in the direction of 45°to [11 and [11 crystal orientations, respectively, and a diffraction profile of the white X-ray from Al220 plane was analyzed. In profile analysis, an instrumental function was defined in consideration both of a divergence by a slit and a response function peculiar to the energy dispersive method. The Gauss component of integral breadth related to non-uniform strain and the Cauchy component of integral breadth related to crystallite size were determined by eliminating the broadening by the instrumental function from the diffraction profile of white X-ray. As a result, the characteristics of ductile damage progress near the notch of the aluminum single crystal were inspected from the distribution of both non-uniform strain and dislocation density.


2013 ◽  
Vol 62 (7) ◽  
pp. 443-450 ◽  
Author(s):  
Jun-ichi SHIBANO ◽  
Minoru KISO ◽  
Kentaro KAJIWARA ◽  
Takahisa SHOBU ◽  
Setsuo MIURA ◽  
...  

2013 ◽  
Vol 2013.52 (0) ◽  
pp. 9-10
Author(s):  
Hirokazu KAWAI ◽  
Jun-ichi SHIBANO ◽  
Setsuo MIURA ◽  
Kentaro Kajiwara

2008 ◽  
Vol 39 (8) ◽  
pp. 1978-1984 ◽  
Author(s):  
S. Mahadevan ◽  
T. Jayakumar ◽  
B.P.C. Rao ◽  
Anish Kumar ◽  
K.V. Rajkumar ◽  
...  

1989 ◽  
Vol 33 ◽  
pp. 397-402 ◽  
Author(s):  
Shin'ichi Ohya ◽  
Yasuo Yoshioka

When an x-ray diffraction profile Is measured for stress analysis or profile analysis by the use of a linear (straight line) position sensitive proportional counter (PSPC) , a convex-type background line is obtained because of the geometrical problem and the absorption of x-rays. Such phenomenon is remarkable when a wide angular range is set on a linear PSPC and it is, in particular, necessary to correct with a straight background for accurate measurement of diffraction angle or half-value breadth of the broadened diffraction profile.


1994 ◽  
Vol 38 ◽  
pp. 387-395 ◽  
Author(s):  
Walter Kalceff ◽  
Nicholas Armstrong ◽  
James P. Cline

Abstract This paper reviews several procedures for the removal of instrumental contributions from measured x-ray diffraction profiles, including: direct convolution, unconstrained and constrained deconvolution, an iterative technique, and a maximum entropy method (MEM) which we have adapted to x-ray diffraction profile analysis. Decorevolutions using the maximum entropy approach were found to be the most robust with simulated profiles which included Poisson-distributed noise and uncertainties in the instrument profile function (IPF). The MEM procedure is illustrated by application to the analysis for domain size and microstrain carried out on the four calcined α-alumina candidate materials for Standard Reference Material (SRM) 676 (a quantitative analysis standard for I/Ic determinations), along with the certified material. Williamson-Hall plots of these data were problematic with respect to interpretation of the microstrain, indicating that the line profile standard, SRM 660 (LaB6), exhibits a small amount of strain broadening, particularly at high 2θ angle. The domain sizes for all but one of the test materials were much smaller than the crystallite (particle) size; indicating the presence of low angle grain boundaries.


1981 ◽  
Vol 25 ◽  
pp. 365-371
Author(s):  
Glen A. Stone

This paper presents a new method to measure the thickness of very thin films on a substrate material using energy dispersive x-ray diffractometry. The method can be used for many film-substrate combinations. The specific application to be presented is the measurement of phosphosilicate glass films on single crystal silicon wafers.


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