New opportunities in laboratory diagnostics of shot products by their x-ray fluorescence spectral element analysis.

For the calculation of X-ray intensities emitted by elements present in multi-layer systems it is vital to have an accurate knowledge of the x-ray ionization vs. mass-depth (ϕ(ρz)) curves as a function of accelerating voltage and atomic number of films and substrate. Once this knowledge is available the way is open to the analysis of thin films in which both the thicknesses as well as the compositions can usually be determined simultaneously.Our bulk matrix correction “PROZA” with its proven excellent performance for a wide variety of applications (e.g., ultra-light element analysis, extremes in accelerating voltage) has been used as the basis for the development of the software package discussed here. The PROZA program is based on our own modifications of the surface-centred Gaussian ϕ(ρz) model, originally introduced by Packwood and Brown. For its extension towards thin film applications it is required to know how the 4 Gaussian parameters α, β, γ and ϕ(o) for each element in each of the films are affected by the film thickness and the presence of other layers and the substrate.

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An improved interference correction for trace element analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100132868 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1646-1647

Author(s):

John J. Donovan ◽

Donald A. Snyder ◽

Mark L. Rivers

Keyword(s):

Trace Element Analysis ◽

Accurate Estimate ◽

Simple Expression ◽

Standard Reference Materials ◽

Characteristic Line ◽

Analytical Line ◽

Element Analysis ◽

Electron Probe Analysis ◽

Calculated Concentration ◽

X Ray

We present a simple expression for the quantitative treatment of interference corrections in x-ray analysis. WDS electron probe analysis of standard reference materials illustrate the success of the technique.For the analytical line of wavelength λ of any element A which lies near or on any characteristic line of another element B, the observed x-ray counts at We use to denote x-ray counts excited by element i in matrix j (u=unknown; s=analytical standard; ŝ=interference standard) at the wavelength of the analytical line of A, λA (Fig. 1). Quantitative analysis of A requires an accurate estimate of These counts can be estimated from the ZAF calculated concentration of B in the unknown C,Bu measured counts at λA in an interference standard of known concentration of B (and containing no A), and ZAF correction parameters for the matrices of both the unknown and the interference standard at It can be shown that:

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Faculty Opinions recommendation of X-ray-verified fractures are associated with finite element analysis-derived bone strength and trabecular microstructure in young adult men.

Faculty Opinions – Post-Publication Peer Review of the Biomedical Literature ◽

10.3410/f.718163830.793486197 ◽

2013 ◽

Author(s):

Gordon Klein

Keyword(s):

Finite Element Analysis ◽

Finite Element ◽

Young Adult ◽

Bone Strength ◽

Element Analysis ◽

X Ray ◽

Adult Men ◽

Trabecular Microstructure

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Geochemistry and Mineralogy of Ice-Dammed Lake Sediments of the Lębork Deposit

Clays and Clay Minerals ◽

10.1007/s42860-021-00129-6 ◽

2021 ◽

Author(s):

Radosław Rogoziński ◽

Alina Maciejewska

Keyword(s):

Chemical Composition ◽

Lake Sediments ◽

Inductively Coupled Plasma ◽

Mineralogical Composition ◽

Raw Material ◽

Element Analysis ◽

X Ray ◽

Dominant Component ◽

Clay Deposits ◽

Dammed Lake

AbstractVarved clay deposits from ice-dammed lakes are a particularly important and broadly applied raw material used for the production of high-quality ceramics (red bricks, roof tiles, etc.), but the mineralogy and geochemistry of these sediments are not fully understood. The aim of the present study was to determine the chemical and mineralogical composition of ice-dammed lake sediments of the Lębork deposit. Major-element analysis of the compositions of selected samples from the ice-dammed lake clays was performed by X-ray fluorescence (XRF) and trace elements were determined by inductively coupled plasma-mass spectrometry. The mineralogical composition of clay samples was determined by X-ray diffraction (XRD). Analyses of the chemical composition of the ice-dammed lake clays of the Lębork deposit showed that the dominant component was SiO2 with a mean content of 56.13 wt.%; the second most abundant component was Al2O3, with a mean content for the entire deposit of 11.61 wt.%. Analysis by ICP-MS indicated the presence of rare earth elements (REE), e.g. cerium, neodymium, lanthanum, and praseodymium; their mean contents are: 56.9, 27.0, 26.3, and 7.3 ppm, respectively. Mineralogical analysis of the varved clays identified quartz, muscovite, calcite, and clay minerals – illite, kaolinite, and montmorillonite. The material filling the Lębork basin is characterized by small lateral and vertical variability in chemical composition. The results of the present study may be of considerable importance in determining the parent igneous, metamorphic, and sedimentary rocks, the weathering products of which supplied material to the ice-dammed lake, as well as in determining the mechanisms and character of the sedimentation process itself.

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Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals

Advances in X-ray Analysis ◽

10.1154/s0376030800022515 ◽

1995 ◽

Vol 39 ◽

pp. 109-117

Author(s):

Burkhard Beckhoff ◽

Birgit Kanngießer

Keyword(s):

High Intensity ◽

Focal Plane ◽

Bragg Reflection ◽

Pyrolytic Graphite ◽

Trace Element Analysis ◽

Detection Sensitivity ◽

Element Analysis ◽

X Ray ◽

Wide Range ◽

Very High

X-ray focusing based on Bragg reflection at curved crystals allows collection of a large solid angle of incident radiation, monochromatization of this radiation, and condensation of the beam reflected at the crystal into a small spatial cross-section in a pre-selected focal plane. Thus, for the Bragg reflected radiation, one can achieve higher intensities than for the radiation passing directly to the same small area in the focal plane. In that case one can profit considerably from X-ray focusing in an EDXRF arrangement. The 00 2 reflection at Highly Oriented Pyrolytic Graphite (HOPG) crystals offers a very high intensity of the Bragg reflected beam for a wide range of photon energies. Furthermore, curvature radii smaller than 10 mm can be achieved for HOPG crystals ensuring efficient X-ray focusing in EDXRF applications. For the trace analysis of very small amounts of specimen material deposited on small areas of thin-filter backings, HOPG based X-ray focusing may be used to achieve a very high intensity of monochromatic excitation radiation.

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