scholarly journals ANALYSIS OF AIRY POINT APPLICATION ON LINE SCALE CALIBRATION IN RCM LIPI

2019 ◽  
Vol 20 (3) ◽  
pp. 189 ◽  
Author(s):  
Nadya Larasati Kartika ◽  
Nurul Alfiyati

<p>Calibration of line scale in the Research Center for Metrology LIPI Indonesia (RCM-LIPI) is traceable to one dimensional measuring machine (SIP machine). Capability of the SIP machine table used as the base of line scale, however, covers only up to 400 mm and can be extended to 1000 mm using shifting methods. Supporting point as a method to maintain line scale still straight during measurement should be applied on machine table. For line scale ranged 400 mm, supporting point can be attached because the whole artefact is on the table, while some of the industrial instruments have scales above 400 mm, this mean slightly difficult to attach supporting point. This paper described an appropriate supporting points setting and their influence in line scale calibration ranged 500 mm by designed two systems supporting point attachment, they are L = 500 mm and L = 350 mm.  As for the supporting points, airy points were used, because they were the most suitable for line scales with the pattern at the top plane. Each design is analysed using error graph and E<sub>n </sub>score to determine the most suitable design for 500 mm line scale calibration<em>.</em></p>

2012 ◽  
Vol 6 (1) ◽  
pp. 84-91
Author(s):  
Akira Takahashi ◽  
◽  
Yuji Kokumai ◽  
Yuichi Takigawa ◽  

The measurement error resulting from graduation anomalies and the signal processing algorithm used for determining the positions of graduations on line scales was investigated by simulation and experiment. Optical image-forming simulations were carried out on models of 6-µm-wide graduations with three sizes of defects (0.5, 1.0 and 1.5 µm) at one edge. A digital filter was used in signal processing to obtain the first differential to determine the positions of the graduations. The minimum values of the lateral shift of the determined graduation positions were observed for the three defect sizes when using a 9-µm-wide differential filter. An experiment was also carried out on an ordinary line scale with 6-µm-wide graduations using a high-precision laser-interferometric line scale calibration system by measuring seven positions on the scale in the direction perpendicular to the measurement axis. The root mean square of the standard deviations from the linear fitting lines constructed using the measured positions over a 300-mm-long line scale was 2.8 nmwhen the differential filter width was 9 µm. It was demonstrated that a differential filter was effective in reducing the lateral error due to graduation anomalies.


1995 ◽  
Vol 31 (2) ◽  
pp. 193-204 ◽  
Author(s):  
Koen Grijspeerdt ◽  
Peter Vanrolleghem ◽  
Willy Verstraete

A comparative study of several recently proposed one-dimensional sedimentation models has been made. This has been achieved by fitting these models to steady-state and dynamic concentration profiles obtained in a down-scaled secondary decanter. The models were evaluated with several a posteriori model selection criteria. Since the purpose of the modelling task is to do on-line simulations, the calculation time was used as one of the selection criteria. Finally, the practical identifiability of the models for the available data sets was also investigated. It could be concluded that the model of Takács et al. (1991) gave the most reliable results.


2006 ◽  
Vol 113 ◽  
pp. 447-452 ◽  
Author(s):  
Saulius Kaušinis ◽  
Aurimas Jakštas ◽  
Rimantas Barauskas ◽  
Albinas Kasparaitis

Metrologia ◽  
2015 ◽  
Vol 52 (1A) ◽  
pp. 04007-04007
Author(s):  
José Salgado ◽  
Nuruul Alfiyati

1984 ◽  
Vol 78 ◽  
pp. 165-167 ◽  
Author(s):  
Jean Guibert ◽  
Pierre Charvin ◽  
Patrick Stoclet

SummaryA new photographic measuring machine is under construction at Paris Observatory. The amount of transmitted light is measured by a linear array of 1024 photodiodes. Carriage control, data acquisition and on line processing are performed by microprocessors,a S.E.L. 32/27 computer, and an AP 120-B Array Processor. It is expected that a Schmidt telescope plate of size 360 mm square will be scanned in about one hour with pixel size of ten microns.


2013 ◽  
Vol 418 ◽  
pp. 128-131
Author(s):  
King Sun Lee

This system is a self-developed real-time thickness inspection system including high-precision laser sensors and a mobile platform for on-line detection of tire rubber skin. The measurement data is used to calculate the standard deviation and process capability indices, and to evaluate measurement capacity. The system is a real-time measurement system in which the obtained measuring data compare with the standard value and show any errors. A technician can adjust the process parameters precisely on-line to improve product quality. The standard deviation of repeatability of the system for height is within +/- 0.0081 mm. The repeatability error of the horizontal sliding rail is within 0.0145mm, while the measurement error between this system and a coordinated measuring machine is within 0.028mm.


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