scholarly journals SEISMIC RISK MAPPING OF WOODEN HOUSE IN LARGE AREA USING THE GRID-SQUARE STATISTICS : Part 2 Vulnerability functions of wooden houses with different construction age and example of seismic risk mapping

Author(s):  
Kouichi HASEGAWA ◽  
Saburoh MIDORIKAWA ◽  
Masashi MATSUOKA
2011 ◽  
Vol 17 (37) ◽  
pp. 829-834 ◽  
Author(s):  
Yasuhiro MORI ◽  
Keiko SHIMADA ◽  
Naoyuki OGURA ◽  
Hideki IDOTA ◽  
Kota IBUKI ◽  
...  

2018 ◽  
Vol 17 (4) ◽  
pp. 1863-1890 ◽  
Author(s):  
Armando Aguilar-Meléndez ◽  
Luis G. Pujades ◽  
Alex H. Barbat ◽  
Mario G. Ordaz ◽  
Josep de la Puente ◽  
...  

Author(s):  
J. W. Pappin

Seismic risk in regions of low seismicity is evaluated using the UK as an example. This involves quantifying the seismic hazard and also the vulnerability functions for a range of typical structures. Predictions are made as to the effects of a range of specific earthquakes occurring under two existing areas of the UK. By integrating the hazard and vulnerability seismic risk has been calculated in terms of cost and fatalities and compared to those arising from other types of hazard. Recommendations are made as to when, and in what form, seismic considerations may be necessary.


2019 ◽  
Vol 35 (4) ◽  
pp. 1515-1539 ◽  
Author(s):  
Vitor Silva

The majority of the existing seismic risk studies use a deterministic approach to define vulnerability functions, despite the well-recognized large variability in the probability of loss ratio conditional on ground-shaking intensities. This study explored a statistical framework to simulate this variability, considering the existing correlation between assets separated by a given distance. The impact that these vulnerability modeling approaches may have in probabilistic seismic risk assessment is evaluated considering three fictitious building portfolios with distinct characteristics. To this end, loss exceedance curves and average annualized losses are compared, and recommendations are drawn regarding the optimal vulnerability modeling approach.


Author(s):  
E. F. Manea ◽  
D. Toma-Danila ◽  
C. O. Cioflan ◽  
Gh. Marmureanu

2010 ◽  
Vol 75 (655) ◽  
pp. 1609-1615 ◽  
Author(s):  
Akiko SARATANI ◽  
Yu HASEBE ◽  
Yuki MIZUTANI ◽  
Yasuhiro HAYASHI

Author(s):  
G. Lehmpfuhl

Introduction In electron microscopic investigations of crystalline specimens the direct observation of the electron diffraction pattern gives additional information about the specimen. The quality of this information depends on the quality of the crystals or the crystal area contributing to the diffraction pattern. By selected area diffraction in a conventional electron microscope, specimen areas as small as 1 µ in diameter can be investigated. It is well known that crystal areas of that size which must be thin enough (in the order of 1000 Å) for electron microscopic investigations are normally somewhat distorted by bending, or they are not homogeneous. Furthermore, the crystal surface is not well defined over such a large area. These are facts which cause reduction of information in the diffraction pattern. The intensity of a diffraction spot, for example, depends on the crystal thickness. If the thickness is not uniform over the investigated area, one observes an averaged intensity, so that the intensity distribution in the diffraction pattern cannot be used for an analysis unless additional information is available.


Sign in / Sign up

Export Citation Format

Share Document