Glossary of Terms—Analysis and Prevention of Component and Equipment Failures

2021 ◽  
pp. 789-806
Author(s):  
Brett A. Miller ◽  
Ronald J. Parrington ◽  
Roch J. Shipley ◽  
Daniel P. Dennies

Abstract This glossary is a compilation of terms related to the analysis and prevention of component and equipment failures. It is intended to help promote clear thinking and useful failure analysis. The definitions presented are those used in this Volume and reflect a common and modern understanding of these terms as used in the literature and in reports by practicing failure analysts.

Author(s):  
John R. Devaney

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.


Author(s):  
Evelyn R. Ackerman ◽  
Gary D. Burnett

Advancements in state of the art high density Head/Disk retrieval systems has increased the demand for sophisticated failure analysis methods. From 1968 to 1974 the emphasis was on the number of tracks per inch. (TPI) ranging from 100 to 400 as summarized in Table 1. This emphasis shifted with the increase in densities to include the number of bits per inch (BPI). A bit is formed by magnetizing the Fe203 particles of the media in one direction and allowing magnetic heads to recognize specific data patterns. From 1977 to 1986 the tracks per inch increased from 470 to 1400 corresponding to an increase from 6300 to 10,800 bits per inch respectively. Due to the reduction in the bit and track sizes, build and operating environments of systems have become critical factors in media reliability.Using the Ferrofluid pattern developing technique, the scanning electron microscope can be a valuable diagnostic tool in the examination of failure sites on disks.


Author(s):  
V. A. Azev ◽  
I. N. Sukharkov ◽  
V. I. Arikulov ◽  
V. Yu. Zalyadnov ◽  
V. A. Khazhiev

The Exchange of information on the results of the functioning of the systems to ensure the efficiency of the equipment within the company, Association or enterprise is an important component of production activities. Properly organized exchange of information about the causes of failures and malfunctions of equipment, as well as best practices and effective solutions to ensure the efficiency of equipment allows without significant investments to improve the efficiency and safety of production. The purpose of this article is to describe the work carried out in LLC «SUEKKhakassia» to improve the efficiency of development and development of solutions aimed at improving the performance of mining and transport equipment.


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