scholarly journals Radial Structure of OAM-Carrying Fundamental X-Waves

2020 ◽  
Vol 11 (1) ◽  
pp. 169
Author(s):  
Souvik Agasti ◽  
Marco Ornigotti
Keyword(s):  
Intensity Distribution ◽  
Degree Of Freedom ◽  
Bessel Beams ◽  
Radial Structure ◽  
Spectral Degree ◽  
Localized Waves

We investigate the spectral degree of freedom of OAM-carrying localized waves and its influence on their transverse intensity distribution. In particular, we focus our attention on exponentially decaying spectra, which are very tightly connected to fundamental X-waves; we then show how it is possible to structure their transverse intensity distribution, thus creating a radial structure similar to that of Bessel beams.

Superposition of monochromatic Bessel beams in (kρ, kz)-plane to obtain wave focusing: Spatial localized waves

2005 ◽  
Vol 249 (4-6) ◽  
pp. 407-413 ◽  
Author(s):  
C.A. Dartora ◽  
K.Z. Nobrega ◽  
Alexandre Dartora ◽  
H.E. Hernandez-Figueroa
Keyword(s):  
Bessel Beams ◽  
Wave Focusing ◽  
Localized Waves

Structure images of Si, Ge and Mos2 crystals and some application to radiation damage studies

1978 ◽  
Vol 36 (1) ◽  
pp. 292-293 ◽  
Author(s):  
K. Izui ◽  
T. Nishida ◽  
S. Furuno ◽  
H. Otsu ◽  
S. Kuwabara
Keyword(s):  
Radiation Damage ◽  
Exposure Time ◽  
Gaussian Distribution ◽  
Intensity Distribution ◽  
Chromatic Aberration ◽  
Magnetic Lens

Recently we have observed the structure images of silicon in the (110), (111) and (100) projection respectively, and then examined the optimum defocus and thickness ranges for the formation of such images on the basis of calculations of image contrasts using the n-slice theory. The present paper reports the effects of a chromatic aberration and a slight misorientation on the images, and also presents some applications of structure images of Si, Ge and MoS2 to the radiation damage studies.(1) Effect of a chromatic aberration and slight misorientation: There is an inevitable fluctuation in the amount of defocus due to a chromatic aberration originating from the fluctuations both in the energies of electrons and in the magnetic lens current. The actual image is a results of superposition of those fluctuated images during the exposure time. Assuming the Gaussian distribution for defocus, Δf around the optimum defocus value Δf0, the intensity distribution, I(x,y) in the image formed by this fluctuation is given by

Approximating power for significance tests with one degree of freedom.

1997 ◽  
Vol 2 (2) ◽  
pp. 186-191 ◽  
Author(s):  
William P. Dunlap ◽  
Leann Myers
Keyword(s):  
Degree Of Freedom ◽  
Significance Tests

Performance analysis of global local mean square error criterion of stochastic linearization for nonlinear oscillator

2019 ◽  
Author(s):  
Nguyen Cao Thang ◽  
Luu Xuan Hung
Keyword(s):  
Performance Analysis ◽  
Mean Square Error ◽  
Nonlinear Oscillators ◽  
Degree Of Freedom ◽  
Equivalent Linearization ◽  
Mean Square ◽  
Error Criterion ◽  
Stochastic Linearization ◽  
Local Mean ◽  
Mean Square Error Criterion

The paper presents a performance analysis of global-local mean square error criterion of stochastic linearization for some nonlinear oscillators. This criterion of stochastic linearization for nonlinear oscillators bases on dual conception to the local mean square error criterion (LOMSEC). The algorithm is generally built to multi degree of freedom (MDOF) nonlinear oscillators. Then, the performance analysis is carried out for two applications which comprise a rolling ship oscillation and two degree of freedom one. The improvement on accuracy of the proposed criterion has been shown in comparison with the conventional Gaussian equivalent linearization (GEL).

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