Determination of the Exact Orientation of Single-Crystal X-ray Optics from Its Glitch Spectrum and Modeling of Glitches for an Arbitrary Configuration
Keyword(s):
X Ray
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X-ray optics made of single-crystal materials are widely used at most of the X-ray sources due to the outstanding properties. The main drawback of such optics—the diffraction losses, also known as glitches of intensity in the energy spectrum of the transmitted/diffracted beam. To be able to handle this negative effect, one needs a reliable way to simulate the glitch spectrum in any configuration. Here, we demonstrate the way of precisely determining the crystallographic orientation and unit cell parameters of optical elements just from a small glitch spectrum with the consequent possibility of simulating glitches for any energy.
2012 ◽
Vol 76
(7)
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pp. 2773-2783
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2017 ◽
Vol 81
(2)
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pp. 339-354
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1998 ◽
Vol 54
(4)
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pp. 358-364
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2017 ◽
Vol 62
(4)
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pp. 651-659
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Keyword(s):