scholarly journals Thermoelectric Performance of Polypropylene/Carbon Nanotube/Ionic Liquid Composites and Its Dependence on Electron Beam Irradiation

2022 ◽  
Vol 6 (1) ◽  
pp. 25
Author(s):  
Oliver Voigt ◽  
Beate Krause ◽  
Petra Pötschke ◽  
Michael T. Müller ◽  
Sven Wießner
Keyword(s):  
Electron Beam ◽  
Seebeck Coefficient ◽  
Electron Beam Irradiation ◽  
Single Walled Carbon Nanotubes ◽  
Electron Beam Treatment ◽  
Beam Irradiation ◽  
Seebeck Coefficients ◽  
Treated Sample ◽  
P Type ◽  
Walled Carbon Nanotubes

The thermoelectric behavior of polypropylene (PP) based nanocomposites containing single walled carbon nanotubes (SWCNTs) and five kinds of ionic liquids (Ils) dependent on composite composition and electron beam irradiation (EB) was studied. Therefore, several samples were melt-mixed in a micro compounder, while five Ils with sufficiently different anions and/or cations were incorporated into the PP/SWCNT composites followed by an EB treatment for selected composites. Extensive investigations were carried out considering the electrical, thermal, mechanical, rheological, morphological and, most significantly, thermoelectric properties. It was found that it is possible to prepare n-type melt-mixed polymer composites from p-type commercial SWCNTs with relatively high Seebeck coefficients when adding four of the selected Ils. The highest Seebeck coefficients achieved in this study were +49.3 µV/K (PP/2 wt.% SWCNT) for p-type composites and −27.6 µV/K (PP/2 wt.% SWCNT/4 wt.% IL type AMIM Cl) for n-type composites. Generally, the type of IL is decisive whether p- or n-type thermoelectric behavior is achieved. After IL addition higher volume conductivity could be reached. Electron beam treatment of PP/SWCNT leads to increased values of the Seebeck coefficient, whereas the EB treated sample with IL (AMIM Cl) shows a less negative Seebeck coefficient value.

scholarly journals Nanocomposites with p- and n-Type Conductivity Controlled by Type and Content of Nanotubes in Thermosets for Thermoelectric Applications

Nanomaterials ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 1144
Author(s):  
Katharina Kröning ◽  
Beate Krause ◽  
Petra Pötschke ◽  
Bodo Fiedler
Keyword(s):  
Carbon Nanotubes ◽  
Seebeck Coefficient ◽  
Single Walled Carbon Nanotubes ◽  
Mwcnt Content ◽  
Nitrogen Doped ◽  
Seebeck Coefficients ◽  
Different Types ◽  
Multi Walled Carbon Nanotubes ◽  
P Type ◽  
Walled Carbon Nanotubes

In this work, composites based on epoxy resin and various carbon nanotubes (CNTs) were studied regarding their thermoelectric properties. The epoxy composites were prepared by infiltration of preformed CNT buckypapers. The influence of different types of CNTs on the Seebeck coefficient was investigated, namely lab-made and commercially available multi walled carbon nanotubes (MWCNTs), lab-made nitrogen doped MWCNTs (N-MWCNT) and commercially available single walled carbon nanotubes (SWCNTs). It was found that only by varying the lab-made MWCNT content could both n- and p-type composites be produced with Seebeck coefficients between −9.5 and 3.1 µV/K. The incorporation of N-MWCNTs resulted in negative Seebeck coefficients of −11.4 to −17.4 µV/K. Thus, the Seebeck coefficient of pure SWCNT changed from 37.4 to −25.5 µV/K in the epoxy/1 wt. % SWCNT composite. A possible explanation for the shift in the Seebeck coefficient is the change of the CNTs Fermi level depending on the number of epoxy molecules on the CNT surface.

Coating Multi-Walled Carbon Nanotubes with CdS Nanoparticles Through Electron Beam Irradiation

2009 ◽  
Vol 9 (3) ◽  
pp. 2088-2091
Author(s):  
Haijiao Zhang ◽  
Xiaojuan Wan ◽  
Huijiao Guo ◽  
Zheng Jiao ◽  
Bing Zhao ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Cds Nanoparticles ◽  
Beam Irradiation ◽  
Multi Walled Carbon Nanotubes ◽  
Walled Carbon Nanotubes

Microstructural Modification of Brush-Plated Nanocrystalline Cr by High Current Pulsed Electron Beam Irradiation

2016 ◽  
Vol 41 ◽  
pp. 87-95 ◽  
Author(s):  
Jian Jun Hu ◽  
Lin Jiang Chai ◽  
Hong Bin Xu ◽  
Chao Ping Ma ◽  
Shu Bin Deng
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Thermal Stresses ◽  
Electron Beam Treatment ◽  
High Current ◽  
Beam Irradiation ◽  
Pulsed Electron Beam ◽  
Small Nodule ◽  
Before And After ◽  
Surface Microstructures

Cr layer was fabricated on 40Cr steel by electric brush plating process and then treated by high current pulsed electron beam irradiation technique. Surface microstructures of specimens before and after the irradiation were investigated. Results show that Cr surface is composed of uniformly distributed small nodule units which are composed of fine Cr particles smaller than 100nm. After high current pulsed electron beam treatment, many cracks are found on surface. The main reason is possibly due to the quasi-static thermal stresses accumulated along the surface of the specimens during the electron beam treatment. The surface grain grow from Cr particles because of heating by electron beam, and their size is less than 200nm.

Studies of the Effects of Ion-Implantation and Electron Beam Irradiation on CuInSe2 Single Crystals

1992 ◽  
Vol 262 ◽  
Author(s):  
C. A. Mullan ◽  
C. J. Kiely ◽  
A. Rockett ◽  
M. Imanieh ◽  
M. V. Yakushev ◽  
...  
Keyword(s):  
Electron Beam ◽  
Single Crystals ◽  
Electron Beam Irradiation ◽  
High Dose ◽  
Beam Irradiation ◽  
Thin Foils ◽  
Microstructural Effects ◽  
Vertical Bridgman ◽  
Electron Microscopes ◽  
P Type

ABSTRACTA series of CuInSe2 single crystals which were grown by the vertical Bridgman technique have been implanted with oxygen and xenon ions. These implants tend to cause a change from n to p-type conductivity and an enhancement of the photoconductivity. We present HREM and SIMS characterisation of the microstructural effects caused by high dose ion implants on CuInSe2. We also correlate our data with calculated ion implant profiles. In addition, we show that CuInSe2 thin foils can undergo significant degradation under the electron beam irradiation conditions which are commonly encountered in electron microscopes.

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