Effects of Bi3+ Doping on the Optical and Electric-Induced Light Scattering Performance of PLZT (8.0/69/31) Transparent Ceramics

Lanthanum modified lead zirconate titanate (abbreviated as PLZT) Electro-Optical ceramics with various Bi concentration were prepared by a hot-press process. The PLZT ceramic samples all present a single perovskite structure with no second phase detected. Bi3+ ion was considered to mainly enter the A-site of perovskite ABO3 structure of PLZT ceramics by the X-Ray Diffractionanalysis. The maximum permittivity (εm) of the PLZT samples decreased obviously as Bi concentration increased, while their remnant polarization (Pr) decreased slightly. In particular, the PLZT sample with 0.14 wt% Bi doping presented a higher optical transmittance 61.8% (λ = 633 nm), and its electric-induced light scattering performance was found to be improved obviously, the maximum light deduction value of ~47.6% was obtained.

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COMPARISON OF PROPERTIES OF PLZT SYSTEM WITH DIFFERENT FORMULATIONS

Modern Physics Letters B ◽

10.1142/s0217984906012122 ◽

2006 ◽

Vol 20 (29) ◽

pp. 1883-1892

Author(s):

S. K. PANDEY ◽

O. P. THAKUR ◽

ANSHU GOYAL ◽

D. S. RAWAL ◽

CHANDRA PRAKASH ◽

...

Keyword(s):

Lead Zirconate Titanate ◽

Room Temperature ◽

Piezoelectric Properties ◽

Lead Zirconate ◽

Rhombohedral Structure ◽

X Ray Diffraction ◽

Sem Study ◽

A Site ◽

Single Phase Formation ◽

Diffuse Phase

We report the comparison of structural, dielectric, ferroelectric and piezoelectric properties of lanthanum-modified lead zirconate titanate (PLZT) ceramics with the substitution of 7 and 8 mol% La 3+ content in PZT (65/35) by three different formulations. The three formulations are (i) cation compensated at A-site, (ii) valency compensated at A-site and (iii) all sites (A and B) compensated. Samples were prepared by solid-state reaction route. X-ray diffraction (XRD) study shows single-phase formation with rhombohedral structure in all the samples. Scanning electron microscopy (SEM) study shows variation in grain size with different formulations. Dielectric studies for all the PLZT samples have been carried out as a function of temperature (room temperature to 350°C) at few selected frequencies (0.1, 1, 10 and 100 kHz) showing characteristics of diffuse phase transition (DPT). Dielectric properties of the poled and unpoled samples at room temperature have also been compared. All these compositions show well-defined ferroelectric behavior with significant change in the coercive field (Ec). Maximum piezoelectric properties have been obtained for the PLZT system with 8 mol% La 3+ prepared by formulation (i).

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Angularly and Spectrally Resolved Light Scattering from Lead Zirconate Titanate Thin Films

Journal of the American Ceramic Society ◽

10.1111/j.1151-2916.1995.tb08614.x ◽

1995 ◽

Vol 78 (8) ◽

pp. 2027-2032 ◽

Cited By ~ 7

Author(s):

Michael B. Sinclair ◽

Duane Dimos ◽

Barrett G. Potter ◽

Robert W. Schwartz

Keyword(s):

Thin Films ◽

Light Scattering ◽

Lead Zirconate Titanate ◽

Lead Zirconate ◽

Zirconate Titanate ◽

Spectrally Resolved

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Effect of La Dopant on Electrical Properties of Pb(Zr,Ti)O3 Thin Film Capacitors

MRS Proceedings ◽

10.1557/proc-596-211 ◽

1999 ◽

Vol 596 ◽

Cited By ~ 1

Author(s):

Chang Jung Kim ◽

Ilsub Chung

Keyword(s):

Thin Film ◽

Thin Films ◽

Electrical Properties ◽

Lead Zirconate Titanate ◽

Random Access ◽

Lead Zirconate ◽

Second Phase ◽

Pzt Thin Films ◽

Si Substrates ◽

Thin Film Capacitors

AbstractLanthanum doped lead zirconate titanate (PZT) thin films have been prepared on Pt/IrO2/Ir/SiO2/Si substrates to improve the ferroelectric and retention properties. The microstructure and electrical properties of the PZT capacitors were evaluated as a function of La content. The crystalline orientation was appreciably influenced by the addition of La in PZT thin films. The microstructures of films containing 0 and 0.5 mol% La were single phase perovskite, but for La = 1 mol%, a second phase was detected by SEM observation. The 0.5 mol% La doped PZT thin film capacitor showed the best ferroelectric and retention properties for ferroelectric random access memory compared to non-doped PZT.

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A-site cation ordering and the glassy polarization behavior of lanthanum-modified lead zirconate titanate

Ferroelectrics ◽

10.1080/00150199608213391 ◽

1996 ◽

Vol 175 (1) ◽

pp. 233-239 ◽

Cited By ~ 6

Author(s):

Fei Fang ◽

Hong Gui ◽

Xiaowen Zhang

Keyword(s):

Lead Zirconate Titanate ◽

Lead Zirconate ◽

Cation Ordering ◽

Polarization Behavior ◽

Zirconate Titanate ◽

A Site

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Effect of A-Site Substitution of Calcium on Zr-Rich Lead Zirconate Titanate

Ferroelectrics ◽

10.1080/00150190213960 ◽

2002 ◽

Vol 274 (1) ◽

pp. 55-65 ◽

Cited By ~ 13

Author(s):

Haitao Huang ◽

Zhang Tianshu ◽

Joo Tien Oh ◽

Peter Hing

Keyword(s):

Lead Zirconate Titanate ◽

Lead Zirconate ◽

Zirconate Titanate ◽

A Site

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Effects of the Addition of Ions Barium on the Structural and Electrical Properties of PZT Ceramic

Materials Science Forum ◽

10.4028/www.scientific.net/msf.798-799.199 ◽

2014 ◽

Vol 798-799 ◽

pp. 199-204

Author(s):

Margarete S. Silva ◽

Guilhermina Ferreira Teixeira ◽

Gustavo F. Cavenago ◽

Lucas L. Silva ◽

Rafael Gomes Dias ◽

...

Keyword(s):

Lead Zirconate Titanate ◽

Lead Zirconate ◽

Slight Reduction ◽

Precursor Method ◽

Structural And Electrical Properties ◽

Powder Samples ◽

Diffraction Patterns ◽

A Site ◽

Ceramic Density ◽

Curie Temperature Tc

Lead zirconate titanate, with Zr/Ti ratio of 53/47 was prepared by the polymeric precursor method. It was investigated the barium (II) modification at 0.0, 0.2, 0.4 and 0.6 mol% in substitution to the lead (II) cation in A site of perovskite structure. The powder samples were characterized by XRD and the diffraction patterns were used to Rietveld refinement. The percentages of tetragonal and rhombohedral phases and a systematic study of the effect of barium (II) on the morphology and the dielectric properties of PZT were carried out. The results showed that the tetragonal phase is favored and the ceramic density is improved with the barium (II) insertion. The Curie temperature (Tc) is increased besides the slight reduction of dielectric constant (Kc).

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Commonalties of the influence of lower valent A-site and B-site modifications on lead zirconate titanate ferroelectrics and antiferroelectrics

Journal of Materials Research ◽

10.1557/jmr.1999.0067 ◽

1999 ◽

Vol 14 (2) ◽

pp. 465-475 ◽

Cited By ~ 15

Author(s):

Qi Tan ◽

Z. Xu ◽

Dwight Viehland

Keyword(s):

Oxygen Vacancy ◽

Lead Zirconate Titanate ◽

Elastic Strain ◽

Rhombohedral Phase ◽

Domain Size ◽

Lead Zirconate ◽

Structure Property ◽

Property Relations ◽

Zirconate Titanate ◽

A Site

Studies of the structure-property relations of lead zirconate titanate (PZT) modified with lower valent substitutions on the A- and B-sites have been performed as a function of substituent concentration. These investigations have yielded common changes induced by these substitutions on ferroelectric phases. The commonalties are the presence of fine domains and polarization pinning effects. Differences in domain morphologies were observed between the rhombohedral and tetragonal ferroelectric phases. Rhombohedral ferroelectrics were found to exhibit “wavy” domain patterns with increasing dopant concentrations, whereas a lenticular domain shape was preserved as the domain size was decreased for tetragonal ferroelectrics. These differences were explained in terms of different pinning mechanisms based on the differences in local elastic strain accommodations. Investigations of high Zr-content PZT have revealed that the ferroelectric rhombohedral phase becomes stabilized over the antiferroelectric orthorhombic with increasing concentrations of lower valent modifications. This change was explained in terms of the enhanced coupling between oxygen octahedra due to the bonding of oxygen-vacancy dipoles.

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