COMPARISON OF PROPERTIES OF PLZT SYSTEM WITH DIFFERENT FORMULATIONS

2006 ◽  
Vol 20 (29) ◽  
pp. 1883-1892
Author(s):  
S. K. PANDEY ◽  
O. P. THAKUR ◽  
ANSHU GOYAL ◽  
D. S. RAWAL ◽  
CHANDRA PRAKASH ◽  
...  
Keyword(s):  
Lead Zirconate Titanate ◽  
Room Temperature ◽  
Piezoelectric Properties ◽  
Lead Zirconate ◽  
Rhombohedral Structure ◽  
X Ray Diffraction ◽  
Sem Study ◽  
A Site ◽  
Single Phase Formation ◽  
Diffuse Phase

We report the comparison of structural, dielectric, ferroelectric and piezoelectric properties of lanthanum-modified lead zirconate titanate (PLZT) ceramics with the substitution of 7 and 8 mol% La 3+ content in PZT (65/35) by three different formulations. The three formulations are (i) cation compensated at A-site, (ii) valency compensated at A-site and (iii) all sites (A and B) compensated. Samples were prepared by solid-state reaction route. X-ray diffraction (XRD) study shows single-phase formation with rhombohedral structure in all the samples. Scanning electron microscopy (SEM) study shows variation in grain size with different formulations. Dielectric studies for all the PLZT samples have been carried out as a function of temperature (room temperature to 350°C) at few selected frequencies (0.1, 1, 10 and 100 kHz) showing characteristics of diffuse phase transition (DPT). Dielectric properties of the poled and unpoled samples at room temperature have also been compared. All these compositions show well-defined ferroelectric behavior with significant change in the coercive field (Ec). Maximum piezoelectric properties have been obtained for the PLZT system with 8 mol% La 3+ prepared by formulation (i).

PIEZOELECTRIC PROPERTIES OF PZT FILMS PREPARED BY HYDROTHERMAL METHOD

2006 ◽  
Vol 20 (25n27) ◽  
pp. 3805-3810 ◽  
Author(s):  
NOBUYOSHI FUJIWARA ◽  
KAZUHIRO KUSUKAWA ◽  
KHAIRUNISAK ABDUL RAZAK ◽  
WEI GAO
Keyword(s):  
Hydrothermal Method ◽  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Compressive Loading ◽  
Pure Titanium ◽  
Lead Zirconate ◽  
Loading Frequency ◽  
X Ray Diffraction ◽  
Pzt Films ◽  
Transverse Effect

Lead zirconate titanate (PZT) thin films of 5 μm thick were produced by a hydrothermal method on pure titanium substrates. ZrOCl 2-8 H 2 O , Pb ( NO 3)2 and TiO 2 were used as precursors and KOH as a promoter. The hydrothermal synthesis of PZT includes nucleation and crystal growth processes at 120°C or 140°C. The crystallization states were investigated by using scanning electron microscopy and X-Ray diffraction. Piezoelectric properties were evaluated from unimorph cantilever type actuators made of the films. The relationships between the deflection of the actuator due to piezoelectric transverse effect and applied electric field in the direction of thickness of the films showed good linearity. The output voltage from the films under cyclic compressive loading increased with increasing loading frequency, and is saturated at 10 Hz. The PZT films produced by the present methods are satisfactory as a smart material, and are better than the films produced using TiCl 4 as Ti precursor.

Study on the Piezoelectric Behavior and Structural Changes of Strontium Doped PZT Ceramics

2016 ◽  
Vol 869 ◽  
pp. 13-18
Author(s):  
Margarete Soares da Silva ◽  
Lucas L. Silva ◽  
Eliane F. Souza ◽  
Elson Longo ◽  
Maria A. Zaghete ◽  
...  
Keyword(s):  
Lead Zirconate Titanate ◽  
Room Temperature ◽  
Structural Changes ◽  
Piezoelectric Properties ◽  
Lead Zirconate ◽  
Strontium Content ◽  
Pzt Ceramics ◽  
Ceramic Samples ◽  
Piezoelectric Behavior ◽  
Piezoelectric Devices

Some piezoelectric properties of lead zirconate titanate PbZr0.53Ti0.47O3 ceramic samples sintered at 1100oC for 3 hours has been investigated in this work and compared to the strontium modification at 0.2, 0.4, and 0.6 mol%. Polarization versus Electric Field curve and d33 and Kp piezoelectric parameters was taken at room temperature in order to investigate the correlation with phase amount and lattice parameters of crystalline phases calculated through Rietveld refinement. The results indicated the lead substitution with 0.4 mol% of strontium enhances the d33 and Kp piezoelectric parameters, but there is no systematic variation of the piezoelectric properties with strontium content. By the other hand, tetragonal phase seems plays an important rule on piezoelectric devices operating near the room temperature and some correlations could be found.

DEVELOPMENT OF PEROVSKITE INPrSUBSTITUTEDPb(Zr0.52Ti0.48)O3AND DIELECTRIC CHARACTERISTIC

2006 ◽  
Vol 20 (21) ◽  
pp. 3071-3080 ◽  
Author(s):  
N. UDOMKAN ◽  
P. LIMSUWAN ◽  
P. WINOTAI ◽  
T. TUNKASIRI
Keyword(s):  
Lead Zirconate Titanate ◽  
Ferroelectric Property ◽  
Piezoelectric Properties ◽  
Pyrochlore Phase ◽  
Hysteresis Loops ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
Dopant Content ◽  
X Ray

The purpose of this research is to investigate the structure of lead zirconate titanate ceramics ( Zr:Ti =52:48) when doped with Pr2O3and the corresponding properties such as micro-structural properties, physical properties, dielectric constant (εr), piezoelectric properties (kp, Qm, and d33), and the ferroelectric property. The materials were prepared via conventional mixed oxide method and sintered at 1200°C. The Rietveld refinement of X-ray diffraction patterns and combination of both patterns revealed the tetragonal structure for all samples to have space group of P4mm. For higher dopant content (10 mol%), the pyrochlore phase of Pr2O3also appeared in the respective samples. These pyrochlore phases caused the detriment of dielectric and piezoelectric properties. For those with lower dopant content (1.00 mol%), the Pr ion substituted at the A and B sites with isovalent dopant effects, i.e. a lower value of εr, and kp. The hysteresis loops indicated the ferroelectric property for all samples. The microstructure showed dense grain according to a high density and the additional phases of Pr2O3were clearly observed for 10 mol% doping. The Curie temperature decreased with increasing dopant content, as determined from high temperature X-ray diffraction and differential scanning calorimetry.

scholarly journals Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction

Materials ◽  
2020 ◽  
Vol 13 (15) ◽  
pp. 3338
Author(s):  
Thomas W. Cornelius ◽  
Cristian Mocuta ◽  
Stéphanie Escoubas ◽  
Luiz R. M. Lima ◽  
Eudes B. Araújo ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Fields ◽  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ac Electric Fields ◽  
Zirconate Titanate

The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electric fields, with AC frequencies covering more than four orders of magnitude. The Bragg reflections for thin films with low lanthanum concentration exhibit a double-peak structure, indicating two contributions, whereas thin films with 12% La possess a well-defined Bragg peak with a single component. In addition, built-in electric fields are revealed for low La concentrations, while they are absent for thin films with 12% of La. For static and low frequency AC electric fields, all lanthanum-modified lead zirconate titanate thin films exhibit butterfly loops, whereas linear piezoelectric behavior is found for AC frequencies larger than 1 Hz.

Effect of Sintering Temperature on Phase Formation and Dielectric Properties of PLZT-BT Ceramics

2015 ◽  
Vol 1120-1121 ◽  
pp. 7-10
Author(s):  
Ladapak Chumprasert ◽  
Narit Funsueb ◽  
Apichart Limpichaipanit ◽  
Athipong Ngamjarurojana
Keyword(s):  
Dielectric Properties ◽  
Lead Zirconate Titanate ◽  
Sintering Temperature ◽  
Lead Zirconate ◽  
Rhombohedral Structure ◽  
Relaxor Behavior ◽  
Dielectric Measurements ◽  
X Ray Diffraction ◽  
X Ray ◽  
Oxide Powders

In this research, Barium titanate (BT) additive in lanthanum modified lead zirconate titanate (PLZT) was used to stabilize the PLZT ceramics. Oxide powders were synthesized by mixed oxide synthetic route via a rapid vibro-milling technique. It was prepared with the chemical formula of 0.95 Pb0.91La0.09 (Zr0.65Ti0.35)0.9775O3 -0.05 BaTiO3 to investigate the dielectric properties of PLZT ceramics. The modified PLZT ceramics were fabricated at variation of sintering temperatures of 1200-1275°C for 4 hours. By employing X-ray diffraction (XRD), it was found a pure perovskite with rhombohedral structure. The relaxor behavior was observed from the dielectric measurements. The suitable sintering temperature of 0.95 PLZT - 0.05 BT was 1275°C (εr=10463, tanδ=0.0125 and Tm=70°C).

Dielectric and Piezoelectric Properties of Praseodymium Modified Lead Zirconate Titanate Ceramics

2007 ◽  
Vol 280-283 ◽  
pp. 211-214 ◽  
Author(s):  
Hua Zhou ◽  
Qingchi Sun ◽  
Cuimin Lu
Keyword(s):  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Molar Fraction ◽  
Solid State Reaction Method ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate ◽  
Titanate Ceramics ◽  
Dielectric And Piezoelectric Properties

Praseodymium (Pr) modified lead zirconate titanate ceramics (Pb1-1.5xPrx (ZryTi1-y) O3 with x = 0.02, 0.04, 0.06, 0.08 and y = 0.51, 0.52, 0.54, 0.56, 0.58, 0.60) were prepared by the high temperature solid-state reaction method. X-ray diffraction (XRD) results show that the morphotropic phase boundary (MPB) of Pb0.955Pr0.03(ZryTi1-y)O3 (PPZT1) is located in the area where the molar fraction of Zr is near 55%, when the molar fraction of Zr is 54% and the sintering temperature is 1240°C with 1h curing time, the superior piezoelectric properties of compositions of PPZT1 system were optimized, a set of d33 = 420 pC/N; eT 33/e0 = 2,000; Tc = 314°C; Qm = 76; tand = 2% and kp = 0.53. On the other hand, Pb1-1.5xPrx(Zr0.54Ti0.46)O3 (PPZT2) is far from MPB and their compositions are all in tetragonal phase.

EFFECT OF CeO2ON SINTERING TEMPERATURE AND PIEZOELECTRIC PROPERTIES PZT (Zr:Ti = 52:48) CERAMICS

2005 ◽  
Vol 19 (10) ◽  
pp. 1757-1769 ◽  
Author(s):  
P. SRIMAUNGSONG ◽  
N. UDOMKAN ◽  
L. PDUNGSAP ◽  
P. WINOTAI
Keyword(s):  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Ferroelectric Properties ◽  
Hysteresis Loops ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
Dopant Content ◽  
X Ray ◽  
Grain Distribution

The purpose of this research is to investigate the structure of lead zirconate titanate ceramics (Zr:Ti = 52:48) doped with CeO2and corresponding properties such as micro-structural properties, physical properties, dielectric constant (εr), piezoelectric properties (kp, Qm, and d33), and the ferroelectric property. The specimens were prepared via a conventional mixed oxide method and sintered at 1200°C. Rietveld refinement of X-ray diffraction patterns resulted in the P4mm tetragonal structure for all samples. At a high dopant content (10 mol%), pyrochlore phases of CeO2appeared which caused the detriment of dielectric and piezoelectric properties. At a low dopant content (1 mol%), Ce4+ions entered the B site with isovalent dopant effects, and clearly resulted lower values of εr, and kpcompared with those of the undoped sample. The hysteresis loops showed ferroelectric properties for all samples. Microstructures displayed dense grain distribution and thus yielded a high density. The additional phase of CeO2was clearly observed for 10 mol% doping which implied it was overdoped. Finally, the Curie temperature has been found to decrease with increasing dopant content, as determined from high temperature X-ray diffraction and differential scanning calorimetry.

Impedance Spectroscopy Study of LiTaO3 Powder Synthesized via Sol-Gel Method

2012 ◽  
Vol 545 ◽  
pp. 275-278 ◽  
Author(s):  
Lili Widarti Zainuddin ◽  
Norlida Kamarulzaman
Keyword(s):  
Room Temperature ◽  
Single Phase ◽  
Sol Gel ◽  
Rhombohedral Structure ◽  
Spectroscopy Study ◽  
X Ray Diffraction ◽  
Gel Method ◽  
X Ray ◽  
Sol Gel Method ◽  
Impedance Spectroscopy Study

A ceramics sample of LiTaO3 was prepared using a sol-gel method. The sample is annealed at 750 °C for 48 hours. X-ray diffraction analysis indicate the formation of single phase, rhombohedral structure. An ac impedance study was used to analyse the conductivity of LiTaO3 at room temperature and at various temperatures.

Contribution from Ferroelastic Domain Switching Detected Using X-ray Diffraction toR-Curves in Lead Zirconate Titanate Ceramics

2001 ◽  
Vol 84 (12) ◽  
pp. 2921-2929 ◽  
Author(s):  
Alexandre E. Glazounov ◽  
Hans Kungl ◽  
Jan-Thorsten Reszat ◽  
Michael J. Hoffmann ◽  
Arnd Kolleck ◽  
...  
Keyword(s):  
Lead Zirconate Titanate ◽  
Domain Switching ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate ◽  
Titanate Ceramics
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