Machine learning method to predict threshold voltage distribution by read disturbance in 3D NAND Flash Memories

2020 ◽  
Vol 59 (8) ◽  
pp. 081003 ◽  
Author(s):  
Jihye Park ◽  
Jang Kye Lee ◽  
Hyungcheol Shin
2019 ◽  
Vol 58 (8) ◽  
pp. 081002
Author(s):  
Yung-Yueh Chiu ◽  
Cheng-Han Lin ◽  
Jhih-Siang Yang ◽  
Bo-Jun Yang ◽  
Minoru Aoki ◽  
...  

2009 ◽  
Vol 30 (9) ◽  
pp. 984-986 ◽  
Author(s):  
C.M. Compagnoni ◽  
M. Ghidotti ◽  
A.L. Lacaita ◽  
A.S. Spinelli ◽  
A. Visconti

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