The effect of hydrogen on programmed threshold-voltage distribution in NAND flash memories

Japanese Journal of Applied Physics ◽

10.7567/1347-4065/ab2942 ◽

2019 ◽

Vol 58 (8) ◽

pp. 081002

Author(s):

Yung-Yueh Chiu ◽

Cheng-Han Lin ◽

Jhih-Siang Yang ◽

Bo-Jun Yang ◽

Minoru Aoki ◽

...

Keyword(s):

Threshold Voltage ◽

Voltage Distribution ◽

Flash Memories ◽

Threshold Voltage Distribution

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Machine learning method to predict threshold voltage distribution by read disturbance in 3D NAND Flash Memories

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/aba5e0 ◽

2020 ◽

Vol 59 (8) ◽

pp. 081003 ◽

Author(s):

Jihye Park ◽

Jang Kye Lee ◽

Hyungcheol Shin

Keyword(s):

Machine Learning ◽

Threshold Voltage ◽

Machine Learning Method ◽

Learning Method ◽

Voltage Distribution ◽

Flash Memories ◽

Threshold Voltage Distribution

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Decision Directed Estimation of Threshold Voltage Distribution in NAND Flash Memory

IEEE Transactions on Signal Processing ◽

10.1109/tsp.2013.2295056 ◽

2014 ◽

Vol 62 (4) ◽

pp. 919-927 ◽

Author(s):

Dong-hwan Lee ◽

Wonyong Sung

Keyword(s):

Threshold Voltage ◽

Flash Memory ◽

Voltage Distribution ◽

Nand Flash Memory ◽

Threshold Voltage Distribution

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Modeling of Threshold Voltage Distribution in NAND Flash Memory: A Monte Carlo Method

IEEE Transactions on Electron Devices ◽

10.1109/ted.2016.2593913 ◽

2016 ◽

Vol 63 (9) ◽

pp. 3527-3532 ◽

Author(s):

Haibo Li

Keyword(s):

Monte Carlo ◽

Monte Carlo Method ◽

Threshold Voltage ◽

Flash Memory ◽

Voltage Distribution ◽

Nand Flash Memory ◽

Threshold Voltage Distribution

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Extractive method of threshold voltage distribution in floating gate NAND flash memory by using the charge pumping technique

2008 IEEE Silicon Nanoelectronics Workshop ◽

10.1109/snw.2008.5418383 ◽

2008 ◽

Author(s):

Sung-Ho Bae ◽

Hyuck-In Kwon ◽

Jung-Ryul Ahn ◽

Jae-Chul Om ◽

Jong-Ho Lee

Keyword(s):

Threshold Voltage ◽

Flash Memory ◽

Floating Gate ◽

Voltage Distribution ◽

Nand Flash Memory ◽

Charge Pumping ◽

Threshold Voltage Distribution

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The Method of Predicting Retention Threshold Voltage Distribution for NAND Flash Memory Based on Back-Propagation Neural Network

2019 IEEE 11th International Memory Workshop (IMW) ◽

10.1109/imw.2019.8739277 ◽

2019 ◽

Author(s):

Kunliang Wang ◽

Gang Du ◽

Zhiyuan Lun ◽

Xiaoyan Liu

Keyword(s):

Neural Network ◽

Threshold Voltage ◽

Flash Memory ◽

Back Propagation ◽

Back Propagation Neural Network ◽

Voltage Distribution ◽

Nand Flash Memory ◽

Threshold Voltage Distribution

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A high-efficiency threshold voltage distribution test method based on the reliability of 3D NAND flash memory

Microelectronics Reliability ◽

10.1016/j.microrel.2020.113897 ◽

2020 ◽

Vol 114 ◽

pp. 113897

Author(s):

Debao Wei ◽

Xiaoyu Chen ◽

Hua Feng ◽

Liyan Qiao ◽

Xiyuan Peng

Keyword(s):

Threshold Voltage ◽

Flash Memory ◽

High Efficiency ◽

Test Method ◽

Voltage Distribution ◽

Nand Flash Memory ◽

Threshold Voltage Distribution

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Analysis of the Correlation Between the Programmed Threshold-Voltage Distribution Spread of nand Flash Memory Devices and Floating-Gate Impurity Concentration

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2165073 ◽

2011 ◽

Vol 58 (11) ◽

pp. 3712-3719 ◽

Author(s):

Riichiro Shirota ◽

Yoshinori Sakamoto ◽

Hung-Ming Hsueh ◽

Jian-Ming Jaw ◽

Wen-Chuan Chao ◽

...

Keyword(s):

Threshold Voltage ◽

Flash Memory ◽

Impurity Concentration ◽

Floating Gate ◽

Memory Devices ◽

Voltage Distribution ◽

Nand Flash Memory ◽

Threshold Voltage Distribution

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Effect of String Tapering on Threshold Voltage Distribution and Its Mitigation in a Vertical Channel 3D NAND Flash Memory

10.7567/ssdm.2018.b-7-02 ◽

2018 ◽

Author(s):

U.M. Bhatt ◽

A. Kumar ◽

M. Pakala ◽

S.K. Manhas

Keyword(s):

Threshold Voltage ◽

Flash Memory ◽

Vertical Channel ◽

Voltage Distribution ◽

Nand Flash Memory ◽

Threshold Voltage Distribution

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Impact of cell threshold voltage distribution in the array of flash memories on scaled and multilevel flash cell design

1996 Symposium on VLSI Technology. Digest of Technical Papers ◽

10.1109/vlsit.1996.507864 ◽

2002 ◽

Author(s):

K. Yoshikawa

Keyword(s):

Threshold Voltage ◽

Cell Design ◽

Voltage Distribution ◽

Flash Memories ◽

Threshold Voltage Distribution

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Random Telegraph Noise Effect on the Programmed Threshold-Voltage Distribution of Flash Memories

IEEE Electron Device Letters ◽

10.1109/led.2009.2026658 ◽

2009 ◽

Vol 30 (9) ◽

pp. 984-986 ◽

Author(s):

C.M. Compagnoni ◽

M. Ghidotti ◽

A.L. Lacaita ◽

A.S. Spinelli ◽

A. Visconti

Keyword(s):

Threshold Voltage ◽

Voltage Distribution ◽

Flash Memories ◽

Noise Effect ◽

Random Telegraph Noise ◽

Telegraph Noise ◽

Threshold Voltage Distribution

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