scholarly journals Constraints on the Spacetime Metric around Seven “Bare” AGNs Using X-Ray Reflection Spectroscopy

2019 ◽  
Vol 874 (2) ◽  
pp. 135 ◽  
Author(s):  
Ashutosh Tripathi ◽  
Jinli Yan ◽  
Yuchan Yang ◽  
Yunfeng Yan ◽  
Marcus Garnham ◽  
...  
Keyword(s):  
Reflection Spectroscopy ◽  
X Ray ◽  
Spacetime Metric

scholarly journals ON ESTIMATING THE HIGH-ENERGY CUTOFF IN THE X-RAY SPECTRA OF BLACK HOLES VIA REFLECTION SPECTROSCOPY

2015 ◽  
Vol 808 (2) ◽  
pp. L37 ◽  
Author(s):  
Javier A. García ◽  
Thomas Dauser ◽  
James F. Steiner ◽  
Jeffrey E. McClintock ◽  
Mason L. Keck ◽  
...  
Keyword(s):  
Black Holes ◽  
High Energy ◽  
Reflection Spectroscopy ◽  
X Ray ◽  
Energy Cutoff

scholarly journals Visible light Bi2S3/BiFeO3 photocatalyst for effective removal of Rhodamine B

2018 ◽  
Vol 238 ◽  
pp. 03007
Author(s):  
Xiquan Wang ◽  
Nan Zhang ◽  
Gao Wang
Keyword(s):  
Photocatalytic Activity ◽  
Visible Light ◽  
Rhodamine B ◽  
Photocatalytic Performance ◽  
Diffuse Reflection Spectroscopy ◽  
Reflection Spectroscopy ◽  
X Ray Diffraction ◽  
Exchange Method ◽  
X Ray ◽  
Effective Removal

Bi2S3-sensitized BiFO3 (BFO) photocatalyst (Bi2S3/BFO) was successfully synthesized through a facile and environmental ion exchange method between BFO and Thiosurea (H2NCSNH2, TU). The photocatalysts were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDS) and UV-vis diffuse reflection spectroscopy (DRS). The obtained Bi2S3/BFO composites showed excellent photocatalytic performance for decomposing Rhodamine B (RhB) compared with pure BFO under visible light irradiation (λ>400nm). 5% Bi2S3/BFO exhibited the highest photocatalytic activity and excessive amount of Bi2S3 would result in the decrease of photocatalytic activity of BFO. The mechanism of enhanced photocatalytic activity was proposed on the basis of the calculated energy band positions.

Research on Inhibition Marine Microbial Adherence of a Novel Nano-TiO2 Coating on Aluminum

2012 ◽  
Vol 557-559 ◽  
pp. 1687-1690
Author(s):  
Tong Liu ◽  
Qiang Li
Keyword(s):  
Sol Gel ◽  
Gene Segment ◽  
Dip Coating ◽  
Aluminum Surface ◽  
Reflection Spectroscopy ◽  
X Ray Diffraction ◽  
Anodized Aluminum ◽  
X Ray ◽  
Uv Reflection ◽  
Microbial Adherence

A novel nano-TiO2 coating is prepared by vacuum dip-coating TiO2 sol–gel onto the anodized aluminum surface. The particles of TiO2 anatase is filled into the Al2O3 nano-pores formed by anodization. The structure and composition of the coatings are characterized by means of scanning electron microscopy (SEM) and X-ray diffraction (XRD). The preponderant bacterium is identified as Pseudomonas lindanilytica strain IPL-1 through analysis of the sequences of S16 nRNA gene segment. In addition, the electrochemical results show that the TiO2 coatings significantly reduce the corrosion rate of Al substrates. The UV reflection spectroscopy is used to determine and analyze that the nano-TiO2 coatings could improve the light photo catalytic activity which decreases microbial influencing corrosion acceleration inhibition (MICI).

The influence of porous silica substrate on the properties of alumina films studied by X-ray reflection spectroscopy

2012 ◽  
Vol 38 (6) ◽  
pp. 562-564 ◽  
Author(s):  
A. S. Konashuk ◽  
A. A. Sokolov ◽  
V. E. Drozd ◽  
A. A. Romanov ◽  
E. O. Filatova
Keyword(s):  
Porous Silica ◽  
Reflection Spectroscopy ◽  
X Ray ◽  
Silica Substrate ◽  
Alumina Films

scholarly journals X-ray reflection spectroscopy of the HfO2/SiO2/Si system in the region of the O–K absorption edge

2006 ◽  
Vol 500 (1-2) ◽  
pp. 219-223 ◽  
Author(s):  
E.O. Filatova ◽  
P. Jonnard ◽  
J.-M. André
Keyword(s):  
Absorption Edge ◽  
Reflection Spectroscopy ◽  
X Ray

Denitrification of water using ZnO/Cu as the photocatalyst

2018 ◽  
Vol 7 (3) ◽  
pp. 255-259 ◽  
Author(s):  
Ehasn Rahmani ◽  
Mohammad Rahmani
Keyword(s):  
Diffuse Reflection ◽  
Nano Particles ◽  
Diffuse Reflection Spectroscopy ◽  
Reflection Spectroscopy ◽  
X Ray Diffraction ◽  
Spectroscopy Analysis ◽  
Wet Impregnation ◽  
X Ray ◽  
Nanoparticle Morphology

Abstract The ZnO:xCu photocatalyst was prepared with reacting media, namely, water method followed by wet impregnation to deposit Cu on the ZnO nano particles. X-ray diffraction was used to perform crystallography and the determination of the ZnO:xCu particle size. Fourier transform infrared was employed for the detection of chemical bonds in the synthesized photocatalyst. The nanoparticle morphology was studied by field emission scanning electron microscope. The elemental composition of the synthesized catalysts was evaluated with X-ray fluorescence technique. Diffuse reflection spectroscopy analysis was performed to investigate the light absorption of the ZnO:xCu catalysts. The photocatalytic activity of the prepared ZnO:xCu nanoparticles was studied for the removal of nitrate from the aqueous solution of ammonium nitrate (50 mg·l−1) under UV irradiation. Results indicated that the ZnO:xCu photocatalyst has high photocalytic activity to remove nitrate from water. Moreover, complete degradation was achieved after 2.5 h.

scholarly journals The Effect of Annealing Temperature On The Structural and Optical Properties of Si/SiO2 Composites Synthesized By Thermal Oxidation of Silicon Wafers

2021 ◽  
Author(s):  
Kamal Kayed ◽  
Dalal Baba Kurd
Keyword(s):  
Annealing Temperature ◽  
Silicon Oxide ◽  
Energy Gap ◽  
Silicon Wafers ◽  
Reflection Spectroscopy ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Optical Reflection ◽  
Relative Absorption

Abstract In this article, silicon wafers were thermal treated in air at temperatures from 800 to 1200 °C. The annealed samples were investigated using X-ray diffraction, FTIR and optical reflection spectroscopy. Unique result obtained includes that, that Kubelk-Munk curves could be utilized to estimate the ratio of oxidized silicon atoms. In addition, we found that these curves could provide information on the degree to which the nanoparticle formation affects both the reflection spectra and the energy gap of the Si/SiO2 composites. On the other hand, it has been found that, the intensity of the silicon peak in XRD spectra is proportional to the relative absorption coefficient of amorphous silicon oxide.

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