Gain and Scan Rate Dependence of Friction at the Nanoscale Measured by Lateral Force Microscopy

Sunghyun Kim; Suenne Kim

doi:10.3938/jkps.73.388

Gain and Scan Rate Dependence of Friction at the Nanoscale Measured by Lateral Force Microscopy

Journal of the Korean Physical Society ◽

10.3938/jkps.73.388 ◽

2018 ◽

Vol 73 (3) ◽

pp. 388-391

Author(s):

Sunghyun Kim ◽

Suenne Kim

Keyword(s):

Lateral Force ◽

Rate Dependence ◽

Lateral Force Microscopy ◽

Force Microscopy ◽

Scan Rate

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Lateral Force Microscopy Study of the Friction between Silica Surfaces

Journal of Colloid and Interface Science ◽

10.1006/jcis.2000.7196 ◽

2000 ◽

Vol 232 (1) ◽

pp. 133-140 ◽

Cited By ~ 18

Author(s):

Simon Biggs ◽

Robert Cain ◽

Neil W. Page

Keyword(s):

Lateral Force ◽

Microscopy Study ◽

Lateral Force Microscopy ◽

Force Microscopy ◽

Silica Surfaces

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Surface Modification with Functionalized Self-Assembly and Surface Characterization by Lateral Force Microscopy

Molecular Crystals and Liquid Crystals Science and Technology Section A Molecular Crystals and Liquid Crystals ◽

10.1080/10587259808044473 ◽

1998 ◽

Vol 316 (1) ◽

pp. 123-128

Author(s):

Yun Kim ◽

Kwang-Salk Kim

Keyword(s):

Surface Modification ◽

Self Assembly ◽

Surface Characterization ◽

Lateral Force ◽

Lateral Force Microscopy ◽

Force Microscopy

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Effect of annealing temperature on the magnetic domain structure and surface mechanical properties of Ni-C composite thin films: Magnetic and Lateral Force Microscopy, and Force-Distance Spectroscopy

Materials Letters ◽

10.1016/j.matlet.2021.130295 ◽

2021 ◽

pp. 130295

Author(s):

Mukesh Kumar Pandey ◽

Asit Kumar Kar

Keyword(s):

Thin Films ◽

Mechanical Properties ◽

Domain Structure ◽

Annealing Temperature ◽

Magnetic Domain ◽

Lateral Force ◽

Magnetic Domain Structure ◽

Lateral Force Microscopy ◽

Composite Thin Films ◽

Force Microscopy

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Graphene used as a lateral force microscopy calibration material in the low-load non-linear regime

Review of Scientific Instruments ◽

10.1063/1.5044727 ◽

2018 ◽

Vol 89 (11) ◽

pp. 113902 ◽

Cited By ~ 2

Author(s):

Mathias J. Boland ◽

Jacob L. Hempel ◽

Armin Ansary ◽

Mohsen Nasseri ◽

Douglas R. Strachan

Keyword(s):

Lateral Force ◽

Linear Regime ◽

Lateral Force Microscopy ◽

Force Microscopy ◽

Low Load ◽

Non Linear ◽

Calibration Material

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Tribological analysis of glass fibers using atomic force microscopy (AFM)/lateral force microscopy (LFM)

Journal of Applied Polymer Science ◽

10.1002/(sici)1097-4628(20000222)75:8<1013::aid-app6>3.0.co;2-y ◽

2000 ◽

Vol 75 (8) ◽

pp. 1013-1025 ◽

Cited By ~ 8

Author(s):

N. Behary ◽

A. Ghenaim ◽

A. El Achari ◽

C. Caze

Keyword(s):

Atomic Force Microscopy ◽

Glass Fibers ◽

Lateral Force ◽

Lateral Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Tribological Analysis

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Lateral Force Microscopy

Compendium of Surface and Interface Analysis ◽

10.1007/978-981-10-6156-1_54 ◽

2018 ◽

pp. 331-335

Author(s):

Shiho Moriguchi

Keyword(s):

Lateral Force ◽

Lateral Force Microscopy ◽

Force Microscopy

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Quantitative Lateral Force Microscopy

Surface Design: Applications in Bioscience and Nanotechnology ◽

10.1002/9783527628599.ch21 ◽

2009 ◽

pp. 429-445

Author(s):

Holger Schnherr ◽

Ewa Tocha ◽

Jing Song ◽

G. Julius Vancso

Keyword(s):

Lateral Force ◽

Lateral Force Microscopy ◽

Force Microscopy

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Lateral Force Microscopy (LFM)

Encyclopedia of Nanotechnology ◽

10.1007/978-94-017-9780-1_100467 ◽

2016 ◽

pp. 1764-1764

Keyword(s):

Lateral Force ◽

Lateral Force Microscopy ◽

Force Microscopy

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Combining Force−Distance Curves and Lateral Force Microscopy: Quantitative Measurements of Atomic Scale Stick−Slip Responses and Frictional Properties

Langmuir ◽

10.1021/la026332u ◽

2003 ◽

Vol 19 (6) ◽

pp. 2528-2531 ◽

Cited By ~ 3

Author(s):

Gregory S. Watson ◽

Bradley P. Dinte ◽

Jolanta A. Blach ◽

Sverre Myhra

Keyword(s):

Lateral Force ◽

Atomic Scale ◽

Lateral Force Microscopy ◽

Stick Slip ◽

Force Microscopy ◽

Frictional Properties ◽

Quantitative Measurements

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A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data

New Journal of Physics ◽

10.1088/1367-2630/ab3353 ◽

2019 ◽

Vol 21 (8) ◽

pp. 083007 ◽

Cited By ~ 1

Author(s):

T Seeholzer ◽

O Gretz ◽

F J Giessibl ◽

A J Weymouth

Keyword(s):

Potential Energy ◽

Frequency Modulation ◽

Fourier Method ◽

Lateral Force ◽

Lateral Force Microscopy ◽

Force Microscopy ◽

Lateral Forces ◽

Microscopy Data

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