Amplitude Estimation Technique for Intermittent Contact Atomic Force Microscopy

2017 ◽  
Vol 6 (2) ◽  
pp. 29-42
Author(s):  
Grzegorz Dobiński ◽  
Sławomir Pawłowski ◽  
Marek Smolny
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Detection System ◽  
Measurement Techniques ◽  
Estimation Method ◽  
High Speed Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Amplitude Estimation ◽  
Intermittent Contact

This article describes how one of the biggest challenges in designing of high-speed intermittent contact atomic force microscope (AFM) is the construction of a fast amplitude detector. The measurement techniques commonly used in commercial microscopes, such as RMS to DC converters or lock-in amplifiers often do not provide sufficient bandwidth to perform high speed imaging. On the other hand, many techniques developed especially for high-speed AFM are characterized by poor signal-to-noise ratio. In this paper, a novel amplitude estimation method based on the generalized Goertzel algorithm is presented. The detection system, composed of 16-bit 100 mega-samples per second analog-to-digital converter and field-programmable gate array device, allows to measure the signal amplitude within the time comparable to one oscillation cycle of the AFM cantilever. The effectiveness and validity of the designed detector were investigated by computer simulation. High spatial resolution of the presented method implemented in the actual atomic force microscopy system is also demonstrated.

scholarly journals Local raster scanning for high-speed imaging of biopolymers in atomic force microscopy

2011 ◽  
Vol 82 (6) ◽  
pp. 063703 ◽  
Author(s):  
Peter I. Chang ◽  
Peng Huang ◽  
Jungyeoul Maeng ◽  
Sean B. Andersson
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
High Speed Imaging ◽  
Force Microscopy ◽  
Raster Scanning ◽  
Atomic Force

Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor

1996 ◽  
Vol 68 (6) ◽  
pp. 871-873 ◽  
Author(s):  
S. R. Manalis ◽  
S. C. Minne ◽  
C. F. Quate
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
High Speed Imaging ◽  
Force Microscopy ◽  
Atomic Force

Nanomanipulator Based on a High-Speed Atomic Force Microscopy

2012 ◽  
Vol 516 ◽  
pp. 396-401
Author(s):  
Itsuhachi Ishisaki ◽  
Yuya Ohashi ◽  
Tatsuo Ushiki ◽  
Futoshi Iwata
Keyword(s):  
Atomic Force Microscopy ◽  
Real Time ◽  
High Speed ◽  
Imaging Technique ◽  
Frame Rate ◽  
High Speed Imaging ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Short Time

We developed a real-time nanomanipulation system based on high-speed atomic force microscopy (HS-AFM). During manipulation, the operation of the manipulation is momentarily interrupted for a very short time for high-speed imaging; thus, the topographical image of the fabricated surface is periodically updated during the manipulation. By using a high-speed imaging technique, the interrupting time could be much reduced during the manipulation; as a result, the operator almost does not notice the blink time of the interruption for imaging during the manipulation. As for the high-speed imaging technique, we employed a contact-mode HS-AFM to obtain topographic information through the instantaneous deflection of the cantilever during high-speed scanning. By using a share motion PZT scanner, the surface could be imaged with a frame rate of several fps. Furthermore, the high-speed AFM was coupled with a haptic device for human interfacing. By using the system, the operator can move the AFM probe into any position on the surface and feel the response from the surface during manipulation. As a demonstration of the system, nanofabrication under real-time monitoring was performed. This system would be very useful for real-time nanomanipulation and fabrication of sample surfaces.

scholarly journals A Kalman Filter for Amplitude Estimation in High-Speed Dynamic Mode Atomic Force Microscopy

2016 ◽  
Vol 24 (1) ◽  
pp. 276-284 ◽  
Author(s):  
Michael G. Ruppert ◽  
Kai S. Karvinen ◽  
Samuel L. Wiggins ◽  
S. O. Reza Moheimani
Keyword(s):  
Atomic Force Microscopy ◽  
Kalman Filter ◽  
High Speed ◽  
Dynamic Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Amplitude Estimation ◽  
Mode Atomic Force Microscopy

scholarly journals Studying biological membranes with extended range high-speed atomic force microscopy

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Adrian P. Nievergelt ◽  
Blake W. Erickson ◽  
Nahid Hosseini ◽  
Jonathan D. Adams ◽  
Georg E. Fantner
Keyword(s):  
Atomic Force Microscopy ◽  
Lipid Membranes ◽  
High Speed ◽  
Open Loop ◽  
Peak Force ◽  
High Speed Imaging ◽  
Biomolecular Systems ◽  
Biologically Relevant ◽  
Force Microscopy ◽  
Atomic Force

Abstract High—speed atomic force microscopy has proven to be a valuable tool for the study of biomolecular systems at the nanoscale. Expanding its application to larger biological specimens such as membranes or cells has, however, proven difficult, often requiring fundamental changes in the AFM instrument. Here we show a way to utilize conventional AFM instrumentation with minor alterations to perform high-speed AFM imaging with a large scan range. Using a two—actuator design with adapted control systems, a 130 × 130 × 5 μm scanner with nearly 100 kHz open—loop small-signal Z—bandwidth is implemented. This allows for high-speed imaging of biologically relevant samples as well as high-speed measurements of nanomechanical surface properties. We demonstrate the system performance by real-time imaging of the effect of charged polymer nanoparticles on the integrity of lipid membranes at high imaging speeds and peak force tapping measurements at 32 kHz peak force rate.

DMCMN: In Depth Characterization and Control of AFM Cantilevers With Integrated Sensing and Actuation

2009 ◽  
Vol 131 (6) ◽  
Author(s):  
Georg E. Fantner ◽  
Daniel J. Burns ◽  
Angela M. Belcher ◽  
Ivo W. Rangelow ◽  
Kamal Youcef-Toumi
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Microelectromechanical Systems ◽  
Industrial Process ◽  
Clinical Diagnostics ◽  
Mems Devices ◽  
High Speed Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
And Control

New developments in MEMS (microelectromechanical systems) fabrication allowed the development of new types of atomic force microscopy (AFM) sensor with integrated readout circuit and actuator built in on the cantilever. Such a fully instrumented cantilever allows a much more direct measurement and actuation of the cantilever motion and interaction with the sample. This technology is expected to not only allow for high speed imaging but also the miniaturization of AFMs. Based on the complexity of these integrated MEMS devices, a thorough understanding of their behavior and a specialized controls approach is needed to make the most use out of this new technology. In this paper we investigate the intrinsic properties of such MEMS cantilevers and develop a combined approach for sensing and control, optimized for high speed detection and actuation. Further developments based on the results presented in this paper will help to expand the use of atomic force microscopy to a broad range of everyday applications in industrial process control and clinical diagnostics.

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