Analysis of Energy Loss-Gain Error in Discrete Fourier Transform

2014 ◽  
Vol 568-570 ◽  
pp. 172-175 ◽  
Author(s):  
Yao Lin Liu ◽  
Feng Han ◽  
Zhen Liu ◽  
Min Chen Zhai

In asynchronous sampling, discrete Fourier transform (DFT) spectrum involves errors. Scholars have done great investigations on the correction techniques of DFT spectrum, but the errors have not been completely eliminated all along. In this paper, spectrums were examined from the principle of conservation of energy. It is unnoticed before that the energy of the digital signal, which is the analysis object of DFT, isn't equal to that of the finite continuous signal truncated by rectangular window. Thus the energy of their spectrums are different according to the Parseval's theorem. The Energy Loss-Gain (ELG) error was introduced to express the energy difference between these two spectrums. The ELG error is zero if the observed continuous signal is truncated in integral multiple of half cycle and it is related to the cycle number and sampling number in one cycle. Analysis show that the ELG error decreases with the increment of these two parameters, which are helpful to the engineering.

2014 ◽  
Vol 568-570 ◽  
pp. 189-192
Author(s):  
Feng Han ◽  
Yao Lin Liu ◽  
Zhen Liu ◽  
Hai Dong Zeng

Discrete Fourier transform (DFT/FFT) spectrums contain a variety of inherent errors in asynchronous sampling. Spectrum analysis with the accuracy above 10-3 are generally challenging issues. This work divides the DFT procedure into four signal transforms and exams six spectrum errors originated from these distortions. Besides the review of traditional errors, a so-called energy loss-gain (ELG) error is briefly introduced, which is proved to be a considerable error on the basis of Parseval's theorem. With the help of full error analysis mentioned here and the further development of analytical error estimators, it is expectable to obtain a DFT spectrum with a specified accuracy.


Author(s):  
L. Reimer ◽  
R. Oelgeklaus

Quantitative electron energy-loss spectroscopy (EELS) needs a correction for the limited collection aperture α and a deconvolution of recorded spectra for eliminating the influence of multiple inelastic scattering. Reversely, it is of interest to calculate the influence of multiple scattering on EELS. The distribution f(w,θ,z) of scattered electrons as a function of energy loss w, scattering angle θ and reduced specimen thickness z=t/Λ (Λ=total mean-free-path) can either be recorded by angular-resolved EELS or calculated by a convolution of a normalized single-scattering function ϕ(w,θ). For rotational symmetry in angle (amorphous or polycrystalline specimens) this can be realised by the following sequence of operations :(1)where the two-dimensional distribution in angle is reduced to a one-dimensional function by a projection P, T is a two-dimensional Fourier transform in angle θ and energy loss w and the exponent -1 indicates a deprojection and inverse Fourier transform, respectively.


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