Force Sensor and its Application to Tuning Fork Response Measurement

Generally, force measurement of nanoscale material widely employs a quartz tuning fork which is resonant mechanical sensors on 32.768 kHz resonance frequency and is powerful tools. But, this paper designs the sensor by using tuning fork on 3 kHz and modifies the tuning fork by a tiny pin adhesive into the end of prong. In experiment, measurements of electrical signal from piezoelectric are study of load-mass effect and pin position. 2 touching techniques are considered: a shear-force type and a tapping mode type with highly position movement system. Silicone rubber, vinyl eraser and hydrogel are elastic material for testing. Results show that both weight and position of pin is significant influencer for resonance frequency and quality factor of sensor. Finally, the tuning fork response experimentation shown this method can be applied to material classification.

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Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy

Applied Physics Letters ◽

10.1063/1.4891882 ◽

2014 ◽

Vol 105 (4) ◽

pp. 043107 ◽

Cited By ~ 11

Author(s):

Hiroaki Ooe ◽

Tatsuya Sakuishi ◽

Makoto Nogami ◽

Masahiko Tomitori ◽

Toyoko Arai

Keyword(s):

Atomic Force Microscopy ◽

Resonance Frequency ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Sensor ◽

Force Microscopy ◽

Atomic Force

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Development of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments

Review of Scientific Instruments ◽

10.1063/1.4868236 ◽

2014 ◽

Vol 85 (3) ◽

pp. 035003 ◽

Cited By ~ 5

Author(s):

V. T. A. Oiko ◽

B. V. C. Martins ◽

P. C. Silva ◽

V. Rodrigues ◽

D. Ugarte

Keyword(s):

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Sensor ◽

Force Range

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Dynamic Responses of Electrically Driven Quartz Tuning Fork and qPlus Sensor: A Comprehensive Electromechanical Model for Quartz Tuning Fork

Sensors ◽

10.3390/s19122686 ◽

2019 ◽

Vol 19 (12) ◽

pp. 2686

Author(s):

Manhee Lee ◽

Bongsu Kim ◽

Sangmin An ◽

Wonho Jhe

Keyword(s):

Resonance Frequency ◽

Quality Factor ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Dynamic Responses ◽

Peak Amplitude ◽

Quantitative Prediction ◽

Dynamic Features ◽

Electromechanical Model ◽

Different Characteristics

A quartz tuning fork and its qPlus configuration show different characteristics in their dynamic features, including peak amplitude, resonance frequency, and quality factor. Here, we present an electromechanical model that comprehensively describes the dynamic responses of an electrically driven tuning fork and its qPlus configuration. Based on the model, we theoretically derive and experimentally validate how the peak amplitude, resonance frequency, quality factor, and normalized capacitance are changed when transforming a tuning fork to its qPlus configuration. Furthermore, we introduce two experimentally measurable parameters that are intrinsic for a given tuning fork and not changed by the qPlus configuration. The present model and analysis allow quantitative prediction of the dynamic characteristics in tuning fork and qPlus, and thus could be useful to optimize the sensors’ performance.

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Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope

Sensors ◽

10.3390/s19081794 ◽

2019 ◽

Vol 19 (8) ◽

pp. 1794 ◽

Cited By ~ 2

Author(s):

Sangmin An ◽

Wonho Jhe

Keyword(s):

Atomic Force Microscope ◽

Tuning Fork ◽

High Sensitivity ◽

Quartz Tuning Fork ◽

Force Sensor ◽

Au Nanoparticle ◽

Ambient Conditions ◽

Atomic Force ◽

In Situ Detection

We introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF–AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF–AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF–AFM with force sensor capability and high sensitivity.

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