Self-Assembled ZnO Nanostructure for Field-Emission Devices

2009 ◽  
Vol 4 ◽  
pp. 19-25 ◽  
Author(s):  
P. Bhattacharya ◽  
D. Varshney ◽  
K. Samanta ◽  
R.S. Katiyar

Zinc oxide (ZnO) nanorods on Au patterned Si substrates were fabricated using vapor transport method. The XRD pattern showed the ZnO nanorods were highly c-axis oriented similar to ZnO thin films. The photoluminescence spectrum at 77 K of ZnO nanorods was consisting of the fundamental near band edge emission of ZnO in the UV region along with a broad defect induced emission around green band. The field emission properties of the nanorods showed a current density of 1mA/cm2 at an applied field of 10V/m, which is comparable to other reported values of ZnO nanorods. The patterned gold island formed by self-assembly of polystyrene ball on Si substrate acted as a catalyst in the growth of nanorods as well as stable ohmic contact for field emission.

2010 ◽  
Vol 663-665 ◽  
pp. 33-36
Author(s):  
Bo Gao ◽  
Hai Ming Zhang ◽  
Yan Jun Zhu ◽  
Yu Jie Li ◽  
Guo Feng Hu

In this paper, we introduce a simple and effective method to prepare ZnO nanorods using aqueous solutions. The morphology and structure properties of ZnO nanorods were investigated using scanning electron microscopy (SEM), X-ray diffraction (XRD) and photoluminescence (PL). The SEM results indicated that the diameter of ZnO nanoroads was about 100 nm. The XRD pattern showed that the ZnO nanorods had high-purity wuruzite structure. The PL spectrum revealed that ZnO nanorods had a strong visible emission at 423 nm. The field emission (FE) properties of ZnO nanorods were also studied. The FE results showed that the turn-on field and threshold field were 24V/μm and 39V/μm, respectively.


RSC Advances ◽  
2015 ◽  
Vol 5 (96) ◽  
pp. 78502-78507 ◽  
Author(s):  
Zhixiang Ye ◽  
Xiaohong Ji ◽  
Qinyuan Zhang

ZnO nanorods on Si substrates were synthesized by a simple vapor phase transport method, and FE property of these ZnO nanorods was improved by a two-step surface modification process.


2010 ◽  
Vol 100 (1) ◽  
pp. 165-170 ◽  
Author(s):  
Qing Zhao ◽  
Tuocheng Cai ◽  
Sheng Wang ◽  
Rui Zhu ◽  
Zhimin Liao ◽  
...  

2011 ◽  
Vol 11 (4) ◽  
pp. 3630-3634 ◽  
Author(s):  
Y. Mo ◽  
J. D. Jones ◽  
A. Neogi ◽  
Y. Fujita ◽  
J. M. Perez

2012 ◽  
Vol 501 ◽  
pp. 179-183 ◽  
Author(s):  
Siti Khadijah Mohd Bakhori ◽  
Chuo Ann Ling ◽  
Shahrom Mahmud

The influence of annealing on the optical properties of as-grown ZnO nanostructures prepared in pellets has been investigated by photoluminescence (PL) and Raman spectroscopy. The annealing temperatures of ZnO nanostructure at 600°C, 650°C and 700 °C were conducted in oxygen (O2) and nitrogen (N2) ambient. The near band edge emission (NBE) of samples recorded in the PL spectra demonstrates significant changes on optical signal whereby the NBE is redshifted after O2 annealed and became slightly higher in N2 annealed. Apart from that, weak green luminescence (GL) namely deep band emission (DBE) is observed centre at 532.95 nm (2.23 eV) and 511.00 nm (2.42 eV) for annealed in O2 and N2 respectively, whereas lower DBE observed in as-grown ZnO. On the other hand, Raman shift reveal the phonon mode of the ZnO nanostructures and the E2 (high) mode were downshifted as annealed in O2 ambient, and upshifted in N2 ambient. The downshift and upshift of the E2 (high) mode are correlated to tensile and compressive stress. Moreover the crystallite sizes were calculated from FWHM of XRD and TEM microscopy reveals the nanoplates structure of ZnO nanostructures.


2012 ◽  
Vol 18 (4) ◽  
pp. 905-911 ◽  
Author(s):  
Joan J. Carvajal ◽  
Oleksandr V. Bilousov ◽  
Dominique Drouin ◽  
Magdalena Aguiló ◽  
Francesc Díaz ◽  
...  

AbstractWe present a technique for the direct deposition of nanoporous GaN particles on Si substrates without requiring any post-growth treatment. The internal morphology of the nanoporous GaN particles deposited on Si substrates by using a simple chemical vapor deposition approach was investigated, and straight nanopores with diameters ranging between 50 and 100 nm were observed. Cathodoluminescence characterization revealed a sharp and well-defined near band-edge emission at ∼365 nm. This approach simplifies other methods used for this purpose, such as etching and corrosion techniques that can damage the semiconductor structure and modify its properties.


2005 ◽  
Vol 127 (36) ◽  
pp. 12452-12453 ◽  
Author(s):  
Haiyang Gan ◽  
Huibiao Liu ◽  
Yongjun Li ◽  
Qing Zhao ◽  
Yuliang Li ◽  
...  

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