Structural Analysis of Prosthetic Coatings Elaborated by Electrochemical Deposition

2017 ◽  
Vol 758 ◽  
pp. 105-110
Author(s):  
Yousra Alaoui Selsouli ◽  
Mohammed Bey Damene ◽  
Abdelilah Benmarouane ◽  
Florica Simescu-Lazar ◽  
Joël Faure ◽  
...  
Keyword(s):  
Hydrogen Peroxide ◽  
Titanium Alloy ◽  
Chemical Composition ◽  
Structural Analysis ◽  
Electrochemical Deposition ◽  
Crystal Size ◽  
Rietveld Method ◽  
X Rays ◽  
Titanium Alloy Ti6al4v

In this study, phosphocalcic coatings on titanium alloy Ti6Al4V substrate are elaborated using Electrodeposition (ELD) by adding optimized amount of hydrogen peroxide H2O2 into the electrolyte. Structural analysis is performed by X Rays Diffraction and the data are treated using the RIETVELD method. The characterization of the coatings elaborated by ELD showed that the H2O2 amount variation has an influence on the morphology, the crystal size and the chemical composition (monophasic or biphasic) of the coatings.

scholarly journals Large current ion beam polishing and characterization of mechanically finished titanium alloy (Ti6Al4V) surface

2019 ◽  
Vol 476 ◽  
pp. 905-913 ◽  
Author(s):  
Guangxue Zhou ◽  
Yongchen Bi ◽  
Yuanhang Ma ◽  
Langping Wang ◽  
Xiaofeng Wang ◽  
...  
Keyword(s):  
Titanium Alloy ◽  
Ion Beam ◽  
Large Current ◽  
Titanium Alloy Ti6al4v

Characterization of Titanium Alloy (Ti6Al4V) Obtained by Additive Manufacturing

2020 ◽  
Author(s):  
Tiago Sartor ◽  
Jorge Vicente Lopes Da Silva ◽  
Reyolando Lopes Rebello Da Fonseca Brasil ◽  
Rafael Celeghini Santiago
Keyword(s):  
Titanium Alloy ◽  
Additive Manufacturing ◽  
Titanium Alloy Ti6al4v

LBW of Similar and Dissimilar Skin-Stringer Joints Part I: Process Optimization and Mechanical Characterization

2008 ◽  
Vol 38 ◽  
pp. 306-319 ◽  
Author(s):  
A. Prisco ◽  
F. Acerra ◽  
Antonio Squillace ◽  
G. Giorleo ◽  
C. Pirozzi ◽  
...  
Keyword(s):  
Chemical Composition ◽  
Structural Analysis ◽  
Aluminum Alloys ◽  
Laser Beam ◽  
Process Optimization ◽  
Mechanical Characterization ◽  
Laser Beam Welding ◽  
Filler Wire ◽  
Parent Materials

Laser beam welding of light alloys has always represented a big challenge for both designers and technologists due to the large number of process parameters to take into account and the variable responses of the different materials to be welded. In this paper the results of experimental research on laser beam welds of innovative heat treatable aluminum alloys is reported. The well known T geometry (a stringer welded to a skin) has been considered. Two different skins have been analyzed: AA 2139 and AA 6156, both in form of rolled sheets. Two different stringer have been analyzed: AA 2139 and PA 765, both in form of extruded parts. AA 4047 has been used as filler wire. In the first part of the paper, all the steps leading to the realization of sound welds will be described. The criteria used in order to assess the soundness of a weld was the absence of defects, such as cracks or large pores, verified by means of NDE. In the second part of study, both micro structural analysis and mechanical characterization of welds will be described and discussed. Conclusions will demonstrate the importance of the influence of chemical composition of the parts, above all stringer. The performance of the best welds, however, were very close to those of parent materials.

scholarly journals Microstructural characterization of titanium alloy Ti6Al4V thermally oxidized/Caracterización microestructural de la aleación de titanio Ti6Al4V oxidada térmicamente

Prospectiva ◽  
2018 ◽  
Vol 16 (2) ◽  
pp. 68-74
Author(s):  
Ma. Mercedes Cely Bautista ◽  
Javier Jaramillo Colpas ◽  
Ivan Romero Mejía ◽  
Oscar Pinilla Navarro ◽  
Andres Siado Guillen
Keyword(s):  
Titanium Alloy ◽  
Microstructural Characterization ◽  
Titanium Alloy Ti6al4v

El objetivo de este artículo es analizar el efecto de la oxidación térmica en el cambio microestructural de propiedades mecánicas de la aleación Ti6Al4V.  Las muestras de titanio fueron sometidas a tratamiento de oxidación térmica entre 450°C y 850°C por espacio de 2 horas y enfriamiento lento. La morfología superficial fue analizada mediante Microscopía óptica, Microscopía electrónica de barrido, Difracción de rayos X y Análisis de dureza. Con la oxidación térmica se generó una película de óxido tipo TiO2, la cual incrementó su espesor con la temperatura, de igual forma con este aumento de temperatura la dureza del material aumentó en un 40% a 850°C con respecto al material sin tratamiento. Los resultados además mostraron que a partir de 800°C ya se muestra en su totalidad estructuras de rutilo en la superficie de las muestras.

Characterization of small inclusions: SEM vs TEM, or is it even worth considering Sem?

1996 ◽  
Vol 54 ◽  
pp. 498-499
Author(s):  
Carl Blais ◽  
Gilles L’Espérance ◽  
Éric Baril ◽  
Clément Forget
Keyword(s):  
Chemical Composition ◽  
X Rays ◽  
X Ray ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Diffraction Patterns ◽  
Micro Alloyed Steel ◽  
Steel Welds ◽  
Scanning Electron Microscopes

Inclusions of technological importance are often in the size range from 0.1 to 1 μm, These inclusions are generally too thick for EEL-spectrometry and require the use of EDS to characterize their chemical composition. Recent Monte Carlo simulations indicated that scanning electron microscopes (SEM’s) equiped with a field emission gun (FEG) might challenge transmission electron microscopes (TEM’s) for the charaterization of small inclusions, In the light of these results, we investigated the possibility of using a FEGSEM to characterize inclusions found in micro-alloyed steel welds used for arctic applications. The main setbacks of using EDS for such a task are due to the presence of small phases of unknown thicknesses, non-homogeneity of the X-ray generation volumes, variation in absorption along the path length of the X-rays, etc., Even though these problems are encoutered in both the SEM and the TEM, the relative ease of imaging the very small inclusions in TEM confers a definite advantage to this technique. Furthermore, TEM allows to obtain convergent-bearn electron diffraction patterns (CBED) which complement the chemical composition characterization, thereby allowing the unambiguous identification of the phases present (chemistry and crystal structure).

Digital x-ray mapping of nanometer-size supported bimetallic catalysts

1988 ◽  
Vol 46 ◽  
pp. 530-531
Author(s):  
L. T. Germinario
Keyword(s):  
Background Radiation ◽  
Metal Cluster ◽  
Single Element ◽  
Beam Diameter ◽  
X Rays ◽  
X Ray ◽  
Major Interest ◽  
Induced Changes

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.

Characterization of Rh/Si multilayer structure by HREM and HAADF

1992 ◽  
Vol 50 (1) ◽  
pp. 122-123
Author(s):  
Y. Cheng ◽  
J. Liu ◽  
M.B. Stearns ◽  
D.G. Steams
Keyword(s):  
Normal Incidence ◽  
High Resolution Electron Microscopy ◽  
X Rays ◽  
Beam Direction ◽  
Cross Sectional ◽  
Optical Elements ◽  
Resolution Electron ◽  
Point To Point ◽  
Better Than

The Rh/Si multilayer (ML) thin films are promising optical elements for soft x-rays since they have a calculated normal incidence reflectivity of ∼60% at a x-ray wavelength of ∼13 nm. However, a reflectivity of only 28% has been attained to date for ML fabricated by dc magnetron sputtering. In order to determine the cause of this degraded reflectivity the microstructure of this ML was examined on cross-sectional specimens with two high-resolution electron microscopy (HREM and HAADF) techniques.Cross-sectional specimens were made from an as-prepared ML sample and from the same ML annealed at 298 °C for 1 and 100 hours. The specimens were imaged using a JEM-4000EX TEM operating at 400 kV with a point-to-point resolution of better than 0.17 nm. The specimens were viewed along Si [110] projection of the substrate, with the (001) Si surface plane parallel to the beam direction.

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