scholarly journals Generation of a New Extreme Condition: Ultra-Strong Acceleration Field (Mega-Gravity Field) and the Applications to Materials Science.

1997 ◽  
Vol 6 (3) ◽  
pp. 154-158
Author(s):  
Tsutomu Mashimo
Keyword(s):  
Gravity Field ◽  
Materials Science ◽  
Extreme Condition ◽  
Acceleration Field

Sedimentation of Substitutional Solute Atoms in Condensed Matter: New Type of Diffusion

2005 ◽  
Vol 237-240 ◽  
pp. 30-37 ◽  
Author(s):  
Tsutomu Mashimo
Keyword(s):  
Gravity Field ◽  
Diffusion Coefficients ◽  
Materials Science ◽  
Condensed Matter ◽  
Diffusion Mechanism ◽  
Science Research ◽  
Substitutional Solute ◽  
Self Consistent ◽  
New Type ◽  
Solute Atoms

Ultra-strong gravitational field (Mega-gravity field) causes the sedimentation of even atoms (diffusion), and is expected to create a nonequilibrium crystal-chemical state in multi-component condensed matter. However, the materials science research under mega-gravity field has now remained as an unexploited field, while the sedimentation of molecules or polymer had been used in biochemistory. We presented a self-consistent diffusion equation for sedimentation of atoms in condensed matter. Next, we developed an ultracentrifuge apparatus to generate strong acceleration field of over 1 million (1x106) g at temperature range up to 〜300 °C, and, recently, succeeded in realization of the sedimentation of substitutional solute atoms in some alloys of Bi-Sb, In-Pb, Bi-Pb systems, etc. The diffusion coefficients in sedimentation on Bi-Sb alloy were estimated to be much greater than those at normal conditions by a factor of >20. It is suggested that the sedimentation of substitutional atoms in solids or liquids can be explained in a new type of diffusion, where the diffusion mechanism for substitutional solute atoms was yet unknown. In this article, the recent progress in the investigation of sedimentation of atoms under mega-gravity field is reviewed, and the diffusion mechanism is discussed. The application of the mega-gravity field is also discussed.

Generation of High-Gravity Field and Application to Materials Science

2008 ◽  
Author(s):  
T. Mashimo ◽  
Glaucio H. Paulino ◽  
Marek-Jerzy Pindera ◽  
Robert H. Dodds ◽  
Fernando A. Rochinha ◽  
...  
Keyword(s):  
Gravity Field ◽  
Materials Science ◽  
High Gravity ◽  
High Gravity Field

Separation in ε-Phase of BiPb Alloy under Mega-Gravity

2012 ◽  
Vol 323-325 ◽  
pp. 545-548
Author(s):  
Satoru Okayasu ◽  
Masao Ono ◽  
Taichiro Nishio ◽  
Yusuke Iguchi ◽  
Tsutomu Mashimo
Keyword(s):  
Gravity Field ◽  
Superconducting Properties ◽  
Centrifugal Acceleration ◽  
Melt Growth ◽  
Acceleration Field ◽  
Ε Phase ◽  
Partial Crystallization ◽  
Hcp Structure ◽  
Two Phases

Homogeneous Bi-Pb alloy samples in the ε-phase are treated under mega-gravity centrifugal acceleration field. Atomic sedimentation in solid and associated partial crystallization occurs during the treatment. Small differences of densities in the ε-phase are enhanced under the mega-gravity, and they cause the separation of the ε-phase between fully packed hcp structure of the Bi3Pb7and partially defected hcp structure of the Bi3Pb7-δ. The compositional graded superconducting alloy is obtained in the latter. Partially melt-growth occurs in the latter and microstructure of Pb is formed along the gravity field associating with the formation of highly oriented the (211) phase of Bi3Pb7-δ. The superconductivity parallel to gravity is Pb, and perpendicular to gravity is Bi3Pb7-δas the result. Superconducting properties differs between the separated two phases.

Trends in Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 228-229
Author(s):  
C. Colliex ◽  
P. Trebbia
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Materials Science ◽  
Analytical Technique ◽  
Recent Developments ◽  
Quantitative Results ◽  
Electron Microscopes ◽  
Electron Energy Loss ◽  
Primary Electrons

The physical foundations for the use of electron energy loss spectroscopy towards analytical purposes, seem now rather well established and have been extensively discussed through recent publications. In this brief review we intend only to mention most recent developments in this field, which became available to our knowledge. We derive also some lines of discussion to define more clearly the limits of this analytical technique in materials science problems.The spectral information carried in both low ( 0<ΔE<100eV ) and high ( >100eV ) energy regions of the loss spectrum, is capable to provide quantitative results. Spectrometers have therefore been designed to work with all kinds of electron microscopes and to cover large energy ranges for the detection of inelastically scattered electrons (for instance the L-edge of molybdenum at 2500eV has been measured by van Zuylen with primary electrons of 80 kV). It is rather easy to fix a post-specimen magnetic optics on a STEM, but Crewe has recently underlined that great care should be devoted to optimize the collecting power and the energy resolution of the whole system.

Electron holography in materials science

1991 ◽  
Vol 49 ◽  
pp. 670-671
Author(s):  
Hannes Lichte ◽  
Edgar Voelkl
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Materials Science ◽  
Fourier Spectrum ◽  
Object Wave ◽  
Electron Holography ◽  
Reconstruction Procedure ◽  
Numerical Reconstruction ◽  
Transmission Electron ◽  
Unique Interpretation

The object wave o(x,y) = a(x,y)exp(iφ(x,y)) at the exit face of the specimen is described by two real functions, i.e. amplitude a(x,y) and phase φ(x,y). In stead of o(x,y), however, in conventional transmission electron microscopy one records only the real intensity I(x,y) of the image wave b(x,y) loosing the image phase. In addition, referred to the object wave, b(x,y) is heavily distorted by the aberrations of the microscope giving rise to loss of resolution. Dealing with strong objects, a unique interpretation of the micrograph in terms of amplitude and phase of the object is not possible. According to Gabor, holography helps in that it records the image wave completely by both amplitude and phase. Subsequently, by means of a numerical reconstruction procedure, b(x,y) is deconvoluted from aberrations to retrieve o(x,y). Likewise, the Fourier spectrum of the object wave is at hand. Without the restrictions sketched above, the investigation of the object can be performed by different reconstruction procedures on one hologram. The holograms were taken by means of a Philips EM420-FEG with an electron biprism at 100 kV.

Zero-loss omega-filtered REM and RHEED on the new Zeiss 912

1991 ◽  
Vol 49 ◽  
pp. 616-617
Author(s):  
J.C.H. Spence ◽  
J. Mayer
Keyword(s):  
Electron Microscopy ◽  
Materials Science ◽  
Surface States ◽  
Ccd Camera ◽  
Dark Field ◽  
Ion Pump ◽  
Magnetic Imaging ◽  
Reflection Electron Microscopy ◽  
Diffraction Patterns ◽  
Large Background

The Zeiss 912 is a new fully digital, side-entry, 120 Kv TEM/STEM instrument for materials science, fitted with an omega magnetic imaging energy filter. Pumping is by turbopump and ion pump. The magnetic imaging filter allows energy-filtered images or diffraction patterns to be recorded without scanning using efficient parallel (area) detection. The energy loss intensity distribution may also be displayed on the screen, and recorded by scanning it over the PMT supplied. If a CCD camera is fitted and suitable new software developed, “parallel ELS” recording results. For large fields of view, filtered images can be recorded much more efficiently than by Scanning Reflection Electron Microscopy, and the large background of inelastic scattering removed. We have therefore evaluated the 912 for REM and RHEED applications. Causes of streaking and resonance in RHEED patterns are being studied, and a more quantitative analysis of CBRED patterns may be possible. Dark field band-gap REM imaging of surface states may also be possible.

Dynamical Scattering in Crystalline Biological Specimens. I. Criteria of Validity for Scattering Approximations

1975 ◽  
Vol 33 ◽  
pp. 192-193
Author(s):  
Robert M. Glaeser ◽  
Bing K. Jap
Keyword(s):  
Biological Sciences ◽  
Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Born Approximation ◽  
Materials Science ◽  
Image Data ◽  
Dynamical Effect ◽  
Crystallographic Structure ◽  
Electron Microscope Image

The dynamical scattering effect, which can be described as the failure of the first Born approximation, is perhaps the most important factor that has prevented the widespread use of electron diffraction intensities for crystallographic structure determination. It would seem to be quite certain that dynamical effects will also interfere with structure analysis based upon electron microscope image data, whenever the dynamical effect seriously perturbs the diffracted wave. While it is normally taken for granted that the dynamical effect must be taken into consideration in materials science applications of electron microscopy, very little attention has been given to this problem in the biological sciences.

Electron spectroscopic imaging and diffraction

1991 ◽  
Vol 49 ◽  
pp. 706-707
Author(s):  
M. Rühle ◽  
J. Mayer ◽  
J.C.H. Spence ◽  
J. Bihr ◽  
W. Probst ◽  
...  
Keyword(s):  
Materials Science ◽  
Electron Spectroscopic Imaging ◽  
Magnetic Filter ◽  
Magnetic Imaging ◽  
Illumination System ◽  
Probe Size ◽  
Diffraction Patterns ◽  
Fritz Haber ◽  
Koehler Illumination ◽  
First Time

A new Zeiss TEM with an imaging Omega filter is a fully digitized, side-entry, 120 kV TEM/STEM instrument for materials science. The machine possesses an Omega magnetic imaging energy filter (see Fig. 1) placed between the third and fourth projector lens. Lanio designed the filter and a prototype was built at the Fritz-Haber-Institut in Berlin, Germany. The imaging magnetic filter allows energy-filtered images or diffraction patterns to be recorded without scanning using efficient area detection. The energy dispersion at the exit slit (Fig. 1) results in ∼ 1.5 μm/eV which allows imaging with energy windows of ≤ 10 eV. The smallest probe size of the microscope is 1.6 nm and the Koehler illumination system is used for the first time in a TEM. Serial recording of EELS spectra with a resolution < 1 eV is possible. The digital control allows X,Y,Z coordinates and tilt settings to be stored and later recalled.

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