scholarly journals Analysis of the maintenance process and useful life of echocardiography equipment: An experience in a teaching hospital

2021 ◽  
Vol 34 (4) ◽  
Author(s):  
Gabriel Peres Mazzoni ◽  
◽  
André Timóteo Sapalo ◽  
André Schmidt ◽  
Benedito Carlos Maciel ◽  
...  
Aerospace ◽  
2021 ◽  
Vol 8 (6) ◽  
pp. 168
Author(s):  
Mihaela Mitici ◽  
Ingeborg de Pater

Remaining-useful-life prognostics for aircraft components are central for efficient and robust aircraft maintenance. In this paper, we propose an end-to-end approach to obtain online, model-based remaining-useful-life prognostics by learning from clusters of components with similar degradation trends. Time-series degradation measurements are first clustered using dynamic time-warping. For each cluster, a degradation model and a corresponding failure threshold are proposed. These cluster-specific degradation models, together with a particle filtering algorithm, are further used to obtain online remaining-useful-life prognostics. As a case study, we consider the operational data of several cooling units originating from a fleet of aircraft. The cooling units are clustered based on their degradation trends and remaining-useful-life prognostics are obtained in an online manner. In general, this approach provides support for intelligent aircraft maintenance where the analysis of cluster-specific component degradation models is integrated into the predictive maintenance process.


2011 ◽  
Vol 255-260 ◽  
pp. 3450-3453
Author(s):  
Mohammad M. Khabiri

Maintenance and protection of road pavements are one of important tasks of highway agencies. Many studies are done about specifying suitable time for pavement preventive maintenance. The probability distribution isn't used in this study, although the significant factor in decision making is relevant to probability function. In present paper, the suitable time between two preventive repairs is determined by Erlangen probability distribution function method. Economical factors are one of important parameters in this method, so, maintenance and repairing process cost, the useful life of maintenance process and the cutting of traffic flow are applied in calculation of suggested method.


Author(s):  
John R. Devaney

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.


2004 ◽  
Vol 10 ◽  
pp. 27
Author(s):  
Vaidehi Kaza ◽  
Eric A. Jaffe ◽  
Gerald Posner ◽  
Maria Ferandez-Renedo ◽  
Zewge S. Deribe

Pathology ◽  
2001 ◽  
Vol 33 (2) ◽  
pp. 216-221
Author(s):  
Lynette L. E. Oon ◽  
Moi-Lin Ling ◽  
Yoke-Fong Chiew

2005 ◽  
Vol 48 (2) ◽  
pp. 208-217 ◽  
Author(s):  
Matthew Watson ◽  
Carl Byington ◽  
Douglas Edwards ◽  
Sanket Amin

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