scholarly journals An image analyser: A rapid and non-destructive method for characterization and diversity assessment of sorghum landraces

2019 ◽  
Vol 10 (3) ◽  
pp. 1176 ◽  
Author(s):  
C. Kavipriya ◽  
A. Yuvaraja ◽  
C. Vanniarajan ◽  
J. Ramalingam ◽  
A. Subramanian
Author(s):  
J.P. Fallon ◽  
P.J. Gregory ◽  
C.J. Taylor

Quantitative image analysis systems have been used for several years in research and quality control applications in various fields including metallurgy and medicine. The technique has been applied as an extension of subjective microscopy to problems requiring quantitative results and which are amenable to automatic methods of interpretation.Feature extraction. In the most general sense, a feature can be defined as a portion of the image which differs in some consistent way from the background. A feature may be characterized by the density difference between itself and the background, by an edge gradient, or by the spatial frequency content (texture) within its boundaries. The task of feature extraction includes recognition of features and encoding of the associated information for quantitative analysis.Quantitative Analysis. Quantitative analysis is the determination of one or more physical measurements of each feature. These measurements may be straightforward ones such as area, length, or perimeter, or more complex stereological measurements such as convex perimeter or Feret's diameter.


Author(s):  
J W Steeds

There is a wide range of experimental results related to dislocations in diamond, group IV, II-VI, III-V semiconducting compounds, but few of these come from isolated, well-characterized individual dislocations. We are here concerned with only those results obtained in a transmission electron microscope so that the dislocations responsible were individually imaged. The luminescence properties of the dislocations were studied by cathodoluminescence performed at low temperatures (~30K) achieved by liquid helium cooling. Both spectra and monochromatic cathodoluminescence images have been obtained, in some cases as a function of temperature.There are two aspects of this work. One is mainly of technological significance. By understanding the luminescence properties of dislocations in epitaxial structures, future non-destructive evaluation will be enhanced. The second aim is to arrive at a good detailed understanding of the basic physics associated with carrier recombination near dislocations as revealed by local luminescence properties.


Author(s):  
R.F. Sognnaes

Sufficient experience has been gained during the past five years to suggest an extended application of microreplication and scanning electron microscopy to problems of forensic science. The author's research was originally initiated with a view to develop a non-destructive method for identification of materials that went into objects of art, notably ivory and ivories. This was followed by a very specific application to the identification and duplication of the kinds of materials from animal teeth and tusks which two centuries ago went into the fabrication of the ivory dentures of George Washington. Subsequently it became apparent that a similar method of microreplication and SEM examination offered promise for a whole series of problems pertinent to art, technology and science. Furthermore, what began primarily as an application to solid substances has turned out to be similarly applicable to soft tissue surfaces such as mucous membranes and skin, even in cases of acute, chronic and precancerous epithelial surface changes, and to post-mortem identification of specific structures pertinent to forensic science.


2013 ◽  
Vol 64 (2) ◽  
pp. 21001 ◽  
Author(s):  
Jean-Luc Bodnar ◽  
Jean-Jacques Metayer ◽  
Kamel Mouhoubi ◽  
Vincent Detalle

1984 ◽  
Vol 72 (8-9) ◽  
pp. 339-343
Author(s):  
René Hoeg ◽  
Lars Taarnskov
Keyword(s):  

1953 ◽  
Vol 50 (2) ◽  
pp. 136-138 ◽  
Author(s):  
Georges Ambrosino ◽  
Pierre Pindrus
Keyword(s):  

1993 ◽  
Vol 90 (6) ◽  
pp. 823-828
Author(s):  
M. Mayos ◽  
J.M. Turón ◽  
P. Alexandre ◽  
J.L. Salon ◽  
M. Depeyris ◽  
...  
Keyword(s):  

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