Sulfurization Growth of SnS Thin Films and Experimental Determination of Valence Band Discontinuity for SnS-Related Solar Cells

2011 ◽  
Vol 50 (5S2) ◽  
pp. 05FH03 ◽  
Author(s):  
Mutsumi Sugiyama ◽  
Yoshitsuna Murata ◽  
Tsubasa Shimizu ◽  
Kottadi Ramya ◽  
Chinna Venkataiah ◽  
...  
2011 ◽  
Vol 50 (5) ◽  
pp. 05FH03 ◽  
Author(s):  
Mutsumi Sugiyama ◽  
Yoshitsuna Murata ◽  
Tsubasa Shimizu ◽  
Kottadi Ramya ◽  
Chinna Venkataiah ◽  
...  

2020 ◽  
Vol 14 (6) ◽  
pp. 2000070 ◽  
Author(s):  
Wensheng Yan ◽  
Yi Guo ◽  
Deski Beri ◽  
Stephan Dottermusch ◽  
Haining Chen ◽  
...  

Optik ◽  
2017 ◽  
Vol 131 ◽  
pp. 231-241 ◽  
Author(s):  
Narjes Kabiri Samani ◽  
Zahra Dehghani Tafti ◽  
Hojjat Amrollahi Bioki ◽  
Mahmood Borhani Zarandi ◽  
Shirin Shayegh

1991 ◽  
Vol 70 (4) ◽  
pp. 2230-2233 ◽  
Author(s):  
R. Wördenweber ◽  
M. O. Abd‐El‐Hamed ◽  
J. Schneider ◽  
O. Laborde

2000 ◽  
Vol 77 (9) ◽  
pp. 723-729
Author(s):  
A Ennaoui

The highest efficiency for Cu(Ga,In)Se2 (CIGS) thin-film-based solar cells has been achieved with CdS buffer layers prepared by a solution growth method known as the chemical bath deposition (CBD). With the aim of developing Cd-free chalcopyrite-based thin-film solar cells, we describe the basic concepts involved in the CBD technique. The recipes developed in our laboratory for the heterogeneous deposition of good-quality thin films of ZnO, ZnSe, and MnS are presented. In view of device optimization, the initial formation of chemical-bath-deposited ZnSe thin films on Cu(Ga,In)(S,Se)2 (CIGSS) and the subsequent development of the ZnSe/CIGSS heterojunctions were investigated by X-ray photoelectron spectroscopy (XPS). The good surface coverage was controlled by measuring changes in the valence-band electronic structure as well as changes in the In4d, Zn3d core lines. From these measurements, the growth rate was found to be around 3.6 nm/min. The valence band and the conduction band-offsets ΔEV and ΔEC between the layers were determined to be 0.60 and 1.27 eV, respectively for the CIGSS/ZnSe interface. The energy-band diagram is discussed in connection with the band-offsets detemined from XPS data. A ZnSe thickness below 10 nm has been found to be optimum for achieving a homogeneous and compact buffer layer on CIGSS with a total area efficiency of 13.7%.PACS No.: 42.70


1978 ◽  
Vol 25 (3) ◽  
pp. 386-388 ◽  
Author(s):  
P.J. Chen ◽  
S.C. Pao ◽  
A. Neugroschel ◽  
F.A. Lindholm

1995 ◽  
Vol 377 ◽  
Author(s):  
M. Sebastiani ◽  
L. Di Gaspare ◽  
C. Bittencourt ◽  
F. Evangelisti

ABSTRACTWe report the first yield spectroscopy study on well characterized c-Si/a-Si:H heterojunctions grown in situ under UHV conditions. We find that this spectroscopy, when operated in the constant final state mode, allows a direct and precise determination of the valence-band discontinuity at the interface. A value of δEv = 0.44 ± 0.02 eV was found for the discontinuity.


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