DC Bias-stress effect for organic thin-film transistors with parylene-C dielectric layers

2012 ◽  
Author(s):  
K. Fukuda ◽  
T. Suzuki ◽  
D. Kumaki ◽  
S. Tokito
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Stress Effect ◽  
Organic Thin Film ◽  
Parylene C ◽  
Bias Stress ◽  
Dielectric Layers ◽  
Dc Bias

Reverse DC bias stress shifts in organic thin-film transistors with gate dielectrics using parylene-C

2012 ◽  
Vol 209 (10) ◽  
pp. 2073-2077 ◽  
Author(s):  
Kenjiro Fukuda ◽  
Tatsuya Suzuki ◽  
Daisuke Kumaki ◽  
Shizuo Tokito
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Gate Dielectrics ◽  
Organic Thin Film Transistors ◽  
Organic Thin Film ◽  
Parylene C ◽  
Bias Stress ◽  
Dc Bias

scholarly journals Bias-Stress Effect in Pentacene Organic Thin-Film Transistors

2010 ◽  
Vol 57 (5) ◽  
pp. 1003-1008 ◽  
Author(s):  
Kevin Kyungbum Ryu ◽  
Ivan Nausieda ◽  
David Da He ◽  
Akintunde Ibitayo Akinwande ◽  
Vladimir Bulovic ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Stress Effect ◽  
Organic Thin Film ◽  
Bias Stress

Effect of molecular structure on bias stress effect in organic thin-film transistors

2011 ◽  
Vol 257 (22) ◽  
pp. 9386-9389 ◽  
Author(s):  
A.K. Diallo ◽  
F. Fages ◽  
F. Serein-Spirau ◽  
J.-P. Lère-porte ◽  
C. Videlot-Ackermann
Keyword(s):  
Molecular Structure ◽  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Stress Effect ◽  
Organic Thin Film ◽  
Bias Stress

scholarly journals Bias stress effect in low-voltage organic thin-film transistors

2008 ◽  
Vol 95 (1) ◽  
pp. 139-145 ◽  
Author(s):  
Ute Zschieschang ◽  
R. Thomas Weitz ◽  
Klaus Kern ◽  
Hagen Klauk
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Voltage ◽  
Organic Thin Film Transistors ◽  
Stress Effect ◽  
Organic Thin Film ◽  
Bias Stress

scholarly journals Bias Stress in Organic Thin-Film Transistors Towards Low-Cost Flexible Gas Sensors

2021 ◽  
Vol 16 (2) ◽  
pp. 1-11
Author(s):  
José Enrique Eirez Izquierdo ◽  
José Diogo da Silva Oliveira ◽  
Vinicius Augusto Machado Nogueira ◽  
Dennis Cabrera García ◽  
Marco Roberto Cavallari ◽  
...  
Keyword(s):  
Thin Film ◽  
Flexible Electronics ◽  
Thin Film Transistors ◽  
Low Cost ◽  
Thin Film Deposition ◽  
Dielectric Surface ◽  
Organic Thin Film Transistors ◽  
Film Deposition ◽  
Organic Thin Film ◽  
Bias Stress

This work is focused on the bias stress (BS) effects in Organic Thin-Film Transistors (OTFTs) from poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophene) (PBTTT-C14) on both highly-doped Si and glass substrates. While the former had a thermally-grown SiO2 dielectric, the latter demanded an alternative dielectric that should be capable to withstand bottom contact lithography, as well as semiconducting thin-film deposition. In addition, it should represent one more step towards flexible electronics. In order to do that, poly(4-vinylphenol) (PVP) was blended to poly(melamine-co-formaldehyde) methylated (PMF). OTFTs on glass with a cross-linked polymer dielectric had a charge carrier mobility (μ) of 4.0x10-4 cm2/Vs, threshold voltage (VT) of 18 V, current modulation (ION/OFF) higher than 1x102, and subthreshold slope (SS) of -7.7 V/dec. A negative BS shifted VT towards negative values and produced an increase in ION/OFF. A positive BS, on the other hand, produced the opposite effect only for OTFTs on Si. This is believed to be due to a higher trapping at the PVP:PMF interface with PBTTT-C14. Modeling the device current along time by a stretched exponential provided shorter time constants of ca. 105 s and higher exponents of 0.7–0.9 for devices on glass. Due to the presence of increased BS effects, the application of organic TFTs based on PVP:PMF as flexible sensors will require compensating circuits, lower voltages or less measurements in time. Alternatively, BS effects could be reduced by a dielectric surface treatment.

Recovery-aware bias-stress degradation model for organic thin-film transistors considering drain and gate bias voltages

2020 ◽  
Vol 59 (SG) ◽  
pp. SGGG08
Author(s):  
Kunihiro Oshima ◽  
Michihiro Shintani ◽  
Kazunori Kuribara ◽  
Yasuhiro Ogasahara ◽  
Takashi Sato
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Gate Bias ◽  
Organic Thin Film ◽  
Degradation Model ◽  
Bias Stress ◽  
Stress Degradation
Sign in / Sign up

Export Citation Format

Share Document